Noise shaping techniques for analog and time to digital converters using voltage controlled oscillators

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.Includes bibliographical references (p. 175-181).Advanced CMOS processes offer very fast switching speed and high transistor density that can be utilized to implement analog signal processing functions in interesting and unconventional ways, for example by leveraging time as a signal domain. In this context, voltage controlled ring oscillators are circuit elements that are not only very attractive due to their highly digital implementation which takes advantage of scaling, but also due to their ability to amplify or integrate conventional voltage signals into the time domain. In this work, we take advantage of voltage controlled oscillators to implement analog- and time-to-digital converters with first-order quantization and mismatch noise-shaping. To implement a time-to-digital converter (TDC) with noise-shaping, we present a oscillator that is enabled during the measurement of an input, and then disabled in between measurements. By holding the state of the oscillator in between samples, the quantization error is saved and transferred to the following sample, which can be seen as first-order noise-shaping in the frequency domain. In order to achieve good noise shaping performance, we also present key details of a multi-path oscillator topology that is able to reduce the effective delay per stage by a factor of 5 and accurately preserve the quantization error from measurement to measurement. An 11-bit, 50Msps prototype time-to-digital converter (TDC) using a multi-path gated ring oscillator with 6ps of delay per stage demonstrates over 20dB of ist-order noise shaping. At frequencies below 1MHz, the TDC error integrates to 80fsrms for a dynamic range of 95dB with no calibration of differential non-linearity required. The 157x258pm TDC is realized in 0.13ipm CMOS and operates from a 1.5V supply.(cont.) The use of VCO-based quantization within continuous-time (CT) [Epsilon] [Delta] ADC structures is also explored, with a custom prototype in 0.13pm CMOS showing measured performance of 86/72dB SNR/SNDR with 10MHz bandwidth while consuming 40mW from a 1.2V supply and occupying an active area of 640pm X 660pm. A key element of the ADC structure is a 5-bit VCO-based quantizer clocked at 950 MHz which we show achieves first-order noise-shaping of its quantization noise. The quantizer structure allows the second order CT Epsilon] [Delta] ADC topology to achieve third order noise shaping, and direct connection of the VCO-based quantizer to the internal DACs of the ADC provides intrinsic dynamic element matching (DEM) of the DAC elements.by Matthew A. Z. Straayer.Ph.D

Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

Design of a compact and low-power TDC for an array of SiPM's in 110nm CIS technology

Silicon photomultipliers (SiPMs) are meant to substitute photomultiplier tubes in high-energy physics detectors and nuclear medicine. This is because of their -to name a few interesting properties- compactness, lower bias voltage, tolerance to magnetic fields and finer spatial resolution. SiPMs can also be built in CMOS technology. This allows the incorporation of active quenching and recharge schemes at cell level and processing circuitry at pixel level. One of the elements that can lead to finer temporal resolutions is the time-to-digital converter (TDC). In this paper we describe the architecture of a compact TDC to be included at each pixel of an array of SiPMs. It is compact and consumes low power. It is based on a voltage controlled oscillator that generates multiple internal phases that are interpolated to provide time resolution below the time delay of a single gate. Simulation results of a 11b TDC based on a 4-stage VCRO in 110nm CIS technology yield a time resolution of 80.0ps, a DNL of ±0.28 LSB, a INL ±0.52 LSB, and a power consumption of 850μW.Ministerio de Economía y Competitividad TEC2015-66878-C3-1-RJunta de Andalucía TIC 2012-2338Office of Naval Research (USA) N00014141035

Aika-digitaalimuunnin laajakaistaisiin aikapohjaisiin analogia-digitaalimuuntimiin

Modern deeply scaled semiconductor processes make the design of voltage-domain circuits increasingly challenging. On the contrary, the area and power consumption of digital circuits are improving with every new process node. Consequently, digital solutions are designed in place of their purely analog counterparts in applications such as analog-to-digital (A/D) conversion. Time-based analog-to-digital converters (ADC) employ digital-intensive architectures by processing analog quantities in time-domain. The quantization step of the time-based A/D-conversion is carried out by a time-to-digital converter (TDC). A free-running ring oscillator -based TDC design is presented for use in wideband time-based ADCs. The proposed architecture aims to maximize time resolution and full-scale range, and to achieve error resilient conversion performance with minimized power and area consumptions. The time resolution is maximized by employing a high-frequency multipath ring oscillator, and the full-scale range is extended using a high-speed gray counter. The error resilience is achieved by custom sense-amplifier -based sampling flip-flops, gray coded counter and a digital error correction algorithm for counter sampling error correction. The implemented design achieves up to 9-bit effective resolution at 250 MS/s with 4.3 milliwatt power consumption.Modernien puolijohdeteknologioiden skaalautumisen seurauksena jännitetason piirien suunnittelu tulee entistä haasteellisemmaksi. Toisaalta digitaalisten piirirakenteiden pinta-ala sekä tehonkulutus pienenevät prosessikehityksen myötä. Tästä syystä digitaalisia ratkaisuja suunnitellaan vastaavien puhtaasti analogisien rakenteiden tilalle. Analogia-digitaalimuunnos (A/D-muunnos) voidaan toteuttaa jännitetason sijaan aikatasossa käyttämällä aikapohjaisia A/D-muuntimia, jotka ovat rakenteeltaan pääosin digitaalisia. Kvantisointivaihe aikapohjaisessa A/D-muuntimessa toteutetaan aika-digitaalimuuntimella. Työ esittelee vapaasti oskilloivaan silmukkaoskillaattoriin perustuvan aika-digitaalimuuntimen, joka on suunniteltu käytettäväksi laajakaistaisessa aikapohjaisessa A/D-muuntimessa. Esitelty rakenne pyrkii maksimoimaan muuntimen aikaresoluution sekä muunnosalueen, sekä saavuttamaan virhesietoisen muunnostoiminnan minimoidulla tehon sekä pinta-alan kulutuksella. Aikaresoluutio on maksimoitu hyödyntämällä suuritaajuista monipolkuista silmukkaoskillaattoria, ja muunnosalue on maksimoitu nopealla Gray-koodi -laskuripiirillä. Muunnosprosessin virhesietoisuus on saavutettu toteuttamalla näytteistys herkillä kiikkuelementeillä, hyödyntämällä Gray-koodattua laskuria, sekä jälkiprosessoimalla laskurin näytteistetyt arvot virheenkorjausalgoritmilla. Esitelty muunnintoteutus saavuttaa 9 bitin efektiivisen resoluution 250 MS/s näytetaajuudella ja 4.3 milliwatin tehonkulutuksella

차량용 CIS Interface 를 위한 All-Digital Phase-Locked Loop 의 설계 및 분석

학위논문 (석사) -- 서울대학교 대학원 : 공과대학 전기·정보공학부, 2021. 2. 정덕균.This thesis presents design techniques for All-Digital Phase-Locked Loop (ADPLL) assisting the automotive CMOS image sensor (CIS) interface. To target Gear 3 of the automotive physical system, the proposed AD-PLL has a wide operation range, low RMS jitter, and high PVT tolerance characteristics. Detailed analysis of the loop dynamics and the noise analysis of AD-PLL are done by using Matlab and Verilog behavioral modeling simulation before an actual design. Based on that analysis, the optimal DLF gain configurations are yielded, and also, accurate output responses and performance are predictable. The design techniques to reduce the output RMS jitter are discussed thoroughly and utilized for actual implementation. The proposed AD-PLL is fabricated in the 40 nm CMOS process and occupies an effective area of 0.026 mm2. The PLL output clock pulses exhibit an RMS jitter of 827 fs at 2 GHz. The power dissipation is 5.8 mW at 2 GHz, where the overall supply voltage domain is 0.9 V excluding the buffer which is 1.1 V domain.본 논문에서는 자동차 CMOS 이미지 센서 (CIS) 인터페이스를 지원하 는 AD-PLL 을 제안한다. Automotive Physical 시스템의 Gear 3 를 지원하기 위해 제안된 AD-PLL 은 1.5 GHz 에서 3 GHz 의 동작 주파수를 가지며, 낮 은 RMS Jitter 및 PVT 변화에 대한 높은 둔감성을 갖는다. 설계에 앞서서 Matlab 및 Verilog Behavioral Simulation 을 통해 Loop system 의 역학에 대한 자세한 분석 및 AD-PLL 의 Noise 분석을 수행하였고, 이 분석을 기반으로 최적의 DLF gain 과 정확한 출력 응답 및 성능을 예측 할 수 있었다. 또한, 출력의 Phase Noise 와 RMS Jitter 를 줄이기 위한 설계 기법을 자세히 다루고 있으며 이를 실제 구현에 활용했다. 제안된 회로는 40 nm CMOS 공정으로 제작되었으며 Decoupling Cap 을 제외하고 0.026 mm2 의 유효 면적을 차지한다. 측정된 출력 Clock 신호의 RMS Jitter 값은 2 GHz 에서 827 fs 이며, 총 5.8 mW의 Power 를 소비한다. 이 때, 전체적인 공급 전압은 0.9 V 이며, Buffer 의 Power 만이 1.1 V 를 사용하 였다.ABSTRACT I CONTENTS II LIST OF FIGURES IV LIST OF TABLES VII CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 THESIS ORGANIZATION 3 CHAPTER 2 BACKGROUND ON ALL-DIGITAL PLL 4 2.1 OVERVIEW 4 2.2 BUILDING BLOCKS OF AD-PLL 7 2.2.1 TIME-TO-DIGITAL CONVERTER 7 2.2.2 DIGITALLY-CONTROLLED OSCILLATOR 10 2.2.3 DIGITAL LOOP FILTER 13 2.2.4 DELTA-SIGMA MODULATOR 16 2.3 PHASE NOISE ANALYSIS OF AD-PLL 20 2.3.1 BASIC ASSUMPTION OF LINEAR ANALYSIS 20 2.3.2 NOISE SOURCES OF AD-PLL 21 2.3.3 EFFECTS OF LOOP DELAY ON AD-PLL 24 2.3.4 PHASE NOISE ANALYSIS OF PROPOSED AD-PLL 26 CHAPTER 3 DESIGN OF ALL-DIGITAL PLL 28 3.1 DESIGN CONSIDERATION 28 3.2 OVERALL ARCHITECTURE 30 3.3 CIRCUIT IMPLEMENTATION 32 3.3.1 PFD-TDC 32 3.3.2 DCO 37 3.3.3 DIGITAL BLOCK 43 3.3.4 LEVEL SHIFTING BUFFER AND DIVIDER 45 CHAPTER 4 MEASUREMENT AND SIMULATION RESULTS 52 4.1 DIE PHOTOMICROGRAPH 52 4.2 MEASUREMENT SETUP 54 4.3 TRANSIENT ANALYSIS 57 4.4 PHASE NOISE AND SPUR PERFORMANCE 59 4.4.1 FREE-RUNNING DCO 59 4.4.2 PLL PERFORMANCE 61 4.5 PERFORMANCE SUMMARY 65 CHAPTER 5 CONCLUSION 67 BIBLIOGRAPHY 68 초 록 72Maste

Time-to-digital converters and histogram builders in SPAD arrays for pulsed-LiDAR

Light Detection and Ranging (LiDAR) is a 3D imaging technique widely used in many applications such as augmented reality, automotive, machine vision, spacecraft navigation and landing. Pulsed-LiDAR is one of the most diffused LiDAR techniques which relies on the measurement of the round-trip travel time of an optical pulse back-scattered from a distant target. Besides the light source and the detector, Time-to-Digital Converters (TDCs) are fundamental components in pulsed-LiDAR systems, since they allow to measure the back-scattered photon arrival times and their performance directly impact on LiDAR system requirements (i.e., range, precision, and measurements rate). In this work, we present a review of recent TDC architectures suitable to be integrated in SPAD-based CMOS arrays and a review of data processing solutions to derive the TOF information. Furthermore, main TDC parameters and processing techniques are described and analyzed considering pulsed-LiDAR requirements

Architectural Alternatives to Implement High-Performance Delta-Sigma Modulators

RÉSUMÉ Le besoin d’appareils portatifs, de téléphones intelligents et de systèmes microélectroniques implantables médicaux s’accroît remarquablement. Cependant, l’optimisation de l’alimentation de tous ces appareils électroniques portables est l’un des principaux défis en raison du manque de piles à grande capacité utilisées pour les alimenter. C’est un fait bien établi que le convertisseur analogique-numérique (CAN) est l’un des blocs les plus critiques de ces appareils et qu’il doit convertir efficacement les signaux analogiques au monde numérique pour effectuer un post-traitement tel que l’extraction de caractéristiques. Parmi les différents types de CAN, les modulateurs Delta Sigma (��M) ont été utilisés dans ces appareils en raison des fonctionnalités alléchantes qu’ils offrent. En raison du suréchantillonnage et pour éloigner le bruit de la bande d’intérêt, un CAN haute résolution peut être obtenu avec les architectures ��. Il offre également un compromis entre la fréquence d’échantillonnage et la résolution, tout en offrant une architecture programmable pour réaliser un CAN flexible. Ces CAN peuvent être implémentés avec des blocs analogiques de faible précision. De plus, ils peuvent être efficacement optimisés au niveau de l’architecture et circuits correspondants. Cette dernière caractéristique a été une motivation pour proposer différentes architectures au fil des ans. Cette thèse contribue à ce sujet en explorant de nouvelles architectures pour optimiser la structure ��M en termes de résolution, de consommation d’énergie et de surface de silicium. Des soucis particuliers doivent également être pris en compte pour faciliter la mise en œuvre du ��M. D’autre part, les nouveaux procédés CMOS de conception et fabrication apportent des améliorations remarquables en termes de vitesse, de taille et de consommation d’énergie lors de la mise en œuvre de circuits numériques. Une telle mise à l’échelle agressive des procédés, rend la conception de blocs analogiques tel que un amplificateur de transconductance opérationnel (OTA), difficile. Par conséquent, des soins spéciaux sont également pris en compte dans cette thèse pour surmonter les problèmes énumérés. Ayant mentionné ci-dessus que cette thèse est principalement composée de deux parties principales. La première concerne les nouvelles architectures implémentées en mode de tension et la seconde partie contient une nouvelle architecture réalisée en mode hybride tension et temps.----------ABSTRACT The need for hand-held devices, smart-phones and medical implantable microelectronic sys-tems, is remarkably growing up. However, keeping all these electronic devices power optimized is one of the main challenges due to the lack of long life-time batteries utilized to power them up. It is a well-established fact that analog-to-digital converter (ADC) is one of the most critical building blocks of such devices and it needs to efficiently convert analog signals to the digital world to perform post processing such as channelizing, feature extraction, etc. Among various type of ADCs, Delta Sigma Modulators (��Ms) have been widely used in those devices due to the tempting features they offer. In fact, due to oversampling and noise-shaping technique a high-resolution ADC can be achieved with �� architectures. It also offers a compromise between sampling frequency and resolution while providing a highly-programmable approach to realize an ADC. Moreover, such ADCs can be implemented with low-precision analog blocks. Last but not the least, they are capable of being effectively power optimized at both architectural and circuit levels. The latter has been a motivation to proposed different architectures over the years.This thesis contributes to this topic by exploring new architectures to effectively optimize the ��M structure in terms of resolution, power consumption and chip area. Special cares must also be taken into account to ease the implementation of the ��M. On the other hand, advanced node CMOS processes bring remarkable improvements in terms of speed, size and power consumption while implementing digital circuits. Such an aggressive process scaling, however, make the design of analog blocks, e.g. operational transconductance amplifiers (OTAs), cumbersome. Therefore, special cares are also taken into account in this thesis to overcome the mentioned issues. Having had above mentioned discussion, this thesis is mainly split in two main categories. First category addresses new architectures implemented in a pure voltage domain and the second category contains new architecture realized in a hybrid voltage and time domain. In doing so, the thesis first focuses on a switched-capacitor implementation of a ��M while presenting an architectural solution to overcome the limitations of the previous approaches. This limitations include a power hungry adder in a conventional feed-forward topology as well as power hungry OTAs

Fast Digital Calibration of Static Phase Offset in Charge-Pump Phase-Locked Loops

Mismatches within the charge pump (CP) deteriorate the spectral perfor- mance of the CP-PLL output signal resulting in a static phase offset. Classical analog approaches to reducing this offset consume large silicon area and increase gate leak- age mismatch. For ultra-deep-submicron (UDSM) technologies where gate leakage in- creases dramatically, reduction of static phase offset through digital calibration becomes more favorable. This paper presents a novel technique which digitally calibrates static phase offset down to < 10 ps for a PLL operating at 4.8 GHz, designed using a 1V 90nm CMOS process. Calibration is completed in only 2 steps, making the proposed technique suitable for systems requiring frequent switching such as frequency hopping systems commonly used in today’s wireless communication systems