2,912 research outputs found
Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
A simulation study is described which predicts the susceptibility of an advanced control system to electrical transients resulting in logic errors, latched errors, error propagation, and digital upset. The system is based on a custom-designed microprocessor and it incorporates fault-tolerant techniques. The system under test and the method to perform the transient injection experiment are described. Results for 2100 transient injections are analyzed and classified according to charge level, type of error, and location of injection
Quantitative evaluation of Pandora Temporal Fault Trees via Petri Nets
© 2015, IFAC (International Federation of Automatic Control) Hosting by Elsevier Ltd. All rights reserved. Using classical combinatorial fault trees, analysts are able to assess the effects of combinations of failures on system behaviour but are unable to capture sequence dependent dynamic behaviour. Pandora introduces temporal gates and temporal laws to fault trees to allow sequence-dependent dynamic analysis of events. Pandora can be easily integrated in model-based design and analysis techniques; however, the combinatorial quantification techniques used to solve classical fault trees cannot be applied to temporal fault trees. Temporal fault trees capture state and therefore require a state space solution for quantification of probability. In this paper, we identify Petri Nets as a possible framework for quantifying temporal trees. We describe how Pandora fault trees can be mapped to Petri Nets for dynamic dependability analysis and demonstrate the process on a fault tolerant fuel distribution system model
Model-based dependability analysis : state-of-the-art, challenges and future outlook
Abstract: Over the past two decades, the study of model-based dependability analysis has gathered significant research interest. Different approaches have been developed to automate and address various limitations of classical dependability techniques to contend with the increasing complexity and challenges of modern safety-critical system. Two leading paradigms have emerged, one which constructs predictive system failure models from component failure models compositionally using the topology of the system. The other utilizes design models - typically state automata - to explore system behaviour through fault injection. This paper reviews a number of prominent techniques under these two paradigms, and provides an insight into their working mechanism, applicability, strengths and challenges, as well as recent developments within these fields. We also discuss the emerging trends on integrated approaches and advanced analysis capabilities. Lastly, we outline the future outlook for model-based dependability analysis
Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits
This paper presents a novel method to identify and insert redundant logic
into a combinational circuit to improve its fault tolerance without having to
replicate the entire circuit as is the case with conventional redundancy
techniques. In this context, it is discussed how to estimate the fault masking
capability of a combinational circuit using the truth-cum-fault enumeration
table, and then it is shown how to identify the logic that can introduced to
add redundancy into the original circuit without affecting its native
functionality and with the aim of improving its fault tolerance though this
would involve some trade-off in the design metrics. However, care should be
taken while introducing redundant logic since redundant logic insertion may
give rise to new internal nodes and faults on those may impact the fault
tolerance of the resulting circuit. The combinational circuit that is
considered and its redundant counterparts are all implemented in semi-custom
design style using a 32/28nm CMOS digital cell library and their respective
design metrics and fault tolerances are compared
Study of Single Event Transient Error Mitigation
Single Event Transient (SET) errors in ground-level electronic devices are a growing concern in the radiation hardening field. However, effective SET mitigation technologies which satisfy ground-level demands such as generic, flexible, efficient, and fast, are limited. The classic Triple Modular Redundancy (TMR) method is the most well-known and popular technique in space and nuclear environment. But it leads to more than 200% area and power overheads, which is too costly to implement in ground-level applications. Meanwhile, the coding technique is extensively utilized to inhibit upset errors in storage cells, but the irregularity of combinatorial logics limits its use in SET mitigation. Therefore, SET mitigation techniques suitable for ground-level applications need to be addressed.
Aware of the demands for SET mitigation techniques in ground-level applications, this thesis proposes two novel approaches based on the redundant wire and approximate logic techniques.
The Redundant Wire is a SET mitigation technique. By selectively adding redundant wire connections, the technique can prohibit targeted transient faults from propagating on the fly. This thesis proposes a set of signature-based evaluation equations to efficiently estimate the protecting effect provided by each redundant wire candidates. Based on the estimated results, a greedy algorithm is used to insert the best candidate repeatedly. Simulation results substantiate that the evaluation equations can achieve up to 98% accuracy on average. Regarding protecting effects, the technique can mask 18.4% of the faults with a 4.3% area, 4.4% power, and 5.4% delay overhead on average. Overall, the quality of protecting results obtained are 2.8 times better than the previous work. Additionally, the impact of synthesis constraints and signature length are discussed.
Approximate Logic is a partial TMR technique offering a trade-off between fault coverage and area overheads. The approximate logic consists of an under-approximate logic and an over-approximate logic. The under-approximate logic is a subset of the original min-terms and the over-approximate logic is a subset of the original max-terms. This thesis proposes a new algorithm for generating the two approximate logics. Through the generating process, the algorithm considers the intrinsic failure probabilities of each gate and utilizes a confidence interval estimate equation to minimize required computations. The technique is applied to two fault models, Stuck-at and SET, and the separate results are compared and discussed. The results show that the technique can reduce the error 75% with an area penalty of 46% on some circuits. The delay overheads of this technique are always two additional layers of logic.
The two proposed SET mitigation techniques are both applicable to generic combinatorial logics and with high flexibility. The simulation shows promising SET mitigation ability. The proposed mitigation techniques provide designers more choices in developing reliable combinatorial logic in ground-level applications
Integrating model checking with HiP-HOPS in model-based safety analysis
The ability to perform an effective and robust safety analysis on the design of modern safety–critical systems is crucial. Model-based safety analysis (MBSA) has been introduced in recent years to support the assessment of complex system design by focusing on the system model as the central artefact, and by automating the synthesis and analysis of failure-extended models. Model checking and failure logic synthesis and analysis (FLSA) are two prominent MBSA paradigms. Extensive research has placed emphasis on the development of these techniques, but discussion on their integration remains limited. In this paper, we propose a technique in which model checking and Hierarchically Performed Hazard Origin and Propagation Studies (HiP-HOPS) – an advanced FLSA technique – can be applied synergistically with benefit for the MBSA process. The application of the technique is illustrated through an example of a brake-by-wire system
inSense: A Variation and Fault Tolerant Architecture for Nanoscale Devices
Transistor technology scaling has been the driving force in improving the size, speed, and power consumption of digital systems. As devices approach atomic size, however, their reliability and performance are increasingly compromised due to reduced noise margins, difficulties in fabrication, and emergent nano-scale phenomena. Scaled CMOS devices, in particular, suffer from process variations such as random dopant fluctuation (RDF) and line edge roughness (LER), transistor degradation mechanisms such as negative-bias temperature instability (NBTI) and hot-carrier injection (HCI), and increased sensitivity to single event upsets (SEUs). Consequently, future devices may exhibit reduced performance, diminished lifetimes, and poor reliability.
This research proposes a variation and fault tolerant architecture, the inSense architecture, as a circuit-level solution to the problems induced by the aforementioned phenomena. The inSense architecture entails augmenting circuits with introspective and sensory capabilities which are able to dynamically detect and compensate for process variations, transistor degradation, and soft errors. This approach creates ``smart\u27\u27 circuits able to function despite the use of unreliable devices and is applicable to current CMOS technology as well as next-generation devices using new materials and structures. Furthermore, this work presents an automated prototype implementation of the inSense architecture targeted to CMOS devices and is evaluated via implementation in ISCAS \u2785 benchmark circuits. The automated prototype implementation is functionally verified and characterized: it is found that error detection capability (with error windows from 30-400ps) can be added for less than 2\% area overhead for circuits of non-trivial complexity. Single event transient (SET) detection capability (configurable with target set-points) is found to be functional, although it generally tracks the standard DMR implementation with respect to overheads
Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits
The Functional Failure Rate analysis of today's complex circuits is a
difficult task and requires a significant investment in terms of human efforts,
processing resources and tool licenses. Thereby, de-rating or vulnerability
factors are a major instrument of failure analysis efforts. Usually
computationally intensive fault-injection simulation campaigns are required to
obtain a fine-grained reliability metrics for the functional level. Therefore,
the use of machine learning algorithms to assist this procedure and thus,
optimising and enhancing fault injection efforts, is investigated in this
paper. Specifically, machine learning models are used to predict accurate
per-instance Functional De-Rating data for the full list of circuit instances,
an objective that is difficult to reach using classical methods. The described
methodology uses a set of per-instance features, extracted through an analysis
approach, combining static elements (cell properties, circuit structure,
synthesis attributes) and dynamic elements (signal activity). Reference data is
obtained through first-principles fault simulation approaches. One part of this
reference dataset is used to train the machine learning model and the remaining
is used to validate and benchmark the accuracy of the trained tool. The
presented methodology is applied on a practical example and various machine
learning models are evaluated and compared
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