Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac

Trojans in Early Design Steps—An Emerging Threat

Hardware Trojans inserted by malicious foundries during integrated circuit manufacturing have received substantial attention in recent years. In this paper, we focus on a different type of hardware Trojan threats: attacks in the early steps of design process. We show that third-party intellectual property cores and CAD tools constitute realistic attack surfaces and that even system specification can be targeted by adversaries. We discuss the devastating damage potential of such attacks, the applicable countermeasures against them and their deficiencies

A Cross-level Verification Methodology for Digital IPs Augmented with Embedded Timing Monitors

Smart systems are characterized by the integration in a single device of multi-domain subsystems of different technological domains, namely, analog, digital, discrete and power devices, MEMS, and power sources. Such challenges, emerging from the heterogeneous nature of the whole system, combined with the traditional challenges of digital design, directly impact on performance and on propagation delay of digital components. This article proposes a design approach to enhance the RTL model of a given digital component for the integration in smart systems with the automatic insertion of delay sensors, which can detect and correct timing failures. The article then proposes a methodology to verify such added features at system level. The augmented model is abstracted to SystemC TLM, which is automatically injected with mutants (i.e., code mutations) to emulate delays and timing failures. The resulting TLM model is finally simulated to identify timing failures and to verify the correctness of the inserted delay monitors. Experimental results demonstrate the applicability of the proposed design and verification methodology, thanks to an efficient sensor-aware abstraction methodology, by applying the flow to three complex case studies

A Cross-level Verification Methodology for Digital IPs Augmented with Embedded Timing Monitors

Smart systems implement the leading technology advances in the context of embedded devices. Current design methodologies are not suitable to deal with tightly interacting subsystems of different technological domains, namely analog, digital, discrete and power devices, MEMS and power sources. The interaction effects between the components and between the environment and the system must be modeled and simulated at system level to achieve high performance. Focusing on digital subsystem, additional design constraints have to be considered as a result of the integration of multi-domain subsystems in a single device. The main digital design challenges combined with those emerging from the heterogeneous nature of the whole system directly impact on performance, hence propagation delay, of the digital component. In this paper we propose a design approach to enhance the RTL model of a given digital component for the integration in smart systems, and a methodology to verify the added features at system-level. The design approach consists of ``augmenting'' the RTL model through the automatic insertion of delay sensors, which are capable of detecting and correcting timing failures. The verification methodology consists of an automatic flow of two steps. Firstly the augmented model is abstracted to system-level (i.e., SystemC TLM); secondly mutants, which are code mutations to emulate timing failures, are automatically injected into the abstracted model. Experimental results demonstrate the applicability of the proposed design and verification methodology and the effectiveness of the simulation performance

New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs

Tesis por compendio[EN] Relevance of electronics towards safety of common devices has only been growing, as an ever growing stake of the functionality is assigned to them. But of course, this comes along the constant need for higher performances to fulfill such functionality requirements, while keeping power and budget low. In this scenario, industry is struggling to provide a technology which meets all the performance, power and price specifications, at the cost of an increased vulnerability to several types of known faults or the appearance of new ones. To provide a solution for the new and growing faults in the systems, designers have been using traditional techniques from safety-critical applications, which offer in general suboptimal results. In fact, modern embedded architectures offer the possibility of optimizing the dependability properties by enabling the interaction of hardware, firmware and software levels in the process. However, that point is not yet successfully achieved. Advances in every level towards that direction are much needed if flexible, robust, resilient and cost effective fault tolerance is desired. The work presented here focuses on the hardware level, with the background consideration of a potential integration into a holistic approach. The efforts in this thesis have focused several issues: (i) to introduce additional fault models as required for adequate representativity of physical effects blooming in modern manufacturing technologies, (ii) to provide tools and methods to efficiently inject both the proposed models and classical ones, (iii) to analyze the optimum method for assessing the robustness of the systems by using extensive fault injection and later correlation with higher level layers in an effort to cut development time and cost, (iv) to provide new detection methodologies to cope with challenges modeled by proposed fault models, (v) to propose mitigation strategies focused towards tackling such new threat scenarios and (vi) to devise an automated methodology for the deployment of many fault tolerance mechanisms in a systematic robust way. The outcomes of the thesis constitute a suite of tools and methods to help the designer of critical systems in his task to develop robust, validated, and on-time designs tailored to his application.[ES] La relevancia que la electrónica adquiere en la seguridad de los productos ha crecido inexorablemente, puesto que cada vez ésta copa una mayor influencia en la funcionalidad de los mismos. Pero, por supuesto, este hecho viene acompañado de una necesidad constante de mayores prestaciones para cumplir con los requerimientos funcionales, al tiempo que se mantienen los costes y el consumo en unos niveles reducidos. En este escenario, la industria está realizando esfuerzos para proveer una tecnología que cumpla con todas las especificaciones de potencia, consumo y precio, a costa de un incremento en la vulnerabilidad a múltiples tipos de fallos conocidos o la introducción de nuevos. Para ofrecer una solución a los fallos nuevos y crecientes en los sistemas, los diseñadores han recurrido a técnicas tradicionalmente asociadas a sistemas críticos para la seguridad, que ofrecen en general resultados sub-óptimos. De hecho, las arquitecturas empotradas modernas ofrecen la posibilidad de optimizar las propiedades de confiabilidad al habilitar la interacción de los niveles de hardware, firmware y software en el proceso. No obstante, ese punto no está resulto todavía. Se necesitan avances en todos los niveles en la mencionada dirección para poder alcanzar los objetivos de una tolerancia a fallos flexible, robusta, resiliente y a bajo coste. El trabajo presentado aquí se centra en el nivel de hardware, con la consideración de fondo de una potencial integración en una estrategia holística. Los esfuerzos de esta tesis se han centrado en los siguientes aspectos: (i) la introducción de modelos de fallo adicionales requeridos para la representación adecuada de efectos físicos surgentes en las tecnologías de manufactura actuales, (ii) la provisión de herramientas y métodos para la inyección eficiente de los modelos propuestos y de los clásicos, (iii) el análisis del método óptimo para estudiar la robustez de sistemas mediante el uso de inyección de fallos extensiva, y la posterior correlación con capas de más alto nivel en un esfuerzo por recortar el tiempo y coste de desarrollo, (iv) la provisión de nuevos métodos de detección para cubrir los retos planteados por los modelos de fallo propuestos, (v) la propuesta de estrategias de mitigación enfocadas hacia el tratamiento de dichos escenarios de amenaza y (vi) la introducción de una metodología automatizada de despliegue de diversos mecanismos de tolerancia a fallos de forma robusta y sistemática. Los resultados de la presente tesis constituyen un conjunto de herramientas y métodos para ayudar al diseñador de sistemas críticos en su tarea de desarrollo de diseños robustos, validados y en tiempo adaptados a su aplicación.[CA] La rellevància que l'electrònica adquireix en la seguretat dels productes ha crescut inexorablement, puix cada volta més aquesta abasta una major influència en la funcionalitat dels mateixos. Però, per descomptat, aquest fet ve acompanyat d'un constant necessitat de majors prestacions per acomplir els requeriments funcionals, mentre es mantenen els costos i consums en uns nivells reduïts. Donat aquest escenari, la indústria està fent esforços per proveir una tecnologia que complisca amb totes les especificacions de potència, consum i preu, tot a costa d'un increment en la vulnerabilitat a diversos tipus de fallades conegudes, i a la introducció de nous tipus. Per oferir una solució a les noves i creixents fallades als sistemes, els dissenyadors han recorregut a tècniques tradicionalment associades a sistemes crítics per a la seguretat, que en general oferixen resultats sub-òptims. De fet, les arquitectures empotrades modernes oferixen la possibilitat d'optimitzar les propietats de confiabilitat en habilitar la interacció dels nivells de hardware, firmware i software en el procés. Tot i això eixe punt no està resolt encara. Es necessiten avanços a tots els nivells en l'esmentada direcció per poder assolir els objectius d'una tolerància a fallades flexible, robusta, resilient i a baix cost. El treball ací presentat se centra en el nivell de hardware, amb la consideració de fons d'una potencial integració en una estratègia holística. Els esforços d'esta tesi s'han centrat en els següents aspectes: (i) la introducció de models de fallada addicionals requerits per a la representació adequada d'efectes físics que apareixen en les tecnologies de fabricació actuals, (ii) la provisió de ferramentes i mètodes per a la injecció eficient del models proposats i dels clàssics, (iii) l'anàlisi del mètode òptim per estudiar la robustesa de sistemes mitjançant l'ús d'injecció de fallades extensiva, i la posterior correlació amb capes de més alt nivell en un esforç per retallar el temps i cost de desenvolupament, (iv) la provisió de nous mètodes de detecció per cobrir els reptes plantejats pels models de fallades proposats, (v) la proposta d'estratègies de mitigació enfocades cap al tractament dels esmentats escenaris d'amenaça i (vi) la introducció d'una metodologia automatitzada de desplegament de diversos mecanismes de tolerància a fallades de forma robusta i sistemàtica. Els resultats de la present tesi constitueixen un conjunt de ferramentes i mètodes per ajudar el dissenyador de sistemes crítics en la seua tasca de desenvolupament de dissenys robustos, validats i a temps adaptats a la seua aplicació.Espinosa García, J. (2016). New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/73146TESISCompendi

The COMPLEX reference framework for HW/SW co-design and power management supporting platform-based design-space exploration

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Hardware Acceleration Using Functional Languages

Cílem této práce je prozkoumat možnosti využití funkcionálního paradigmatu pro hardwarovou akceleraci, konkrétně pro datově paralelní úlohy. Úroveň abstrakce tradičních jazyků pro popis hardwaru, jako VHDL a Verilog, přestáví stačit. Pro popis na algoritmické či behaviorální úrovni se rozmáhají jazyky původně navržené pro vývoj softwaru a modelování, jako C/C++, SystemC nebo MATLAB. Funkcionální jazyky se s těmi imperativními nemůžou měřit v rozšířenosti a oblíbenosti mezi programátory, přesto je předčí v mnoha vlastnostech, např. ve verifikovatelnosti, schopnosti zachytit inherentní paralelismus a v kompaktnosti kódu. Pro akceleraci datově paralelních výpočtů se často používají jednotky FPGA, grafické karty (GPU) a vícejádrové procesory. Praktická část této práce rozšiřuje existující knihovnu Accelerate pro počítání na grafických kartách o výstup do VHDL. Accelerate je možno chápat jako doménově specifický jazyk vestavěný do Haskellu s backendem pro prostředí NVIDIA CUDA. Rozšíření pro vysokoúrovňovou syntézu obvodů ve VHDL představené v této práci používá stejný jazyk a frontend.The aim of this thesis is to research how the functional paradigm can be used for hardware acceleration with an emphasis on data-parallel tasks. The level of abstraction of the traditional hardware description languages, such as VHDL or Verilog, is becoming to low. High-level languages from the domains of software development and modeling, such as C/C++, SystemC or MATLAB, are experiencing a boom for hardware description on the algorithmic or behavioral level. Functional Languages are not so commonly used, but they outperform imperative languages in verification, the ability to capture inherent paralellism and the compactness of code. Data-parallel task are often accelerated on FPGAs, GPUs and multicore processors. In this thesis, we use a library for general-purpose GPU programs called Accelerate and extend it to produce VHDL. Accelerate is a domain-specific language embedded into Haskell with a backend for the NVIDIA CUDA platform. We use the language and its frontend, and create a new backend for high-level synthesis of circuits in VHDL.

When a Patch is Not Enough - HardFails: Software-Exploitable Hardware Bugs

In this paper, we take a deep dive into microarchitectural security from a hardware designer's perspective by reviewing the existing approaches to detect hardware vulnerabilities during the design phase. We show that a protection gap currently exists in practice that leaves chip designs vulnerable to software-based attacks. In particular, existing verification approaches fail to detect specific classes of vulnerabilities, which we call HardFails: these bugs evade detection by current verification techniques while being exploitable from software. We demonstrate such vulnerabilities in real-world SoCs using RISC-V to showcase and analyze concrete instantiations of HardFails. Patching these hardware bugs may not always be possible and can potentially result in a product recall. We base our findings on two extensive case studies: the recent Hack@DAC 2018 hardware security competition, where 54 independent teams of researchers competed world-wide over a period of 12 weeks to catch inserted security bugs in SoC RTL designs, and an in-depth systematic evaluation of state-of-the-art verification approaches. Our findings indicate that even combinations of techniques will miss high-impact bugs due to the large number of modules with complex interdependencies and fundamental limitations of current detection approaches. We also craft a real-world software attack that exploits one of the RTL bugs from Hack@DAC that evaded detection and discuss novel approaches to mitigate the growing problem of cross-layer bugs at design time