3 research outputs found
Intelligent Circuits and Systems
ICICS-2020 is the third conference initiated by the School of Electronics and Electrical Engineering at Lovely Professional University that explored recent innovations of researchers working for the development of smart and green technologies in the fields of Energy, Electronics, Communications, Computers, and Control. ICICS provides innovators to identify new opportunities for the social and economic benefits of society.  This conference bridges the gap between academics and R&D institutions, social visionaries, and experts from all strata of society to present their ongoing research activities and foster research relations between them. It provides opportunities for the exchange of new ideas, applications, and experiences in the field of smart technologies and finding global partners for future collaboration. The ICICS-2020 was conducted in two broad categories, Intelligent Circuits & Intelligent Systems and Emerging Technologies in Electrical Engineering
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Data Analytics in Test: Recognizing and Reducing Subjectivity
Applying data analytics in production test has become a widely adopted industrial practice in recent years. As the complexity of semiconductor devices scales and the amounts of available test data continue to grow, the research direction in this field is forced to shift away from solving specific problems with ad hoc approaches and demands for deeper understanding of the fundamental issues. Two data-driven test applications where this shift is apparent are production yield optimization and defect screening, where the respective underlying data analytics approaches are correlation analysis and outlier analysis. A core issue present in these two approaches stems from the subjectivity that is inherent to data analytics. This dissertation delves into how subjectivity manifests itself and what can be done to reduce it with respect to the two test applications.Outlier analysis is an approach used for identifying anomalies. The main goal of outlier analysis in test is to capture statistically outlying parts with the hope that their abnormal behavior is attributed to some defectivity. During creation of an outlier model, the decisions about outlying behavior in the existing data are made by utilizing known failures and the test engineer's best judgment. In practice, outlier screening methods are simply used for transforming data into an outlier score space. Even if outlier analysis techniques are able to successfully classify a dataset into inliers and outliers, outlier models require thresholds to be decided. A concept called Consistency is introduced to provide an objective data-driven way to evaluate outlier models by utilizing all available data. The key observation underlying this concept is that outlier analysis should be immune to noise introduced by sources of systematic variation.Correlation analysis is a process comprising a search for related variables. The application of production yield optimization involves searching for correlation between the yield and various controllable parameters. The goal of this process is to uncover parameters that, when adjusted, can result in yield improvement. This analytics process is subjective to the perspective of the analyst and the quality of the result is highly dependent on the analyst’s previous experiences. In order to reduce the subjectivity in this application, a process mining methodology is introduced to learn from the experiences of analysts. The key advantage of this methodology is that in addition to having the capability to record and reproduce these analyses, it can also generalize to analytics processes not contained in the learned experiences
Sensors Fault Diagnosis Trends and Applications
Fault diagnosis has always been a concern for industry. In general, diagnosis in complex systems requires the acquisition of information from sensors and the processing and extracting of required features for the classification or identification of faults. Therefore, fault diagnosis of sensors is clearly important as faulty information from a sensor may lead to misleading conclusions about the whole system. As engineering systems grow in size and complexity, it becomes more and more important to diagnose faulty behavior before it can lead to total failure. In the light of above issues, this book is dedicated to trends and applications in modern-sensor fault diagnosis