A 0.3-1.2V Schottky-Based CMOS ZTC Voltage Reference

A voltage reference based on MOSFETs operated under Zero Temperature Coefficient (ZTC) bias is proposed. The circuit operates in a power supply voltage range from 0.3V up to 1.2V and outputs three different reference voltages using Standard-VT (SVT), Low-VT (LVT), and Zero-VT (ZVT) MOS transistors biased near their ZTC point by a single PTAT current reference. Measurements on 15 circuit samples fabricated in a standard 0.13-µm CMOS process show a worst-case normalized standard deviation (σ/µ) of 3% (SVT), 5.1% (LVT) and 10.8% (ZVT) respectively with a 75% of confidence level. At the nominal supply voltage of 0.45 V, the measured effective temperature coefficients (TCeff) range from 140 to 200 ppm/oC over the full commercial temperature range. At room temperature (25oC), line sensitivity in the ZVT VR is just 1.3%/100mV, over the whole supply range. The proposed reference draws around 5 µW and occupies 0.014 mm2 of silicon area

Near-Zero-Power Temperature Sensing via Tunneling Currents Through Complementary Metal-Oxide-Semiconductor Transistors.

Temperature sensors are routinely found in devices used to monitor the environment, the human body, industrial equipment, and beyond. In many such applications, the energy available from batteries or the power available from energy harvesters is extremely limited due to limited available volume, and thus the power consumption of sensing should be minimized in order to maximize operational lifetime. Here we present a new method to transduce and digitize temperature at very low power levels. Specifically, two pA current references are generated via small tunneling-current metal-oxide-semiconductor field effect transistors (MOSFETs) that are independent and proportional to temperature, respectively, which are then used to charge digitally-controllable banks of metal-insulator-metal (MIM) capacitors that, via a discrete-time feedback loop that equalizes charging time, digitize temperature directly. The proposed temperature sensor was integrated into a silicon microchip and occupied 0.15 mm2 of area. Four tested microchips were measured to consume only 113 pW with a resolution of 0.21 °C and an inaccuracy of ±1.65 °C, which represents a 628× reduction in power compared to prior-art without a significant reduction in performance

A Low-quiescent Current Full on-chip 1.2 V CMOS Low Drop-Out Regulator

This paper presents a fully-integrated low-power 0.18 µm CMOS Low-Dropout (LDO) regulator for battery operated portable devices. It provides an accurate 1.2 V output voltage from 3.3 V to 1.3 V input voltages up with only 5.9 µA quiescent current, including an all-MOS 0.4 V reference voltage

A Sub-kT/q Voltage Reference Operating at 150 mV

We propose a subthreshold CMOS voltage reference operating with a minimum supply voltage of only 150 mV, which is three times lower than the minimum value presently reported in the literature. The generated reference voltage is only 17.69 mV. This result has been achieved by introducing a temperature compensation technique that does not require the drain-source voltage of each MOSFET to be larger than 4kT/q. The implemented solution consists in two transistors voltage reference with two MOSFETs of the same threshold-type and exploits the dependence of the threshold voltage on transistor size. Measurements performed over a large sample population of 60 chips from two separate batches show a standard deviation of only 0.29 mV. The mean variation of the reference voltage for VDD ranging from 0.15 to 1.8 V is 359.5 μV/V, whereas the mean variation of VREF in the temperature range from 0°C to 120°C is 26.74 μV/°C. The mean power consumption at 25 °C for VDD = 0.15 V is 26.1 pW. The occupied area is 1200 μm2

A fully-integrated 180 nm CMOS 1.2 V low-dropout regulator for low-power portable applications

This paper presents the design and postlayout simulation results of a capacitor-less low dropout (LDO) regulator fully integrated in a low-cost standard 180 nm Complementary Metal-Oxide-Semiconductor (CMOS) technology which regulates the output voltage at 1.2 V from a 3.3 to 1.3 V battery over a -40 to 120 degrees C temperature range. To meet with the constraints of system-on-chip (SoC) battery-operated devices, ultralow power (I-q = 8.6 mu A) and minimum area consumption (0.109 mm(2)) are maintained, including a reference voltage V-ref = 0.4 V. It uses a high-gain dynamically biased folded-based error amplifier topology optimized for low-voltage operation that achieves an enhanced regulation-fast transient performance trade-off

A low-power native NMOS-based bandgap reference operating from −55°C to 125°C with Li-Ion battery compatibility

Summary The paper describes the implementation of a bandgap reference based on native-MOSFET transistors for low-power sensor node applications. The circuit can operate from −55°C to 125°C and with a supply voltage ranging from 1.5 to 4.2 V. Therefore, it is compatible with the temperature range of automotive and military-aerospace applications, and for direct Li-Ion battery attach. Moreover, the circuit can operate without any dedicated start-up circuit, thanks to its inherent single operating point. A mathematical model of the reference circuit is presented, allowing simple portability across technology nodes, with current consumption and silicon area as design parameters. Implemented in a 55-nm CMOS technology, the voltage reference achieves a measured average (maximum) temperature coefficient of 28 ppm/°C (43 ppm/°C) and a measured sample-to-sample variation within 57 mV, with a current consumption of 420 nA at 27°C

An Implantable Phase Locked Loop MEMS Based Readout System for Heart Transplantation

An implantable readout circuit using a MEMS pressure sensor has been designed and implemented to monitor the heart activity after heart transplant surgery. It features a time domain architecture using two identical voltage-controlled oscillators and phase locked loop circuits. The circuit was implemented in a 65 nm CMOS technology with 1 V power supply. It consumes 100 lW power and provides a digital output that is proportional to the analog sensor input with a bandwidth of up to 4 kHz. The SNR of the system is 53 dB. Measurements show the operation of the readout chip with the MEMS sensor

Integrated Circuits for Programming Flash Memories in Portable Applications

Smart devices such as smart grids, smart home devices, etc. are infrastructure systems that connect the world around us more than before. These devices can communicate with each other and help us manage our environment. This concept is called the Internet of Things (IoT). Not many smart nodes exist that are both low-power and programmable. Floating-gate (FG) transistors could be used to create adaptive sensor nodes by providing programmable bias currents. FG transistors are mostly used in digital applications like Flash memories. However, FG transistors can be used in analog applications, too. Unfortunately, due to the expensive infrastructure required for programming these transistors, they have not been economical to be used in portable applications. In this work, we present low-power approaches to programming FG transistors which make them a good candidate to be employed in future wireless sensor nodes and portable systems. First, we focus on the design of low-power circuits which can be used in programming the FG transistors such as high-voltage charge pumps, low-drop-out regulators, and voltage reference cells. Then, to achieve the goal of reducing the power consumption in programmable sensor nodes and reducing the programming infrastructure, we present a method to program FG transistors using negative voltages. We also present charge-pump structures to generate the necessary negative voltages for programming in this new configuration

In Situ Automatic Analog Circuit Calibration and Optimization

As semiconductor technology scales down, the variations of active/passive device characteristics after fabrication are getting more and more significant. As a result, many circuits need more accuracy margin to meet minimum accuracy specifications over huge process-voltage-temperature (PVT) variations. Although, overdesigning a circuit is sometimes not a feasible option because of excessive accuracy margin that requires high power consumption and large area. Consequently, calibration/tuning circuits that can automatically detect and compensate the variations have been researched for analog circuits to make better trade-offs among accuracy, power consumption, and area. The first part of this dissertation shows that a newly proposed in situ calibration circuit for a current reference can relax the sharp trade-off between the temperature coefficient accuracy and the power consumption of the current reference. Prototype chips fabricated in a 180 nm CMOS technology generate 1 nA and achieve an average temperature coefficient of 289 ppm/°C and an average line sensitivity of 1.4 %/V with no help from a multiple-temperature trimming. Compared with other state-of-the-art current references that do not need a multiple-temperature trimming, the proposed circuit consumes at least 74% less power, while maintaining similar or higher accuracy. The second part of this dissertation proves that a newly proposed multidimensional in situ analog circuit optimization platform can optimize a Tow-Thomas bandpass biquad. Unlike conventional calibration/tuning approaches, which only handle one or two frequency-domain characteristics, the proposed platform optimizes the power consumption, frequency-, and time-domain characteristics of the biquad to make a better trade-off between the accuracy and the power consumption of the biquad. Simulation results show that this platform reduces the gain-bandwidth product of op-amps in the biquad by 80% while reducing the standard deviations of frequency- and time-domain characteristics by 82%. Measurement results of a prototype chip fabricated in a 180 nm CMOS technology also show that this platform can save maximum 71% of the power consumption of the biquad while the biquad maintains its frequency-domain characteristics: Q, ωO and the gain at ωO