From FPGA to ASIC: A RISC-V processor experience

This work document a correct design flow using these tools in the Lagarto RISC- V Processor and the RTL design considerations that must be taken into account, to move from a design for FPGA to design for ASIC

Vesyla-II: An Algorithm Library Development Tool for Synchoros VLSI Design Style

High-level synthesis (HLS) has been researched for decades and is still limited to fast FPGA prototyping and algorithmic RTL generation. A feasible end-to-end system-level synthesis solution has never been rigorously proven. Modularity and composability are the keys to enabling such a system-level synthesis framework that bridges the huge gap between system-level specification and physical level design. It implies that 1) modules in each abstraction level should be physically composable without any irregular glue logic involved and 2) the cost of each module in each abstraction level is accurately predictable. The ultimate reasons that limit how far the conventional HLS can go are precisely that it cannot generate modular designs that are physically composable and cannot accurately predict the cost of its design. In this paper, we propose Vesyla, not as yet another HLS tool, but as a synthesis tool that positions itself in a promising end-to-end synthesis framework and preserving its ability to generate physically composable modular design and to accurately predict its cost metrics. We present in the paper how Vesyla is constructed focusing on the novel platform it targets and the internal data structures that highlights the uniqueness of Vesyla. We also show how Vesyla will be positioned in the end-to-end synchoros synthesis framework called SiLago

E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods

During post-silicon validation, manufactured integrated circuits are extensively tested in actual system environments to detect design bugs. Bug localization involves identification of a bug trace (a sequence of inputs that activates and detects the bug) and a hardware design block where the bug is located. Existing bug localization practices during post-silicon validation are mostly manual and ad hoc, and, hence, extremely expensive and time consuming. This is particularly true for subtle electrical bugs caused by unexpected interactions between a design and its electrical state. We present E-QED, a new approach that automatically localizes electrical bugs during post-silicon validation. Our results on the OpenSPARC T2, an open-source 500-million-transistor multicore chip design, demonstrate the effectiveness and practicality of E-QED: starting with a failed post-silicon test, in a few hours (9 hours on average) we can automatically narrow the location of the bug to (the fan-in logic cone of) a handful of candidate flip-flops (18 flip-flops on average for a design with ~ 1 Million flip-flops) and also obtain the corresponding bug trace. The area impact of E-QED is ~2.5%. In contrast, deter-mining this same information might take weeks (or even months) of mostly manual work using traditional approaches

Recent Trends and Considerations for High Speed Data in Chips and System Interconnects

This paper discusses key issues related to the design of large processing volume chip architectures and high speed system interconnects. Design methodologies and techniques are discussed, where recent trends and considerations are highlighted