Design of a Scan Chain for Side Channel Attacks on AES Cryptosystem for Improved Security

Scan chain-based attacks are side-channel attacks focusing on one of the most significant features of hardware test circuitry. A technique called Design for Testability (DfT) involves integrating certain testability components into a hardware design. However, this creates a side channel for cryptanalysis, providing crypto devices vulnerable to scan-based attacks. Advanced Encryption Standard (AES) has been proven as the most powerful and secure symmetric encryption algorithm announced by USA Government and it outperforms all other existing cryptographic algorithms. Furthermore, the on-chip implementation of private key algorithms like AES has faced scan-based side-channel attacks. With the aim of protecting the data for secure communication, a new hybrid pipelined AES algorithm with enhanced security features is implemented. This paper proposes testing an AES core with unpredictable response compaction and bit level-masking throughout the scan chain process. A bit-level scan flipflop focused on masking as a scan protection solution for secure testing. The experimental results show that the best security is provided by the randomized addition of masked scan flipflop through the scan chain and also provides minimal design difficulty and power expansion overhead with some negligible delay measures. Thus, the proposed technique outperforms the state-of-the-art LUT-based S-box and the composite sub-byte transformation model regarding throughput rate 2 times and 15 times respectively. And security measured in the avalanche effect for the sub-pipelined model has been increased up to 95 per cent with reduced computational complexity. Also, the proposed sub-pipelined S-box utilizing a composite field arithmetic scheme achieves 7 per cent area effectiveness and 2.5 times the hardware complexity compared to the LUT-based model

Design for Test and Hardware Security Utilizing Tester Authentication Techniques

Design-for-Test (DFT) techniques have been developed to improve testability of integrated circuits. Among the known DFT techniques, scan-based testing is considered an efficient solution for digital circuits. However, scan architecture can be exploited to launch a side channel attack. Scan chains can be used to access a cryptographic core inside a system-on-chip to extract critical information such as a private encryption key. For a scan enabled chip, if an attacker is given unlimited access to apply all sorts of inputs to the Circuit-Under-Test (CUT) and observe the outputs, the probability of gaining access to critical information increases. In this thesis, solutions are presented to improve hardware security and protect them against attacks using scan architecture. A solution based on tester authentication is presented in which, the CUT requests the tester to provide a secret code for authentication. The tester authentication circuit limits the access to the scan architecture to known testers. Moreover, in the proposed solution the number of attempts to apply test vectors and observe the results through the scan architecture is limited to make brute-force attacks practically impossible. A tester authentication utilizing a Phase Locked Loop (PLL) to encrypt the operating frequency of both DUT/Tester has also been presented. In this method, the access to the critical security circuits such as crypto-cores are not granted in the test mode. Instead, a built-in self-test method is used in the test mode to protect the circuit against scan-based attacks. Security for new generation of three-dimensional (3D) integrated circuits has been investigated through 3D simulations COMSOL Multiphysics environment. It is shown that the process of wafer thinning for 3D stacked IC integration reduces the leakage current which increases the chip security against side-channel attacks

ElectroMagnetic Analysis and Fault Injection onto Secure Circuits

International audienceImplementation attacks are a major threat to hardware cryptographic implementations. These attacks exploit the correlation existing between the computed data and variables such as computation time, consumed power, and electromagnetic (EM) emissions. Recently, the EM channel has been proven as an effective passive and active attack technique against secure implementations. In this paper, we review the recent results obtained on this subject, with a particular focus on EM as a fault injection tool

A new countermeasure against side-channel attacks based on hardware-software co-design

This paper aims at presenting a new countermeasure against Side-Channel Analysis (SCA) attacks, whose implementation is based on a hardware-software co-design. The hardware architecture consists of a microprocessor, which executes the algorithm using a false key, and a coprocessor that performs several operations that are necessary to retrieve the original text that was encrypted with the real key. The coprocessor hardly affects the power consumption of the device, so that any classical attack based on such power consumption would reveal a false key. Additionally, as the operations carried out by the coprocessor are performed in parallel with the microprocessor, the execution time devoted for encrypting a specific text is not affected by the proposed countermeasure. In order to verify the correctness of our proposal, the system was implemented on a Virtex 5 FPGA. Different SCA attacks were performed on several functions of AES algorithm. Experimental results show in all cases that the system is effectively protected by revealing a false encryption key.Peer ReviewedPreprin

A Hardware Security Solution against Scan-Based Attacks

Scan based Design for Test (DfT) schemes have been widely used to achieve high fault coverage for integrated circuits. The scan technique provides full access to the internal nodes of the device-under-test to control them or observe their response to input test vectors. While such comprehensive access is highly desirable for testing, it is not acceptable for secure chips as it is subject to exploitation by various attacks. In this work, new methods are presented to protect the security of critical information against scan-based attacks. In the proposed methods, access to the circuit containing secret information via the scan chain has been severely limited in order to reduce the risk of a security breach. To ensure the testability of the circuit, a built-in self-test which utilizes an LFSR as the test pattern generator (TPG) is proposed. The proposed schemes can be used as a countermeasure against side channel attacks with a low area overhead as compared to the existing solutions in literature

Subthreshold circuits: Design, implementation and application

Digital circuits operating in the subthreshold region of the transistor are being used as an ideal option for ultra low power complementary metal-oxide-semiconductor (CMOS) design. The use of subthreshold circuit design in cryptographic systems is gaining importance as a counter measure to power analysis attacks. A power analysis attack is a non-invasive side channel attack in which the power consumption of the cryptographic system can be analyzed to retrieve the encrypted data. A number of techniques to increase the resistance to power attacks have been proposed at algorithmic and hardware levels, but these techniques suffer from large area and power overheads. The main aim of this research is to understand the viability of implementing subthreshold systems for cryptographic applications. Standard cell libraries in subthreshold are designed and a methodology to identify the minimum energy point, aspect ratio, frequency range and operating voltage for CMOS standard cells is defined. As scalar multiplication is the fundamental operation in elliptic curve cryptographic systems, a digit-level gaussian normal basis (GNB) multiplier is implemented using the aforementioned standard cells. A similar standard-cell library is designed for the multiplier to operate in the superthreshold regime. The subthreshold and superthreshold multipliers are then subjected to a differential power analysis attack. Power performance and signal-to-noise ratio (SNR) of both these systems are compared to evaluate the usefulness of the subthreshold design. The power consumption of the subthreshold multiplier is 4.554 uW, the speed of the multiplier is 65.1 KHz and the SNR is 40 dB. The superthreshold multiplier has a power consumption of 4.005 mW, the speed of the multiplier is 330 MHz and the SNR is 200 dB. Reduced power consumption, hence reduced SNR, increases the resistance of the subthreshold multiplier against power analysis attacks. (Refer to PDF for exact formulas)