Conceptual design and feasibility evaluation model of a 10 to the 8th power bit oligatomic mass memory. Volume 1: Conceptual design

The oligatomic (mirror) thin film memory technology is a suitable candidate for general purpose spaceborne applications in the post-1975 time frame. Capacities of around 10 to the 8th power bits can be reliably implemented with systems designed around a 335 million bit module. The recommended mode was determined following an investigation of implementation sizes ranging from an 8,000,000 to 100,000,000 bits per module. Cost, power, weight, volume, reliability, maintainability and speed were investigated. The memory includes random access, NDRO, SEC-DED, nonvolatility, and dual interface characteristics. The applications most suitable for the technology are those involving a large capacity with high speed (no latency), nonvolatility, and random accessing

Fault-tolerant hardware designs and their reliability analysis

This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University.Fault-tolerance, which is a complement to fault prevention, is an effective method of achieving ultra-high reliability. By taking this approach fault free computation can be achieved despite the presence of fault in the system. In this thesis three new fault tolerant techniques are presented and their advantages over well known fault-tolerant strategies are shown. One of these new techniques achieves higher reliability than any other similar techniques presented in the literature. Generally fault-tolerant structures consist of four major blocks: the replicated modules, the disagreement and detection circuit, the switching circuit, and the voting mechanism. The most critical component in a fault-tolerant system is the voter because the final output of the system is computed by this component. This dissertation presents a new implementation for voters which reduces both the complexity and the occupied area on the chip. The structures of the three techniques developed in this work are such that the complexity of their switching mechanisms grows only linearly with the number of modules but the voting mechanism complexity increases significantly. This is a better approach than those schemes in which the switching complexity increases significantly and the voter's complexity remains constant or grows linearly with the number of modules because it is easier to implement a complex voter than a complex switch (voters have more regular structures). Extensive comparisons are made between different fault-tolerant techniques. A new reliability model is also developed for system reliability evaluation of the new designs. The results of these analyses are plotted, and the advantages of the new techniques are demonstrated. In the final part of the work an expert system is described which uses the knowledge acquired by these comparisons. This expert system is meant as a prototype of a component of a CAD tool which will act as an advisor on fault-tolerant techniques

A general graphical user interface for automatic reliability modeling

Reported here is a general Graphical User Interface (GUI) for automatic reliability modeling of Processor Memory Switch (PMS) structures using a Markov model. This GUI is based on a hierarchy of windows. One window has graphical editing capabilities for specifying the system's communication structure, hierarchy, reconfiguration capabilities, and requirements. Other windows have field texts, popup menus, and buttons for specifying parameters and selecting actions. An example application of the GUI is given

Multi-kilowatt modularized spacecraft power processing system development

A review of existing information pertaining to spacecraft power processing systems and equipment was accomplished with a view towards applicability to the modularization of multi-kilowatt power processors. Power requirements for future spacecraft were determined from the NASA mission model-shuttle systems payload data study which provided the limits for modular power equipment capabilities. Three power processing systems were compared to evaluation criteria to select the system best suited for modularity. The shunt regulated direct energy transfer system was selected by this analysis for a conceptual design effort which produced equipment specifications, schematics, envelope drawings, and power module configurations

Towards automatic Markov reliability modeling of computer architectures

The analysis and evaluation of reliability measures using time-varying Markov models is required for Processor-Memory-Switch (PMS) structures that have competing processes such as standby redundancy and repair, or renewal processes such as transient or intermittent faults. The task of generating these models is tedious and prone to human error due to the large number of states and transitions involved in any reasonable system. Therefore model formulation is a major analysis bottleneck, and model verification is a major validation problem. The general unfamiliarity of computer architects with Markov modeling techniques further increases the necessity of automating the model formulation. This paper presents an overview of the Automated Reliability Modeling (ARM) program, under development at NASA Langley Research Center. ARM will accept as input a description of the PMS interconnection graph, the behavior of the PMS components, the fault-tolerant strategies, and the operational requirements. The output of ARM will be the reliability of availability Markov model formulated for direct use by evaluation programs. The advantages of such an approach are (a) utility to a large class of users, not necessarily expert in reliability analysis, and (b) a lower probability of human error in the computation

Fault-tolerance techniques for hybrid CMOS/nanoarchitecture

The authors propose two fault-tolerance techniques for hybrid CMOS/nanoarchitecture implementing logic functions as look-up tables. The authors compare the efficiency of the proposed techniques with recently reported methods that use single coding schemes in tolerating high fault rates in nanoscale fabrics. Both proposed techniques are based on error correcting codes to tackle different fault rates. In the first technique, the authors implement a combined two-dimensional coding scheme using Hamming and Bose-Chaudhuri-Hocquenghem (BCH) codes to address fault rates greater than 5. In the second technique, Hamming coding is complemented with bad line exclusion technique to tolerate fault rates higher than the first proposed technique (up to 20). The authors have also estimated the improvement that can be achieved in the circuit reliability in the presence of Don-t Care Conditions. The area, latency and energy costs of the proposed techniques were also estimated in the CMOS domain

Study of high voltage solar array configurations with integrated power control electronics

Solar array electrical configurations for voltage regulatio