The Synthesis of Cyclic Combinatorial Circuits

To be added

Testability Analysis of Synchronous Sequential Circuits Based On Structural Data

Bounds on test sequence length can be used as a testability measure. We give a procedure to compute the upper bound on test sequence length for an arbitrary sequential circuit. We prove that the bound is exact for a certain class of circuits. Three design rules are specified to yield circuits with lower test sequence bounds

Synthesis and Optimization of Reversible Circuits - A Survey

Reversible logic circuits have been historically motivated by theoretical research in low-power electronics as well as practical improvement of bit-manipulation transforms in cryptography and computer graphics. Recently, reversible circuits have attracted interest as components of quantum algorithms, as well as in photonic and nano-computing technologies where some switching devices offer no signal gain. Research in generating reversible logic distinguishes between circuit synthesis, post-synthesis optimization, and technology mapping. In this survey, we review algorithmic paradigms --- search-based, cycle-based, transformation-based, and BDD-based --- as well as specific algorithms for reversible synthesis, both exact and heuristic. We conclude the survey by outlining key open challenges in synthesis of reversible and quantum logic, as well as most common misconceptions.Comment: 34 pages, 15 figures, 2 table

Two novel evolutionary formulations of the graph coloring problem

We introduce two novel evolutionary formulations of the problem of coloring the nodes of a graph. The first formulation is based on the relationship that exists between a graph's chromatic number and its acyclic orientations. It views such orientations as individuals and evolves them with the aid of evolutionary operators that are very heavily based on the structure of the graph and its acyclic orientations. The second formulation, unlike the first one, does not tackle one graph at a time, but rather aims at evolving a `program' to color all graphs belonging to a class whose members all have the same number of nodes and other common attributes. The heuristics that result from these formulations have been tested on some of the Second DIMACS Implementation Challenge benchmark graphs, and have been found to be competitive when compared to the several other heuristics that have also been tested on those graphs.Comment: To appear in Journal of Combinatorial Optimizatio

Automatic test pattern generation for asynchronous circuits

The testability of integrated circuits becomes worse with transistor dimensions reaching nanometer scales. Testing, the process of ensuring that circuits are fabricated without defects, becomes inevitably part of the design process; a technique called design for test (DFT). Asynchronous circuits have a number of desirable properties making them suitable for the challenges posed by modern technologies, but are severely limited by the unavailability of EDA tools for DFT and automatic test-pattern generation (ATPG). This thesis is motivated towards developing test generation methodologies for asynchronous circuits. In total four methods were developed which are aimed at two different fault models: stuck-at faults at the basic logic gate level and transistor-level faults. The methods were evaluated using a set of benchmark circuits and compared favorably to previously published work. First, ABALLAST is a partial-scan DFT method adapting the well-known BALLAST technique for asynchronous circuits where balanced structures are used to guide the selection of the state-holding elements that will be scanned. The test inputs are automatically provided by a novel test pattern generator, which uses time frame unrolling to deal with the remaining, non-scanned sequential C-elements. The second method, called AGLOB, uses algorithms from strongly-connected components in graph graph theory as a method for finding the optimal position of breaking the loops in the asynchronous circuit and adding scan registers. The corresponding ATPG method converts cyclic circuits into acyclic for which standard tools can provide test patterns. These patterns are then automatically converted for use in the original cyclic circuits. The third method, ASCP, employs a new cycle enumeration method to find the loops present in a circuit. Enumerated cycles are then processed using an efficient set covering heuristic to select the scan elements for the circuit to be tested.Applying these methods to the benchmark circuits shows an improvement in fault coverage compared to previous work, which, for some circuits, was substantial. As no single method consistently outperforms the others in all benchmarks, they are all valuable as a designer’s suite of tools for testing. Moreover, since they are all scan-based, they are compatible and thus can be simultaneously used in different parts of a larger circuit. In the final method, ATRANTE, the main motivation of developing ATPG is supplemented by transistor level test generation. It is developed for asynchronous circuits designed using a State Transition Graph (STG) as their specification. The transistor-level circuit faults are efficiently mapped onto faults that modify the original STG. For each potential STG fault, the ATPG tool provides a sequence of test vectors that expose the difference in behavior to the output ports. The fault coverage obtained was 52-72 % higher than the coverage obtained using the gate level tests. Overall, four different design for test (DFT) methods for automatic test pattern generation (ATPG) for asynchronous circuits at both gate and transistor level were introduced in this thesis. A circuit extraction method for representing the asynchronous circuits at a higher level of abstraction was also implemented. Developing new methods for the test generation of asynchronous circuits in this thesis facilitates the test generation for asynchronous designs using the CAD tools available for testing the synchronous designs. Lessons learned and the research questions raised due to this work will impact the future work to probe the possibilities of developing robust CAD tools for testing the future asynchronous designs

Parallel Implementation of Efficient Search Schemes for the Inference of Cancer Progression Models

The emergence and development of cancer is a consequence of the accumulation over time of genomic mutations involving a specific set of genes, which provides the cancer clones with a functional selective advantage. In this work, we model the order of accumulation of such mutations during the progression, which eventually leads to the disease, by means of probabilistic graphic models, i.e., Bayesian Networks (BNs). We investigate how to perform the task of learning the structure of such BNs, according to experimental evidence, adopting a global optimization meta-heuristics. In particular, in this work we rely on Genetic Algorithms, and to strongly reduce the execution time of the inference -- which can also involve multiple repetitions to collect statistically significant assessments of the data -- we distribute the calculations using both multi-threading and a multi-node architecture. The results show that our approach is characterized by good accuracy and specificity; we also demonstrate its feasibility, thanks to a 84x reduction of the overall execution time with respect to a traditional sequential implementation

Probabilistic Graphical Models on Multi-Core CPUs using Java 8

In this paper, we discuss software design issues related to the development of parallel computational intelligence algorithms on multi-core CPUs, using the new Java 8 functional programming features. In particular, we focus on probabilistic graphical models (PGMs) and present the parallelisation of a collection of algorithms that deal with inference and learning of PGMs from data. Namely, maximum likelihood estimation, importance sampling, and greedy search for solving combinatorial optimisation problems. Through these concrete examples, we tackle the problem of defining efficient data structures for PGMs and parallel processing of same-size batches of data sets using Java 8 features. We also provide straightforward techniques to code parallel algorithms that seamlessly exploit multi-core processors. The experimental analysis, carried out using our open source AMIDST (Analysis of MassIve Data STreams) Java toolbox, shows the merits of the proposed solutions.Comment: Pre-print version of the paper presented in the special issue on Computational Intelligence Software at IEEE Computational Intelligence Magazine journa