Improving Reliability and Performance of NAND Flash Based Storage System

High seek and rotation overhead of magnetic hard disk drive (HDD) motivates development of storage devices, which can offer good random performance. As an alternative technology, NAND flash memory demonstrates low power consumption, microsecond-order access latency and good scalability. Thanks to these advantages, NAND flash based solid state disks (SSD) show many promising applications in enterprise servers. With multi-level cell (MLC) technique, the per-bit fabrication cost is reduced and low production cost enables NAND flash memory to extend its application to the consumer electronics. Despite these advantages, limited memory endurance, long data protection latency and write amplification continue to be the major challenges in the designs of NAND flash storage systems. The limited memory endurance and long data protection latency issue derive from memory bit errors. High bit error rate (BER) severely impairs data integrity and reduces memory durance. The limited endurance is a major obstacle to apply NAND flash memory to the application with high reliability requirement. To protect data integrity, hard-decision error correction codes (ECC) such as Bose-Chaudhuri-Hocquenghem (BCH) are employed. However, the hardware cost becomes prohibitively with the increase of BER when the BCH ECC is employed to extend system lifetime. To extend system lifespan without high hardware cost, we has proposed data pattern aware (DPA) error prevention system design. DPA realizes BER reduction by minimizing the occurrence of data patterns vulnerable to high BER with simple linear feedback shift register circuits. Experimental results show that DPA can increase the system lifetime by up to 4× with marginal hardware cost. With the technology node scaling down to 2Xnm, BER increases up to 0.01. Hard-decision ECCs and DPA are no longer applicable to guarantee data integrity due to either prohibitively high hardware cost or high storage overhead. Soft-decision ECC, such as lowdensity parity check (LDPC) code, has been introduced to provide more powerful error correction capability. However, LDPC code demands extra memory sensing operations, directly leading to long read latency. To reduce LDPC code induced read latency without adverse impact on system reliability, we has proposed FlexLevel NAND flash storage system design. The FlexLevel design reduces BER by broadening the noise margin via threshold voltage (Vth) level reduction. Under relatively low BER, no extra sensing level is required and therefore read performance can be improved. To balance Vth level reduction induced capacity loss and the read speedup, the FlexLevel design identifies the data with high LDPC overhead and only performs Vth reduction to these data. Experimental results show that compared with the best existing works, the proposed design achieves up to 11% read speedup with negligible capacity loss. Write amplification is a major cause to performance and endurance degradation of the NAND flash based storage system. In the object-based NAND flash device (ONFD), write amplification partially results from onode partial update and cascading update. Onode partial update only over-writes partial data of a NAND flash page and incurs unnecessary data migration of the un-updated data. Cascading update is update to object metadata in a cascading manner due to object data update or migration. Even through only several bytes in the object metadata are updated, one or more page has to be re-written, significantly degrading write performance. To minimize write operations incurred by onode partial update and cascading update, we has proposed a Data Migration Minimizing (DMM) device design. The DMM device incorporates 1) the multi-level garbage collection technique to minimize the unnecessary data migration of onode partial update and 2) the virtual B+ tree and diff cache to reduce the write operations incurred by cascading update. The experiment results demonstrate that the DMM device can offer up to 20% write reduction compared with the best state-of-art works

Balanced Modulation for Nonvolatile Memories

This paper presents a practical writing/reading scheme in nonvolatile memories, called balanced modulation, for minimizing the asymmetric component of errors. The main idea is to encode data using a balanced error-correcting code. When reading information from a block, it adjusts the reading threshold such that the resulting word is also balanced or approximately balanced. Balanced modulation has suboptimal performance for any cell-level distribution and it can be easily implemented in the current systems of nonvolatile memories. Furthermore, we studied the construction of balanced error-correcting codes, in particular, balanced LDPC codes. It has very efficient encoding and decoding algorithms, and it is more efficient than prior construction of balanced error-correcting codes

A Flexible BCH decoder for Flash Memory Systems using Cascaded BCH codes

NAND ash memories are widely used in consumer electronics, such as tablets, personal computers, smartphones, and gaming systems. However, unlike other standard storage devices, these ash memories suffer from various random errors. In order to address these reliability issues, various error correction codes (ECC) are employed. Bose-Chaudhuri Hocquenghem (BCH) code is the most common ECC used to address the errors in modern ash memories. Because of the limitation of the realization of the BCH codes for more extensive error correction, the modern ash memory devices use Low-density parity-check (LDPC) codes for error correction scheme. The realization of the LDPC decoders have greater complexity than BCH decoders, so these ECC decoders are implemented within the ash memory device. This thesis analyzes the limitation imposed by the state of the art implementation of BCH decoders and proposes a cascaded BCH code to address these limitations. In order to support a variety of ash memory devices, there are three main challenges to be addressed for BCH decoders. First, the latency of the BCH decoders, in the case of no error scenario, should be less than 100us. Second, there should be flexibility in supporting different ECC block size; more precisely, the solution should be able to support 256, 512, 1024, and 2048 bytes of ECC block. Third, there should be flexibility in supporting different bit errors. A recent development with Graphical Processing Units (GPUs) has attracted many researchers to use GPUs for non-graphical implementation. These GPUs are used in many consumer electronics as part of the system on chip (SOC) configuration. In this thesis we studied the limitation imposed by different implementations (VLSI, GPU, and CPU) of BCH decoders, and we propose a cascaded BCH code implemented using a hybrid approach to overcome the limitations of the BCH codes. By splitting the implementation across VLSI and GPUs, we have shown in this thesis that this method can provide flexibility over the block size and the bit error to be corrected

Data Representation for Efficient and Reliable Storage in Flash Memories

Recent years have witnessed a proliferation of flash memories as an emerging storage technology with wide applications in many important areas. Like magnetic recording and optimal recording, flash memories have their own distinct properties and usage environment, which introduce very interesting new challenges for data storage. They include accurate programming without overshooting, error correction, reliable writing data to flash memories under low-voltages and file recovery for flash memories. Solutions to these problems can significantly improve the longevity and performance of the storage systems based on flash memories. In this work, we explore several new data representation techniques for efficient and reliable data storage in flash memories. First, we present a new data representation scheme—rank modulation with multiplicity —to eliminate the overshooting and charge leakage problems for flash memories. Next, we study the Half-Wits — stochastic behavior of writing data to embedded flash memories at voltages lower than recommended by a microcontroller’s specifications—and propose three software- only algorithms that enable reliable storage at low voltages without modifying hard- ware, which can reduce energy consumption by 30%. Then, we address the file erasures recovery problem in flash memories. Instead of only using traditional error- correcting codes, we design a new content-assisted decoder (CAD) to recover text files. The new CAD can be combined with the existing error-correcting codes and the experiment results show CAD outperforms the traditional error-correcting codes