Hardware Design of Digital System with Remote-DiagnosticCapability

In this paper, a hardware design of digital systems with remote-diagnostic capability is presented. We consider a method for testing a system T(l) on a module basis with a remotely installed systems T(2). In the testing mode, we set up a system (T(l)-m,m') such that a module m of T(l) is replaced by an adapter A(1) connected to other adapter A(2) through a telephone line and the corresponding module m' of T(2) is connected to A(2). If the system (T(l)-m,m') can simulate T(1) in the absence of any faluts, then it can test m' under a self test program. The main subject of this paper is to study the conditions of the system to be testable in the above sense. At first, the remote diagnostic network based on the system in this paper, restrictions to the system configuration required to perform such a diagnosis and the operation of the diagnostic system are described. The second, the module structure to make above simulation possible is considered, representing the system configuration graphically. Finally, an example of the adapter is shown and the time consumed to diagnose is discussed. One of our results is that a sufficiently large class of synchronous digital systems with few minor conventions is testable

Design Space Exploration of Neural Network Activation Function Circuits

The widespread application of artificial neural networks has prompted researchers to experiment with FPGA and customized ASIC designs to speed up their computation. These implementation efforts have generally focused on weight multiplication and signal summation operations, and less on activation functions used in these applications. Yet, efficient hardware implementations of nonlinear activation functions like Exponential Linear Units (ELU), Scaled Exponential Linear Units (SELU), and Hyperbolic Tangent (tanh), are central to designing effective neural network accelerators, since these functions require lots of resources. In this paper, we explore efficient hardware implementations of activation functions using purely combinational circuits, with a focus on two widely used nonlinear activation functions, i.e., SELU and tanh. Our experiments demonstrate that neural networks are generally insensitive to the precision of the activation function. The results also prove that the proposed combinational circuit-based approach is very efficient in terms of speed and area, with negligible accuracy loss on the MNIST, CIFAR-10 and IMAGENET benchmarks. Synopsys Design Compiler synthesis results show that circuit designs for tanh and SELU can save between 3.13-7.69 and 4.45-8:45 area compared to the LUT/memory-based implementations, and can operate at 5.14GHz and 4.52GHz using the 28nm SVT library, respectively. The implementation is available at: https://github.com/ThomasMrY/ActivationFunctionDemo.Comment: 5 pages, 5 figures, 16 conferenc

On testing VLSI chips for the big Viterbi decoder

A general technique that can be used in testing very large scale integrated (VLSI) chips for the Big Viterbi Decoder (BVD) system is described. The test technique is divided into functional testing and fault-coverage testing. The purpose of functional testing is to verify that the design works functionally. Functional test vectors are converted from outputs of software simulations which simulate the BVD functionally. Fault-coverage testing is used to detect and, in some cases, to locate faulty components caused by bad fabrication. This type of testing is useful in screening out bad chips. Finally, design for testability, which is included in the BVD VLSI chip design, is described in considerable detail. Both the observability and controllability of a VLSI chip are greatly enhanced by including the design for the testability feature

Automated Synthesis of SEU Tolerant Architectures from OO Descriptions

SEU faults are a well-known problem in aerospace environment but recently their relevance grew up also at ground level in commodity applications coupled, in this frame, with strong economic constraints in terms of costs reduction. On the other hand, latest hardware description languages and synthesis tools allow reducing the boundary between software and hardware domains making the high-level descriptions of hardware components very similar to software programs. Moving from these considerations, the present paper analyses the possibility of reusing Software Implemented Hardware Fault Tolerance (SIHFT) techniques, typically exploited in micro-processor based systems, to design SEU tolerant architectures. The main characteristics of SIHFT techniques have been examined as well as how they have to be modified to be compatible with the synthesis flow. A complete environment is provided to automate the design instrumentation using the proposed techniques, and to perform fault injection experiments both at behavioural and gate level. Preliminary results presented in this paper show the effectiveness of the approach in terms of reliability improvement and reduced design effort

LSI/VLSI design for testability analysis and general approach

The incorporation of testability characteristics into large scale digital design is not only necessary for, but also pertinent to effective device testing and enhancement of device reliability. There are at least three major DFT techniques, namely, the self checking, the LSSD, and the partitioning techniques, each of which can be incorporated into a logic design to achieve a specific set of testability and reliability requirements. Detailed analysis of the design theory, implementation, fault coverage, hardware requirements, application limitations, etc., of each of these techniques are also presented