Deep Metric Learning with Chance Constraints

Deep metric learning (DML) aims to minimize empirical expected loss of the pairwise intra-/inter- class proximity violations in the embedding image. We relate DML to feasibility problem of finite chance constraints. We show that minimizer of proxy-based DML satisfies certain chance constraints, and that the worst case generalization performance of the proxy-based methods can be characterized by the radius of the smallest ball around a class proxy to cover the entire domain of the corresponding class samples, suggesting multiple proxies per class helps performance. To provide a scalable algorithm as well as exploiting more proxies, we consider the chance constraints implied by the minimizers of proxy-based DML instances and reformulate DML as finding a feasible point in intersection of such constraints, resulting in a problem to be approximately solved by iterative projections. Simply put, we repeatedly train a regularized proxy-based loss and re-initialize the proxies with the embeddings of the deliberately selected new samples. We apply our method with the well-accepted losses and evaluate on four popular benchmark datasets for image retrieval. Outperforming state-of-the-art, our method consistently improves the performance of the applied losses. Code is available at: https://github.com/yetigurbuz/ccp-dmlComment: Under review at IEEE Transactions on Neural Networks and Learning System

Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach for Feature Embedding

Unsupervised Deep Distance Metric Learning (UDML) aims to learn sample similarities in the embedding space from an unlabeled dataset. Traditional UDML methods usually use the triplet loss or pairwise loss which requires the mining of positive and negative samples w.r.t. anchor data points. This is, however, challenging in an unsupervised setting as the label information is not available. In this paper, we propose a new UDML method that overcomes that challenge. In particular, we propose to use a deep clustering loss to learn centroids, i.e., pseudo labels, that represent semantic classes. During learning, these centroids are also used to reconstruct the input samples. It hence ensures the representativeness of centroids - each centroid represents visually similar samples. Therefore, the centroids give information about positive (visually similar) and negative (visually dissimilar) samples. Based on pseudo labels, we propose a novel unsupervised metric loss which enforces the positive concentration and negative separation of samples in the embedding space. Experimental results on benchmarking datasets show that the proposed approach outperforms other UDML methods.Comment: Accepted in BMVC 202