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37,413 research outputs found

On label dependence in multilabel classification

Author: Cheng Weiwei
Dembszynski Krzysztof
Hüllermeier Eyke
Waegeman Willem
Publication venue: Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control
Publication date: 01/01/2010
Field of study

Ghent University Academic Bibliography

Regret analysis for performance metrics in multi-label classification: the case of Hamming and subset zero-one loss

Author: B. Taskar
D. McAllester
D.J.C. MacKay
G. Tsoumakas
G. Tsoumakas
G. Tsoumakas
I.H. Witten
J.C. Platt
L. Breiman
M. Boutell
R. Caruana
R. Nelsen
W. Cheng
Publication venue: 'Springer Science and Business Media LLC'
Publication date: 01/01/2010
Field of study

Ghent University Academic Bibliography

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