Advanced Algorithms for VLSI: Statistical Circuit Optimization and Cyclic Circuit Analysis

This work focuses on two emerging fields in VLSI. The first is use of statistical formulations to tackle one of the classical problems in VLSI design and analysis domains, namely gate sizing. The second is on analysis of nontraditional digital systems in the form of cyclic combinational circuits. In the first part, a new approach for enhancing the process-variation tolerance of digital circuits is described. We extend recent advances in statistical timing analysis into an optimization framework. Our objective is to reduce the performance variance of a technology-mapped circuit where delays across elements are represented by random variables which capture the manufacturing variations. We introduce the notion of statistical critical paths, which account for both means and variances of performance variation. An optimization engine is used to size gates with a goal of reducing the timing variance along the statistical critical paths. Circuit optimization is carried out using a gain-based gate sizing algorithm that terminates when constraints are satisfied or no further improvements can be made. We show optimization results that demonstrate an average of 72% reduction in performance variation at the expense of average 20% increase in design area. In the second part, we tackle the problem of analyzing cyclic circuits. Compiling high-level hardware languages can produce circuits containing combinational cycles that can never be sensitized. Such circuits do have well-defined functional behavior, but wreak havoc with most tools, which assume acyclic combinational logic. As such, some sort of cycle-removal step is usually necessary. We present an algorithm able to quickly and exactly characterize all combinational behavior of a cyclic circuit. It used a combination of explicit and implicit methods to compute input patterns that make the circuit behave combinationally. This can be used to restructure the circuit into an acyclic equivalent, report errors, or as an optimization aid. Experiments show our algorithm runs several orders of magnitude faster than existing ones on real-life cyclic circuits, making it useful in practice

A parallel algorithm for switch-level timing simulation on a hypercube multiprocessor

The parallel approach to speeding up simulation is studied, specifically the simulation of digital LSI MOS circuitry on the Intel iPSC/2 hypercube. The simulation algorithm is based on RSIM, an event driven switch-level simulator that incorporates a linear transistor model for simulating digital MOS circuits. Parallel processing techniques based on the concepts of Virtual Time and rollback are utilized so that portions of the circuit may be simulated on separate processors, in parallel for as large an increase in speed as possible. A partitioning algorithm is also developed in order to subdivide the circuit for parallel processing

Synthesis of all-digital delay lines

© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other worksThe synthesis of delay lines (DLs) is a core task during the generation of matched delays, ring oscillator clocks or delay monitors. The main figure of merit of a DL is the fidelity to track variability. Unfortunately, complex systems have a great diversity of timing paths that exhibit different sensitivities to static and dynamic variations. Designing DLs that capture this diversity is an ardous task. This paper proposes an algorithmic approach for the synthesis of DLs that can be integrated in a conventional design flow. The algorithm uses heuristics to perform a combinatorial search in a vast space of solutions that combine different types of gates and wire lengths. The synthesized DLs are (1) all digital, i.e., built of conventional standard cells, (2) accurate in tracking variability and (3) configurable at runtime. Experimental results with a commercial standard cell library confirm the quality of the DLs that only exhibit delay mismatches of about 1% on average over all PVT corners.Peer ReviewedPostprint (author's final draft

Product assurance technology for custom LSI/VLSI electronics

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

Desynchronization: Synthesis of asynchronous circuits from synchronous specifications

Asynchronous implementation techniques, which measure logic delays at run time and activate registers accordingly, are inherently more robust than their synchronous counterparts, which estimate worst-case delays at design time, and constrain the clock cycle accordingly. De-synchronization is a new paradigm to automate the design of asynchronous circuits from synchronous specifications, thus permitting widespread adoption of asynchronicity, without requiring special design skills or tools. In this paper, we first of all study different protocols for de-synchronization and formally prove their correctness, using techniques originally developed for distributed deployment of synchronous language specifications. We also provide a taxonomy of existing protocols for asynchronous latch controllers, covering in particular the four-phase handshake protocols devised in the literature for micro-pipelines. We then propose a new controller which exhibits provably maximal concurrency, and analyze the performance of desynchronized circuits with respect to the original synchronous optimized implementation. We finally prove the feasibility and effectiveness of our approach, by showing its application to a set of real designs, including a complete implementation of the DLX microprocessor architectur

An Electromigration and Thermal Model of Power Wires for a Priori High-Level Reliability Prediction

In this paper, a simple power-distribution electrothermal model including the interconnect self-heating is used together with a statistical model of average and rms currents of functional blocks and a high-level model of fanout distribution and interconnect wirelength. Following the 2001 SIA roadmap projections, we are able to predict a priori that the minimum width that satisfies the electromigration constraints does not scale like the minimum metal pitch in future technology nodes. As a consequence, the percentage of chip area covered by power lines is expected to increase at the expense of wiring resources unless proper countermeasures are taken. Some possible solutions are proposed in the paper