Novel Computational Methods for Integrated Circuit Reverse Engineering

Production of Integrated Circuits (ICs) has been largely strengthened by globalization. System-on-chip providers are capable of utilizing many different providers which can be responsible for a single task. This horizontal structure drastically improves to time-to-market and reduces manufacturing cost. However, untrust of oversea foundries threatens to dismantle the complex economic model currently in place. Many Intellectual Property (IP) consumers become concerned over what potentially malicious or unspecified logic might reside within their application. This logic which is inserted with the intention of causing harm to a consumer has been referred to as a Hardware Trojan (HT). To help IP consumers, researchers have looked into methods for finding HTs. Such methods tend to rely on high-level information relating to the circuit, which might not be accessible. There is a high possibility that IP is delivered in the gate or layout level. Some services and image processing methods can be leveraged to convert layout level information to gate-level, but such formats are incompatible with detection schemes that require hardware description language. By leveraging standard graph and dynamic programming algorithms a set of tools is developed that can help bridge the gap between gate-level netlist access and HT detection. To help in this endeavor this dissertation focuses on several problems associated with reverse engineering ICs. Logic signal identification is used to find malicious signals, and logic desynthesis is used to extract high level details. Each of the proposed method have their results analyzed for accuracy and runtime. It is found that method for finding logic tends to be the most difficult task, in part due to the degree of heuristic\u27s inaccuracy. With minor improvements moderate sized ICs could have their high-level function recovered within minutes, which would allow for a trained eye or automated methods to more easily detect discrepancies within a circuit\u27s design

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

Investigation into Detection of Hardware Trojans on Printed Circuit Boards

The modern semiconductor device manufacturing flow is becoming increasingly vulnerable to malicious implants called Hardware Trojans (HT). With HTs becoming stealthier, a need for more accurate and efficient detection methods is becoming increasingly crucial at both Integrated Circuit (IC) and Printed Circuit Board (PCB) levels. While HT detection at an IC level has been widely studied, there is still very limited research on detecting and preventing HTs implanted on PCBs. In recent years the rise of outsourcing design and fabrication of electronics, including PCBs, to third parties has dramatically increased the possibility of malicious alteration and consequently the security risk for systems incorporating PCBs. Providing mechanical support for the electrical interconnections between different components, PCBs are an important part of electronic systems. Modern, complex and highly integrated designs may contain up to thirty layers, with concealed micro-vias and embedded passive components. An adversary can aim to modify the PCB design by tampering the copper interconnections or inserting extra components in an internal layer of a multi-layer board. Similar to its IC counterpart, a PCB HT can, among other things, cause system failure or leakage of private information. The disruptive actions of a carefully designed HT attack can have catastrophic implications and should therefore be taken seriously by industry, academia and the government. This thesis gives an account of work carried out in three projects concerned with HT detection on a PCB. In the first contribution a power analysis method is proposed for detecting HT components, implanted on the surface or otherwise, consuming power from the power distribution network. The assumption is that any HT device actively tampering or eavesdropping on the signals in the PCB circuit will consume electrical power. Harvesting this side-channel effect and observing the fluctuations of power consumption on the PCB power distribution network enables evincing the HT. Using a purpose-built PCB prototype, an experimental setup is developed for verification of the methodology. The results confirm the ability to detect alien components on a PCB without interference with its main functionality. In the second contribution the monitoring methodology is further developed by applying machine learning (ML) techniques to detect stealthier HTs, consuming power from I/O ports of legitimate ICs on the PCB. Two algorithms, One-Class Support Vector Machine (SVM) and Local Outlier Factor (LOF), are implemented on the legitimate power consumption data harvested experimentally from the PCB prototype. Simulation results are validated through real-life measurements and experiments are carried out on the prototype PCB. For validation of the ML classification models, one hundred categories of HTs are modelled and inserted into the datasets. Simulation results show that using the proposed methodology an HT can be detected with high prediction accuracy (F1-score at 99% for a 15 mW HT). Further, the developed ML model is uploaded to the prototype PCB for experimental validation. The results show consistency between simulations and experiments, with an average discrepancy of ±5.9% observed between One-Class SVM simulations and real-life experiments. The machine learning models developed for HT detection are low-cost in terms of memory (around 27 KB). In the third contribution an automated visual inspection methodology is proposed for detecting HTs on the surface of a PCB. It is based on a combination of conventional computer vision techniques and a dual tower Siamese Neural Network (SNN), modelled in a three stage pipeline. In the interest of making the proposed methodology broadly applicable a particular emphasis is made on the imaging modality of choice, whereby a regular digital optical camera is chosen. The dataset of PCB images is developed in a controlled environment of a photographic tent. The novelty in this work is that, instead of a generic production fault detection, the algorithm is optimised and trained specifically for implanted HT component detection on a PCB, be it active or passive. The proposed HT detection methodology is trained and tested with three groups of HTs, categorised based on their surface area, ranging from 4 mm² to 280 mm² and above. The results show that it is possible to reach effective detection accuracy of 95.1% for HTs as small as 4 mm². In case of HTs with surface area larger than 280 mm² the detection accuracy is around 96.1%, while the average performance across all HT groups is 95.6%

HAL — The Missing Piece of the Puzzle for Hardware Reverse Engineering, Trojan Detection and Insertion

Hardware manipulations pose a serious threat to numerous systems, ranging from a myriad of smart-X devices to military systems. In many attack scenarios an adversary merely has access to the low-level, potentially obfuscated gate-level netlist. In general, the attacker possesses minimal information and faces the costly and time-consuming task of reverse engineering the design to identify security-critical circuitry, followed by the insertion of a meaningful hardware Trojan. These challenges have been considered only in passing by the research community. The contribution of this work is threefold: First, we present HAL, a comprehensive reverse engineering and manipulation framework for gate-level netlists. HAL allows automating defensive design analysis (e.g., including arbitrary Trojan detection algorithms with minimal effort) as well as offensive reverse engineering and targeted logic insertion. Second, we present a novel static analysis Trojan detection technique ANGEL which considerably reduces the false-positive detection rate of the detection technique FANCI. Furthermore, we demonstrate that ANGEL is capable of automatically detecting Trojans obfuscated with DeTrust. Third, we demonstrate how a malicious party can semi-automatically inject hardware Trojans into third-party designs. We present reverse engineering algorithms to disarm and trick cryptographic self-tests, and subtly leak cryptographic keys without any a priori knowledge of the design’s internal workings

Runtime Monitoring for Dependable Hardware Design

Mit dem Voranschreiten der Technologieskalierung und der Globalisierung der Produktion von integrierten Schaltkreisen eröffnen sich eine Fülle von Schwachstellen bezüglich der Verlässlichkeit von Computerhardware. Jeder Mikrochip wird aufgrund von Produktionsschwankungen mit einem einzigartigen Charakter geboren, welcher sich durch seine Arbeitsbedingungen, Belastung und Umgebung in individueller Weise entwickelt. Daher sind deterministische Modelle, welche zur Entwurfszeit die Verlässlichkeit prognostizieren, nicht mehr ausreichend um Integrierte Schaltkreise mit Nanometertechnologie sinnvoll abbilden zu können. Der Bedarf einer Laufzeitanalyse des Zustandes steigt und mit ihm die notwendigen Maßnahmen zum Erhalt der Zuverlässigkeit. Transistoren sind anfällig für auslastungsbedingte Alterung, die die Laufzeit der Schaltung erhöht und mit ihr die Möglichkeit einer Fehlberechnung. Hinzu kommen spezielle Abläufe die das schnelle Altern des Chips befördern und somit seine zuverlässige Lebenszeit reduzieren. Zusätzlich können strahlungsbedingte Laufzeitfehler (Soft-Errors) des Chips abnormales Verhalten kritischer Systeme verursachen. Sowohl das Ausbreiten als auch das Maskieren dieser Fehler wiederum sind abhängig von der Arbeitslast des Systems. Fabrizierten Chips können ebenfalls vorsätzlich während der Produktion boshafte Schaltungen, sogenannte Hardwaretrojaner, hinzugefügt werden. Dies kompromittiert die Sicherheit des Chips. Da diese Art der Manipulation vor ihrer Aktivierung kaum zu erfassen ist, ist der Nachweis von Trojanern auf einem Chip direkt nach der Produktion extrem schwierig. Die Komplexität dieser Verlässlichkeitsprobleme machen ein einfaches Modellieren der Zuverlässigkeit und Gegenmaßnahmen ineffizient. Sie entsteht aufgrund verschiedener Quellen, eingeschlossen der Entwicklungsparameter (Technologie, Gerät, Schaltung und Architektur), der Herstellungsparameter, der Laufzeitauslastung und der Arbeitsumgebung. Dies motiviert das Erforschen von maschinellem Lernen und Laufzeitmethoden, welche potentiell mit dieser Komplexität arbeiten können. In dieser Arbeit stellen wir Lösungen vor, die in der Lage sind, eine verlässliche Ausführung von Computerhardware mit unterschiedlichem Laufzeitverhalten und Arbeitsbedingungen zu gewährleisten. Wir entwickelten Techniken des maschinellen Lernens um verschiedene Zuverlässigkeitseffekte zu modellieren, zu überwachen und auszugleichen. Verschiedene Lernmethoden werden genutzt, um günstige Überwachungspunkte zur Kontrolle der Arbeitsbelastung zu finden. Diese werden zusammen mit Zuverlässigkeitsmetriken, aufbauend auf Ausfallsicherheit und generellen Sicherheitsattributen, zum Erstellen von Vorhersagemodellen genutzt. Des Weiteren präsentieren wir eine kosten-optimierte Hardwaremonitorschaltung, welche die Überwachungspunkte zur Laufzeit auswertet. Im Gegensatz zum aktuellen Stand der Technik, welcher mikroarchitektonische Überwachungspunkte ausnutzt, evaluieren wir das Potential von Arbeitsbelastungscharakteristiken auf der Logikebene der zugrundeliegenden Hardware. Wir identifizieren verbesserte Features auf Logikebene um feingranulare Laufzeitüberwachung zu ermöglichen. Diese Logikanalyse wiederum hat verschiedene Stellschrauben um auf höhere Genauigkeit und niedrigeren Overhead zu optimieren. Wir untersuchten die Philosophie, Überwachungspunkte auf Logikebene mit Hilfe von Lernmethoden zu identifizieren und günstigen Monitore zu implementieren um eine adaptive Vorbeugung gegen statisches Altern, dynamisches Altern und strahlungsinduzierte Soft-Errors zu schaffen und zusätzlich die Aktivierung von Hardwaretrojanern zu erkennen. Diesbezüglich haben wir ein Vorhersagemodell entworfen, welches den Arbeitslasteinfluss auf alterungsbedingte Verschlechterungen des Chips mitverfolgt und dazu genutzt werden kann, dynamisch zur Laufzeit vorbeugende Techniken, wie Task-Mitigation, Spannungs- und Frequenzskalierung zu benutzen. Dieses Vorhersagemodell wurde in Software implementiert, welche verschiedene Arbeitslasten aufgrund ihrer Alterungswirkung einordnet. Um die Widerstandsfähigkeit gegenüber beschleunigter Alterung sicherzustellen, stellen wir eine Überwachungshardware vor, welche einen Teil der kritischen Flip-Flops beaufsichtigt, nach beschleunigter Alterung Ausschau hält und davor warnt, wenn ein zeitkritischer Pfad unter starker Alterungsbelastung steht. Wir geben die Implementierung einer Technik zum Reduzieren der durch das Ausführen spezifischer Subroutinen auftretenden Belastung von zeitkritischen Pfaden. Zusätzlich schlagen wir eine Technik zur Abschätzung von online Soft-Error-Schwachstellen von Speicherarrays und Logikkernen vor, welche auf der Überwachung einer kleinen Gruppe Flip-Flops des Entwurfs basiert. Des Weiteren haben wir eine Methode basierend auf Anomalieerkennung entwickelt, um Arbeitslastsignaturen von Hardwaretrojanern während deren Aktivierung zur Laufzeit zu erkennen und somit eine letzte Verteidigungslinie zu bilden. Basierend auf diesen Experimenten demonstriert diese Arbeit das Potential von fortgeschrittener Feature-Extraktion auf Logikebene und lernbasierter Vorhersage basierend auf Laufzeitdaten zur Verbesserung der Zuverlässigkeit von Harwareentwürfen

Reliability and Security Assessment of Modern Embedded Devices

L'abstract è presente nell'allegato / the abstract is in the attachmen

Adversarial Deep Learning and Security with a Hardware Perspective

Adversarial deep learning is the field of study which analyzes deep learning in the presence of adversarial entities. This entails understanding the capabilities, objectives, and attack scenarios available to the adversary to develop defensive mechanisms and avenues of robustness available to the benign parties. Understanding this facet of deep learning helps us improve the safety of the deep learning systems against external threats from adversaries. However, of equal importance, this perspective also helps the industry understand and respond to critical failures in the technology. The expectation of future success has driven significant interest in developing this technology broadly. Adversarial deep learning stands as a balancing force to ensure these developments remain grounded in the real-world and proceed along a responsible trajectory. Recently, the growth of deep learning has begun intersecting with the computer hardware domain to improve performance and efficiency for resource constrained application domains. The works investigated in this dissertation constitute our pioneering efforts in migrating adversarial deep learning into the hardware domain alongside its parent field of research