Custom Integrated Circuits

Contains reports on twelve research projects.Analog Devices, Inc.International Business Machines, Inc.Joint Services Electronics Program (Contract DAAL03-86-K-0002)Joint Services Electronics Program (Contract DAAL03-89-C-0001)U.S. Air Force - Office of Scientific Research (Grant AFOSR 86-0164)Rockwell International CorporationOKI Semiconductor, Inc.U.S. Navy - Office of Naval Research (Contract N00014-81-K-0742)Charles Stark Draper LaboratoryNational Science Foundation (Grant MIP 84-07285)National Science Foundation (Grant MIP 87-14969)Battelle LaboratoriesNational Science Foundation (Grant MIP 88-14612)DuPont CorporationDefense Advanced Research Projects Agency/U.S. Navy - Office of Naval Research (Contract N00014-87-K-0825)American Telephone and TelegraphDigital Equipment CorporationNational Science Foundation (Grant MIP-88-58764

Verification of regular arrays by symbolic simulation

Journal ArticleMany algorithms have an efficient hardware formulation as a regular array of cells, which can be implemented in VLSI as regular circuit structures. Bit-sliced microprocessors, pattern matching circuits, associative cache memories, Hue-grain systolic arrays, and embedded memory-with-logic structures are representative of the regular array design style. In this paper, we illustrate a verification approach for regular arrays. Our approach for the verification of regular arrays combines formal verification at the high level and symbolic simulation at the low level(e.g., switch-level). The verification approach is based on a simple hardware specification formalism called HOP, a parallel composition algorithm for regular arrays called PCA, and a switch-level symbolic simulator (e.g., COSMOS). We illustrate our verification approach on the Least Recently Used(LRU) priority algorithm implemented as a two-dimensional array of LRU cells in VLSI. We also show a new technique of encoding input constraints as parametric boolean expressions on inputs to reduce the number of symbolic simulation vectors required for verification. The use of this technique in LRU array verification results in the simulation of only one symbolic simulation vector independent of the size of the LRU array

DESIGN FOR TESTABILITY TECHNIQUES FOR VIDEO CODING SYSTEMS

Motion estimation algorithms are used in various video coding systems. While focusing on the testing of ME in a video coding system, this work presents an error detection and data recovery (EDDR) design, based on the residue-andquotient (RQ) code, to embed into ME for video coding testing applications. An error in processing elements (PEs), i.e. key components of a ME, can be detected and recovered effectively by using the proposed EDDR design. Therefore, paper describes a novel testing scheme of motion estimation. The key part of this scheme is to offer high reliability for motion estimation architecture. The experimental result shows the design achieve 100% fault coverage. And, the main advantages of this scheme are minimal performance degradation, small cost of hardware overhead and the benefit of at speed testing

Custom Integrated Circuits

Contains reports on nine research projects.Analog Devices, Inc.International Business Machines CorporationJoint Services Electronics Program Contract DAAL03-89-C-0001U.S. Air Force - Office of Scientific Research Contract AFOSR 86-0164BDuPont CorporationNational Science Foundation Grant MIP 88-14612U.S. Navy - Office of Naval Research Contract N00014-87-K-0825American Telephone and TelegraphDigital Equipment CorporationNational Science Foundation Grant MIP 88-5876

Testability Properties of Divergent Trees

The testability of a class of regular circuits calleddivergent trees is investigated under a functional fault model. Divergent trees include such practical circuits as decoders anddemultiplexers. We prove that uncontrolled divergent trees aretestable with a fixed number of test patterns (C-testable) if andonly if the module function is surjective. Testable controlled treesare also surjective but require sensitizing vectors for errorpropagation. We derive the conditions for testing controlleddivergent trees with a test set whose size is proportional to thenumber of levels p found in the tree (L-testability). By viewing a tree as overlapping arrays of various types, we also deriveconditions for a controlled divergent tree to be C-testable. Typicaldecoders/demultiplexers are shown to only partially satisfy L- andC-testability conditions but a design modification that ensuresL-testability is demonstrated.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/43009/1/10836_2004_Article_146935.pd

Testability of Switching Lattices in the Cellular Fault Model

A switching lattice is a two-dimensional array of four-terminal switches implemented in its cells. Each switch is linked to the four neighbors and is connected with them when the switch is ON, or is disconnected when the switch is OFF. Recently, with the advent of a variety of emerging nanoscale technologies based on regular arrays of switches, lattices of multi-terminal switches, originally introduced by Akers in 1972, have found a renewed interest. In this paper, the testability under the Cellular Fault Model (CFM) of switching lattices is defined and analyzed. Moreover, some techniques for improving the testability of lattices are discussed and experimentally evaluated

IMPLEMENTATION OF ROBUST ARCHITECTURE FOR ERROR DETECTION AND DATA RECOVERY IN MOTION ESTIMATION ON FPGA

Video compression is necessary in a wide range of applications to reduce the total data amount required for transmitting or storing video data. Among the coding systems, Motion Estimation is of priority concern in exploiting the temporal redundancy between successive frames, yet also the most time consuming aspect of coding. This paper presents an error detection and data recovery (EDDR) design, based on the residue-and quotient (RQ) code that is embed into ME for video coding testing applications. Based on the Concurrent Error Detection (CED) concept, this work develops a robust EDDR architecture based on the RQ code to detect errors and recovery data in PEs of a ME and, in doing so, further guarantee the excellent reliability for video coding applications. We synthesized this design using Xilinx tool

Custom Integrated Circuits

Contains reports on ten research projects.Analog Devices, Inc.IBM CorporationNational Science Foundation/Defense Advanced Research Projects Agency Grant MIP 88-14612Analog Devices Career Development Assistant ProfessorshipU.S. Navy - Office of Naval Research Contract N0014-87-K-0825AT&TDigital Equipment CorporationNational Science Foundation Grant MIP 88-5876

Boolean Satisfiability in Electronic Design Automation

Boolean Satisfiability (SAT) is often used as the underlying model for a significant and increasing number of applications in Electronic Design Automation (EDA) as well as in many other fields of Computer Science and Engineering. In recent years, new and efficient algorithms for SAT have been developed, allowing much larger problem instances to be solved. SAT “packages” are currently expected to have an impact on EDA applications similar to that of BDD packages since their introduction more than a decade ago. This tutorial paper is aimed at introducing the EDA professional to the Boolean satisfiability problem. Specifically, we highlight the use of SAT models to formulate a number of EDA problems in such diverse areas as test pattern generation, circuit delay computation, logic optimization, combinational equivalence checking, bounded model checking and functional test vector generation, among others. In addition, we provide an overview of the algorithmic techniques commonly used for solving SAT, including those that have seen widespread use in specific EDA applications. We categorize these algorithmic techniques, indicating which have been shown to be best suited for which tasks