933 research outputs found
Design of variation-tolerant synchronizers for multiple clock and voltage domains
PhD ThesisParametric variability increasingly affects the performance of electronic circuits as
the fabrication technology has reached the level of 32nm and beyond. These
parameters may include transistor Process parameters (such as threshold
voltage), supply Voltage and Temperature (PVT), all of which could have a
significant impact on the speed and power consumption of the circuit, particularly
if the variations exceed the design margins. As systems are designed with more
asynchronous protocols, there is a need for highly robust synchronizers and
arbiters. These components are often used as interfaces between communication
links of different timing domains as well as sampling devices for asynchronous
inputs coming from external components. These applications have created a need
for new robust designs of synchronizers and arbiters that can tolerate process,
voltage and temperature variations.
The aim of this study was to investigate how synchronizers and arbiters should be
designed to tolerate parametric variations. All investigations focused mainly on
circuit-level and transistor level designs and were modeled and simulated in the
UMC90nm CMOS technology process. Analog simulations were used to measure
timing parameters and power consumption along with a “Monte Carlo” statistical
analysis to account for process variations.
Two main components of synchronizers and arbiters were primarily investigated:
flip-flop and mutual-exclusion element (MUTEX). Both components can violate the
input timing conditions, setup and hold window times, which could cause
metastability inside their bistable elements and possibly end in failures. The
mean-time between failures is an important reliability feature of any synchronizer
delay through the synchronizer.
The MUTEX study focused on the classical circuit, in addition to a number of
tolerance, based on increasing internal gain by adding current sources, reducing
the capacitive loading, boosting the transconductance of the latch, compensating
the existing Miller capacitance, and adding asymmetry to maneuver the metastable
point. The results showed that some circuits had little or almost no improvements,
while five techniques showed significant improvements by reducing τ and
maintaining high tolerance.
Three design approaches are proposed to provide variation-tolerant
synchronizers. wagging synchronizer proposed to First, the is significantly
increase reliability over that of the conventional two flip-flop synchronizer. The
robustness of the wagging technique can be enhanced by using robust τ latches or
adding one more cycle of synchronization. The second approach is the
Metastability Auto-Detection and Correction (MADAC) latch which relies on swiftly
detecting a metastable event and correcting it by enforcing the previously stored
logic value. This technique significantly reduces the resolution time down from
uncertain
synchronization technique is proposed to transfer signals between Multiple-
Voltage Multiple-Clock Domains (MVD/MCD) that do not require conventional
level-shifters between the domains or multiple power supplies within each
domain. This interface circuit uses a synchronous set and feedback reset protocol
which provides level-shifting and synchronization of all signals between the
domains, from a wide range of voltage-supplies and clock frequencies.
Overall, synchronizer circuits can tolerate variations to a greater extent by
employing the wagging technique or using a MADAC latch, while MUTEX tolerance
can suffice with small circuit modifications. Communication between MVD/MCD
can be achieved by an asynchronous handshake
without a need for adding level-shifters.The Saudi Arabian Embassy in London,
Umm Al-Qura University, Saudi Arabi
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Network-on-Chip Synchronization
Technology scaling has enabled the number of cores within a System on Chip (SoC) to increase significantly. Globally Asynchronous Locally Synchronous (GALS) systems using Dynamic Voltage and Frequency Scaling (DVFS) operate each of these cores on distinct and dynamic clock domains. The main communication method between these cores is increasingly more likely to be a Network-on-Chip (NoC). Typically, the interfaces between these clock domains experience multi-cycle synchronization latencies due to their use of “brute-force” synchronizers. This dissertation aims to improve the performance of NoCs and thereby SoCs as a whole by reducing this synchronization latency.
First, a survey of NoC improvement techniques is presented. One such improvement technique: a multi-layer NoC, has been successfully simulated. Given how one of the most commonly used techniques is DVFS, a thorough analysis and simulation of brute-force synchronizer circuits in both current and future process technologies is presented. Unfortunately, a multi-cycle latency is unavoidable when using brute-force synchronizers, so predictive synchronizers which require only a single cycle of latency have been proposed.
To demonstrate the impact of these predictive synchronizer circuits at a high level, multi-core system simulations incorporating these circuits have been completed. Multiple forms of GALS NoC configurations have been simulated, including multi-synchronous, NoC-synchronous, and single-synchronizer. Speedup on the SPLASH benchmark suite was measured to directly quantify the performance benefit of predictive synchronizers in a full system. Additionally, Mean Time Between Failures (MTBF) has been calculated for each NoC synchronizer configuration to determine the reliability benefit possible when using predictive synchronizers
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