A 64-point Fourier transform chip for high-speed wireless LAN application using OFDM

In this article, we present a novel fixed-point 16-bit word-width 64-point FFT/IFFT processor developed primarily for the application in the OFDM based IEEE 802.11a Wireless LAN (WLAN) baseband processor. The 64-point FFT is realized by decomposing it into a 2-D structure of 8-point FFTs. This approach reduces the number of required complex multiplications compared to the conventional radix-2 64-point FFT algorithm. The complex multiplication operations are realized using shift-and-add operations. Thus, the processor does not use any 2-input digital multiplier. It also does not need any RAM or ROM for internal storage of coefficients. The proposed 64-point FFT/IFFT processor has been fabricated and tested successfully using our in-house 0.25 ?m BiCMOS technology. The core area of this chip is 6.8 mm2. The average dynamic power consumption is 41 mW @ 20 MHz operating frequency and 1.8 V supply voltage. The processor completes one parallel-to-parallel (i. e., when all input data are available in parallel and all output data are generated in parallel) 64-point FFT computation in 23 cycles. These features show that though it has been developed primarily for application in the IEEE 802.11a standard, it can be used for any application that requires fast operation as well as low power consumption

Minimizing Test Power in SRAM through Reduction of Pre-charge Activity

In this paper we analyze the test power of SRAM memories and demonstrate that the full functional pre-charge activity is not necessary during test mode because of the predictable addressing sequence. We exploit this observation in order to minimize power dissipation during test by eliminating the unnecessary power consumption associated with the pre-charge activity. This is achieved through a modified pre-charge control circuitry, exploiting the first degree of freedom of March tests, which allows choosing a specific addressing sequence. The efficiency of the proposed solution is validated through extensive Spice simulations

EffiTest: Efficient Delay Test and Statistical Prediction for Configuring Post-silicon Tunable Buffers

At nanometer manufacturing technology nodes, process variations significantly affect circuit performance. To combat them, post- silicon clock tuning buffers can be deployed to balance timing bud- gets of critical paths for each individual chip after manufacturing. The challenge of this method is that path delays should be mea- sured for each chip to configure the tuning buffers properly. Current methods for this delay measurement rely on path-wise frequency stepping. This strategy, however, requires too much time from ex- pensive testers. In this paper, we propose an efficient delay test framework (EffiTest) to solve the post-silicon testing problem by aligning path delays using the already-existing tuning buffers in the circuit. In addition, we only test representative paths and the delays of other paths are estimated by statistical delay prediction. Exper- imental results demonstrate that the proposed method can reduce the number of frequency stepping iterations by more than 94% with only a slight yield loss.Comment: ACM/IEEE Design Automation Conference (DAC), June 201

Realization of a ROIC for 72x4 PV-IR detectors

Silicon Readout Integrated Circuits (ROIC) for HgCdTe Focal Plane Arrays of 1x4 and 72x4 photovoltaic detectors are represented. The analog circuit blocks are completely identical for both, while the digital control circuit is modified to take into account the larger array size. The manufacturing technology is 0.35μm, double poly-Si, three-metal CMOS process. ROIC structure includes four elements TDI functioning with a super sampling rate of 3, bidirectional scanning, dead pixel de-selection, automatic gain adjustment in response to pixel deselection besides programmable four gain setting (up to 2.58pC storage), and programmable integration time. ROIC has four outputs with a dynamic range of 2.8V (from 1.2V to 4V) for an output load of 10pF capacitive in parallel with 1MΩ resistance, and operates at a clock frequency of 5 MHz. The input referred noise is less than 1037 μV with 460 fF integration capacitor, corresponding to 2978 electrons

A system-on-chip digital pH meter for use in a wireless diagnostic capsule

This paper describes the design and implementation of a system-on-chip digital pH meter, for use in a wireless capsule application. The system is organized around an 8-bit microcontroller, designed to be functionally identical to the Motorola 6805. The analog subsystem contains a floating-electrode ISFET, which is fully compatible with a commercial CMOS process. On-chip programmable voltage references and multiplexors permit flexibility with the minimum of external connections. The chip is designed in a modular fashion to facilitate verification and component re-use. The single-chip pH meter can be directly connected to a personal computer, and gives a response of 37 bits/pH, within an operating range of 7 pH units