Scan-Chain Intra-Cell Aware Testing

This paper first presents an evaluation of the effectiveness of different test pattern sets in terms of ability to detect possible intra-cell defects affecting the scan flip-flops. The analysis is then used to develop an effective test solution to improve the overall test quality. As a major result, the paper demonstrates that by combining test vectors generated by a commercial ATPG to detect stuck-at and delay faults, plus a fragment of extra test patterns generated to specifically target the escaped defects, we can obtain a higher intra-cell defect coverage (i.e., 6.46% on average) and a shorter test time (i.e., 42.20% on average) than by straightforwardly using an ATPG which directly targets these defects

Fully automated urban traffic system

The replacement of the driver with an automatic system which could perform the functions of guiding and routing a vehicle with a human's capability of responding to changing traffic demands was discussed. The problem was divided into four technological areas; guidance, routing, computing, and communications. It was determined that the latter three areas being developed independent of any need for fully automated urban traffic. A guidance system that would meet system requirements was not being developed but was technically feasible