Testing of leakage current failure in ASIC devices exposed to total ionizing dose environment using design for testability techniques

Due to the advancements in technology, electronic devices have been relied upon to operate under harsh conditions. Radiation is one of the main causes of different failures of the electronics devices. According to the operation environment, the sources of the radiation can be terrestrial or extra-terrestrial. For terrestrial the devices can be used in nuclear reactors or biomedical devices where the radiation is man-made. While for the extra- terrestrial, the devices can be used in satellites, the international space station or spaceships, where the radiation comes from various sources like the Sun. According to the operation environment the effects of radiation differ. These effects falls under two categories, total ionizing dose effect (TID) and single event effects (SEEs). TID effects can be affect the delay and leakage current of CMOS circuits negatively. The affects can therefore hinder the integrated circuits\u27 operation. Before the circuits are used, particularly in critical radiation heavy applications like military and space, testing under radiation must be done to avoid any failures during operation. The standard in testing electronic devices is generating worst case test vectors (WCTVs) and under radiation using these vectors the circuits are tested. However, the generation of these WCTVs have been very challenging so this approach is rarely used for TIDs effects. Design for testability (DFT) have been widely used in the industry for digital circuits testing applications. DFT is usually used with automatic test patterns generation software to generate test vectors against fault models of manufacturer defects for application specific integrated circuit (ASIC.) However, it was never used to generate test vectors for leakage current testing induced in ASICs exposed to TID radiation environment. The purpose of the thesis is to use DFT to identify WCTVs for leakage current failures in sequential circuits for ASIC devices exposed to TID. A novel methodology was devised to identify these test vectors. The methodology is validated and compared to previous non DFT methods. The methodology is proven to overcome the limitation of previous methodologies

A configurable vector processor for accelerating speech coding algorithms

The growing demand for voice-over-packer (VoIP) services and multimedia-rich applications has made increasingly important the efficient, real-time implementation of low-bit rates speech coders on embedded VLSI platforms. Such speech coders are designed to substantially reduce the bandwidth requirements thus enabling dense multichannel gateways in small form factor. This however comes at a high computational cost which mandates the use of very high performance embedded processors. This thesis investigates the potential acceleration of two major ITU-T speech coding algorithms, namely G.729A and G.723.1, through their efficient implementation on a configurable extensible vector embedded CPU architecture. New scalar and vector ISAs were introduced which resulted in up to 80% reduction in the dynamic instruction count of both workloads. These instructions were subsequently encapsulated into a parametric, hybrid SISD (scalar processor)–SIMD (vector) processor. This work presents the research and implementation of the vector datapath of this vector coprocessor which is tightly-coupled to a Sparc-V8 compliant CPU, the optimization and simulation methodologies employed and the use of Electronic System Level (ESL) techniques to rapidly design SIMD datapaths