A test methodology for interconnect structures of LUT-based FPGAs

In this paper we consider testing for programmable interconnect structures of look-up table based FPGAs. The interconnect structure considered in the paper consists of interconnecting wires and programmable points (switches) to join them. As fault models, stuck-at faults of the wires, and extra-device faults and missing-device faults of the programmable points are considered. We heuristically derive test procedures for the faults and then show their validness and complexity</p

Template-based embedded reconfigurable computing

XIV+212hlm.;24c

Placement-Driven Technology Mapping for LUT-Based FPGAs

In this paper, we study the problem of placement-driven technology mapping for table-lookup based FPGA architectures to optimize circuit performance. Early work on technology mapping for FPGAs such as Chortle-d[14] and Flowmap[3] aim to optimize the depth of the mapped solution without consideration of interconnect delay. Later works such as Flowmap-d[7], Bias-Clus[4] and EdgeMap consider interconnect delays during mapping, but do not take into consideration the effects of their mapping solution on the final placement. Our work focuses on the interaction between the mapping and placement stages. First, the interconnect delay information is estimated from the placement, and used during the labeling process. A placement-based mapping solution which considers both global cell congestion and local cell congestion is then developed. Finally, a legalization step and detailed placement is performed to realize the design. We have implemented our algorithm in a LUT based FPGA technology mapping package named PDM (Placement-Driven Mapping) and tested the implementation on a set of MCNC benchmarks. We use the tool VPR[1][2] for placement and routing of the mapped netlist. Experimental results show the longest path delay on a set of large MCNC benchmarks decreased by 12.3 % on the average

Interconnect yield analysis and fault tolerance for field programmable gate arrays

Imperial Users onl

GROK-FPGA: Generating Real on-Chip Knowledge for FPGA Fine-Grain Delays Using Timing Extraction

Circuit variation is one of the biggest problems to overcome if Moore\u27s Law is to continue. It is no longer possible to maintain an abstraction of identical devices without huge yield losses, performance penalties, and energy costs. Current techniques such as margining and grade binning are used to deal with this problem. However, they tend to be conservative, offering limited solutions that will not scale as variation increases. Conventional circuits use limited tests and statistical models to determine the margining and binning required to counteract variation. If the limited tests fail, the whole chip is discarded. On the other hand, reconfigurable circuits, such as FPGAs, can use more fine-grained, aggressive techniques that carefully choose which resources to use in order to mitigate variation. Knowing which resources to use and avoid, however, requires measurement of underlying variation. We present Timing Extraction, a methodology that allows measurement of process variation without expensive testers nor highly invasive techniques, rather, relying only on resources already available on conventional FPGAs. It takes advantage of the fact that we can measure the delay of logic paths between any two registers. Measuring enough paths, provides the information necessary to decompose the delay of each path into individual components-essentially, forming a system of linear equations. Determining which paths to measure requires simple graph transformation algorithms applied to a representation of the FPGA circuit. Ultimately, this process decomposes the FPGA into individual components and identifies which paths to measure for computing the delay of individual components. We apply Timing Extraction to 18 commercially available Altera Cyclone III (65 nm) FPGAs. We measure 22×28 logic clusters and the interconnect within and between cluster. Timing Extraction decomposes this region into 1,356,182 components, classified into 10 categories, requiring 2,736,556 path measurements. With an accuracy of ±3.2 ps, our measurements reveal regional variation on the order of 50 ps, systematic variation from 30 ps to 70 ps, and random variation in the clusters with σ=15 ps and in the interconnect with σ=62 ps

A Multi-layer Fpga Framework Supporting Autonomous Runtime Partial Reconfiguration

Partial reconfiguration is a unique capability provided by several Field Programmable Gate Array (FPGA) vendors recently, which involves altering part of the programmed design within an SRAM-based FPGA at run-time. In this dissertation, a Multilayer Runtime Reconfiguration Architecture (MRRA) is developed, evaluated, and refined for Autonomous Runtime Partial Reconfiguration of FPGA devices. Under the proposed MRRA paradigm, FPGA configurations can be manipulated at runtime using on-chip resources. Operations are partitioned into Logic, Translation, and Reconfiguration layers along with a standardized set of Application Programming Interfaces (APIs). At each level, resource details are encapsulated and managed for efficiency and portability during operation. An MRRA mapping theory is developed to link the general logic function and area allocation information to the device related physical configuration level data by using mathematical data structure and physical constraints. In certain scenarios, configuration bit stream data can be read and modified directly for fast operations, relying on the use of similar logic functions and common interconnection resources for communication. A corresponding logic control flow is also developed to make the entire process autonomous. Several prototype MRRA systems are developed on a Xilinx Virtex II Pro platform. The Virtex II Pro on-chip PowerPC core and block RAM are employed to manage control operations while multiple physical interfaces establish and supplement autonomous reconfiguration capabilities. Area, speed and power optimization techniques are developed based on the developed Xilinx prototype. Evaluations and analysis of these prototype and techniques are performed on a number of benchmark and hashing algorithm case studies. The results indicate that based on a variety of test benches, up to 70% reduction in the resource utilization, up to 50% improvement in power consumption, and up to 10 times increase in run-time performance are achieved using the developed architecture and approaches compared with Xilinx baseline reconfiguration flow. Finally, a Genetic Algorithm (GA) for a FPGA fault tolerance case study is evaluated as a ultimate high-level application running on this architecture. It demonstrated that this is a hardware and software infrastructure that enables an FPGA to dynamically reconfigure itself efficiently under the control of a soft microprocessor core that is instantiated within the FPGA fabric. Such a system contributes to the observed benefits of intelligent control, fast reconfiguration, and low overhead

Choose-Your-Own Adventure: A Lightweight, High-Performance Approach To Defect And Variation Mitigation In Reconfigurable Logic

For field-programmable gate arrays (FPGAs), fine-grained pre-computed alternative configurations, combined with simple test-based selection, produce limited per-chip specialization to counter yield loss, increased delay, and increased energy costs that come from fabrication defects and variation. This lightweight approach achieves much of the benefit of knowledge-based full specialization while reducing to practical, palatable levels the computational, testing, and load-time costs that obstruct the application of the knowledge-based approach. In practice this may more than double the power-limited computational capabilities of dies fabricated with 22nm technologies. Contributions of this work: • Choose-Your-own-Adventure (CYA), a novel, lightweight, scalable methodology to achieve defect and variation mitigation • Implementation of CYA, including preparatory components (generation of diverse alternative paths) and FPGA load-time components • Detailed performance characterization of CYA – Comparison to conventional loading and dynamic frequency and voltage scaling (DFVS) – Limit studies to characterize the quality of the CYA implementation and identify potential areas for further optimizatio

Digital Circuit Design Using Floating Gate Transistors

Floating gate (flash) transistors are used exclusively for memory applications today. These applications include SD cards of various form factors, USB flash drives and SSDs. In this thesis, we explore the use of flash transistors to implement digital logic circuits. Since the threshold voltage of flash transistors can be modified at a fine granularity during programming, several advantages are obtained by our flash-based digital circuit design approach. For one, speed binning at the factory can be controlled with precision. Secondly, an IC can be re-programmed in the field, to negate effects such as aging, which has been a significant problem in recent times, particularly for mission-critical applications. Thirdly, unlike a regular MOSFET, which has one threshold voltage level, a flash transistor can have multiple threshold voltage levels. The benefit of having multiple threshold voltage levels in a flash transistor is that it allows the ability to encode more symbols in each device, unlike a regular MOSFET. This allows us to implement multi-valued logic functions natively. In this thesis, we evaluate different flash-based digital circuit design approaches and compare their performance with a traditional CMOS standard cell-based design approach. We begin by evaluating our design approach at the cell level to optimize the design’s delay, power energy and physical area characteristics. The flash-based approach is demonstrated to be better than the CMOS standard cell approach, for these performance metrics. Afterwards, we present the performance of our design approach at the block level. We describe a synthesis flow to decompose a circuit block into a network of interconnected flash-based circuit cells. We also describe techniques to optimize the resulting network of flash-based circuit cells using don’t cares. Our optimization approach distinguishes itself from other optimization techniques that use don’t cares, since it a) targets a flash-based design flow, b) optimizes clusters of logic nodes at once instead of one node at a time, c) attempts to reduce the number of cubes instead of reducing the number of literals in each cube and d) performs optimization on the post-technology mapped netlist which results in a direct improvement in result quality, as compared to pre-technology mapping logic optimization that is typically done in the literature. The resulting network characteristics (delay, power, energy and physical area) are presented. These results are compared with a standard cell-based realization of the same block (obtained using commercial tools) and we demonstrate significant improvements in all the design metrics. We also study flash-based FPGA designs (both static and dynamic), and present the tradeoff of delay, power dissipation and energy consumption of the various designs. Our work differs from previously proposed flash-based FPGAs, since we embed the flash transistors (which store the configuration bits) directly within the logic and interconnect fabrics. We also present a detailed description of how the programming of the configuration bits is accomplished, for all the proposed designs