Fault-tolerant sub-lithographic design with rollback recovery

Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacitance lead us into a regime where transient errors in logic cannot be ignored. Consequently, several recent studies have focused on feed-forward spatial redundancy techniques to combat these high transient fault rates. To complement these studies, we analyze fine-grained rollback techniques and show that they can offer lower spatial redundancy factors with no significant impact on system performance for fault rates up to one fault per device per ten million cycles of operation (Pf = 10^-7) in systems with 10^12 susceptible devices. Further, we concretely demonstrate these claims on nanowire-based programmable logic arrays. Despite expensive rollback buffers and general-purpose, conservative analysis, we show the area overhead factor of our technique is roughly an order of magnitude lower than a gate level feed-forward redundancy scheme

ReDO: Cross-Layer Multi-Objective Design-Exploration Framework for Efficient Soft Error Resilient Systems

Designing soft errors resilient systems is a complex engineering task, which nowadays follows a cross-layer approach. It requires a careful planning for different fault-tolerance mechanisms at different system's layers: starting from the technology up to the software domain. While these design decisions have a positive effect on the reliability of the system, they usually have a detrimental effect on its size, power consumption, performance and cost. Design space exploration for cross-layer reliability is therefore a multi-objective search problem in which reliability must be traded-off with other design dimensions. This paper proposes a cross-layer multi-objective design space exploration algorithm developed to help designers when building soft error resilient electronic systems. The algorithm exploits a system-level Bayesian reliability estimation model to analyze the effect of different cross-layer combinations of protection mechanisms on the reliability of the full system. A new heuristic based on the extremal optimization theory is used to efficiently explore the design space. An extended set of simulations shows the capability of this framework when applied both to benchmark applications and realistic systems, providing optimized systems that outperform those obtained by applying state-of-the-art cross-layer reliability techniques

Cross layer reliability estimation for digital systems

Forthcoming manufacturing technologies hold the promise to increase multifuctional computing systems performance and functionality thanks to a remarkable growth of the device integration density. Despite the benefits introduced by this technology improvements, reliability is becoming a key challenge for the semiconductor industry. With transistor size reaching the atomic dimensions, vulnerability to unavoidable fluctuations in the manufacturing process and environmental stress rise dramatically. Failing to meet a reliability requirement may add excessive re-design cost to recover and may have severe consequences on the success of a product. %Worst-case design with large margins to guarantee reliable operation has been employed for long time. However, it is reaching a limit that makes it economically unsustainable due to its performance, area, and power cost. One of the open challenges for future technologies is building ``dependable'' systems on top of unreliable components, which will degrade and even fail during normal lifetime of the chip. Conventional design techniques are highly inefficient. They expend significant amount of energy to tolerate the device unpredictability by adding safety margins to a circuit's operating voltage, clock frequency or charge stored per bit. Unfortunately, the additional cost introduced to compensate unreliability are rapidly becoming unacceptable in today's environment where power consumption is often the limiting factor for integrated circuit performance, and energy efficiency is a top concern. Attention should be payed to tailor techniques to improve the reliability of a system on the basis of its requirements, ending up with cost-effective solutions favoring the success of the product on the market. Cross-layer reliability is one of the most promising approaches to achieve this goal. Cross-layer reliability techniques take into account the interactions between the layers composing a complex system (i.e., technology, hardware and software layers) to implement efficient cross-layer fault mitigation mechanisms. Fault tolerance mechanism are carefully implemented at different layers starting from the technology up to the software layer to carefully optimize the system by exploiting the inner capability of each layer to mask lower level faults. For this purpose, cross-layer reliability design techniques need to be complemented with cross-layer reliability evaluation tools, able to precisely assess the reliability level of a selected design early in the design cycle. Accurate and early reliability estimates would enable the exploration of the system design space and the optimization of multiple constraints such as performance, power consumption, cost and reliability. This Ph.D. thesis is devoted to the development of new methodologies and tools to evaluate and optimize the reliability of complex digital systems during the early design stages. More specifically, techniques addressing hardware accelerators (i.e., FPGAs and GPUs), microprocessors and full systems are discussed. All developed methodologies are presented in conjunction with their application to real-world use cases belonging to different computational domains

Medical Diagnosis with Multimodal Image Fusion Techniques

Image Fusion is an effective approach utilized to draw out all the significant information from the source images, which supports experts in evaluation and quick decision making. Multi modal medical image fusion produces a composite fused image utilizing various sources to improve quality and extract complementary information. It is extremely challenging to gather every piece of information needed using just one imaging method. Therefore, images obtained from different modalities are fused Additional clinical information can be gleaned through the fusion of several types of medical image pairings. This study's main aim is to present a thorough review of medical image fusion techniques which also covers steps in fusion process, levels of fusion, various imaging modalities with their pros and cons, and  the major scientific difficulties encountered in the area of medical image fusion. This paper also summarizes the quality assessments fusion metrics. The various approaches used by image fusion algorithms that are presently available in the literature are classified into four broad categories i) Spatial fusion methods ii) Multiscale Decomposition based methods iii) Neural Network based methods and iv) Fuzzy Logic based methods. the benefits and pitfalls of the existing literature are explored and Future insights are suggested. Moreover, this study is anticipated to create a solid platform for the development of better fusion techniques in medical applications

Genome-wide and molecular evolution analysis of the subtilase gene family in

Background Vitis vinifera (grape) is one of the most economically significant fruit crops in the world. The availability of the recently released grape genome sequence offers an opportunity to identify and analyze some important gene families in this species. Subtilases are a group of subtilisin-like serine proteases that are involved in many biological processes in plants. However, no comprehensive study incorporating phylogeny, chromosomal location and gene duplication, gene organization, functional divergence, selective pressure and expression profiling has been reported so far for the grape. Results In the present study, a comprehensive analysis of the subtilase gene family in V. vinifera was performed. Eighty subtilase genes were identified. Phylogenetic analyses indicated that these subtilase genes comprised eight groups. The gene organization is considerably conserved among the groups. Distribution of the subtilase genes is non-random across the chromosomes. A high proportion of these genes are preferentially clustered, indicating that tandem duplications may have contributed significantly to the expansion of the subtilase gene family. Analyses of divergence and adaptive evolution show that while purifying selection may have been the main force driving the evolution of grape subtilases, some of the critical sites responsible for the divergence may have been under positive selection. Further analyses of real-time PCR data suggested that many subtilase genes might be important in the stress response and functional development of plants. Conclusions Tandem duplications as well as purifying and positive selections have contributed to the functional divergence of subtilase genes in V. vinifera. The data may contribute to a better understanding of the grape subtilase gene family