Phase Locked Loop Test Methodology

Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

Hardware simulation of KU-band spacecraft receiver and bit synchronizer, phase 2, volume 1

The acquisition behavior of the PN subsystem of an automatically acquiring spacecraft receiver was studied. A symbol synchronizer subsystem was constructed and integrated into the composite simulation of the receiver. The overall performance of the receiver when subjected to anomalies such as signal fades was evaluated. Potential problems associated with PN/carrier sweep interactions were investigated

통계적 주파수 검출기 기반 기준 주파수를 사용하지 않는 클록 및 데이터 복원 회로의 설계 방법론

학위논문(박사) -- 서울대학교대학원 : 공과대학 전기·정보공학부, 2022. 8. 정덕균.In this thesis, a design of a high-speed, power-efficient, wide-range clock and data recovery (CDR) without a reference clock is proposed. A frequency acquisition scheme using a stochastic frequency detector (SFD) based on the Alexander phase detector (PD) is utilized for the referenceless operation. Pat-tern histogram analysis is presented to analyze the frequency acquisition behavior of the SFD and verified by simulation. Based on the information obtained by pattern histogram analysis, SFD using autocovariance is proposed. With a direct-proportional path and a digital integral path, the proposed referenceless CDR achieves frequency lock at all measurable conditions, and the measured frequency acquisition time is within 7μs. The prototype chip has been fabricated in a 40-nm CMOS process and occupies an active area of 0.032 mm2. The proposed referenceless CDR achieves the BER of less than 10-12 at 32 Gb/s and exhibits an energy efficiency of 1.15 pJ/b at 32 Gb/s with a 1.0 V supply.본 논문은 기준 클럭이 없는 고속, 저전력, 광대역으로 동작하는 클럭 및 데이터 복원회로의 설계를 제안한다. 기준 클럭이 없는 동작을 위해서 알렉산더 위상 검출기에 기반한 통계적 주파수 검출기를 사용하는 주파수 획득 방식이 사용된다. 통계적 주파수 검출기의 주파수 추적 양상을 분석하기 위해 패턴 히스토그램 분석 방법론을 제시하였고 시뮬레이션을 통해 검증하였다. 패턴 히스토그램 분석을 통해 얻은 정보를 바탕으로 자기공분산을 이용한 통계적 주파수 검출기를 제안한다. 직접 비례 경로와 디지털 적분 경로를 통해 제안된 기준 클럭이 없는 클럭 및 데이터 복원회로는 모든 측정 가능한 조건에서 주파수 잠금을 달성하는 데 성공하였고, 모든 경우에서 측정된 주파수 추적 시간은 7μs 이내이다. 40-nm CMOS 공정을 이용하여 만들어진 칩은 0.032 mm2의 면적을 차지한다. 제안하는 클럭 및 데이터 복원회로는 32 Gb/s의 속도에서 비트에러율 10-12 이하로 동작하였고, 에너지 효율은 32Gb/s의 속도에서 1.0V 공급전압을 사용하여 1.15 pJ/b을 달성하였다.CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 THESIS ORGANIZATION 13 CHAPTER 2 BACKGROUNDS 14 2.1 CLOCKING ARCHITECTURES IN SERIAL LINK INTERFACE 14 2.2 GENERAL CONSIDERATIONS FOR CLOCK AND DATA RECOVERY 24 2.2.1 OVERVIEW 24 2.2.2 JITTER 26 2.2.3 CDR JITTER CHARACTERISTICS 33 2.3 CDR ARCHITECTURES 39 2.3.1 PLL-BASED CDR – WITH EXTERNAL REFERENCE CLOCK 39 2.3.2 DLL/PI-BASED CDR 44 2.3.3 PLL-BASED CDR – WITHOUT EXTERNAL REFERENCE CLOCK 47 2.4 FREQUENCY ACQUISITION SCHEME 50 2.4.1 TYPICAL FREQUENCY DETECTORS 50 2.4.1.1 DIGITAL QUADRICORRELATOR FREQUENCY DETECTOR 50 2.4.1.2 ROTATIONAL FREQUENCY DETECTOR 54 2.4.2 PRIOR WORKS 56 CHAPTER 3 DESIGN OF THE REFERENCELESS CDR USING SFD 58 3.1 OVERVIEW 58 3.2 PROPOSED FREQUENCY DETECTOR 62 3.2.1 MOTIVATION 62 3.2.2 PATTERN HISTOGRAM ANALYSIS 68 3.2.3 INTRODUCTION OF AUTOCOVARIANCE TO STOCHASTIC FREQUENCY DETECTOR 75 3.3 CIRCUIT IMPLEMENTATION 83 3.3.1 IMPLEMENTATION OF THE PROPOSED REFERENCELESS CDR 83 3.3.2 CONTINUOUS-TIME LINEAR EQUALIZER (CTLE) 85 3.3.3 DIGITALLY-CONTROLLED OSCILLATOR (DCO) 87 3.4 MEASUREMENT RESULTS 89 CHAPTER 4 CONCLUSION 99 APPENDIX A DETAILED FREQUENCY ACQUISITION WAVEFORMS OF THE PROPOSED SFD 100 BIBLIOGRAPHY 108 초 록 122박

고속 DRAM 인터페이스를 위한 전압 및 온도에 둔감한 클록 패스와 위상 오류 교정기 설계

학위논문 (박사) -- 서울대학교 대학원 : 공과대학 전기·정보공학부, 2021. 2. 정덕균.To cope with problems caused by the high-speed operation of the dynamic random access memory (DRAM) interface, several approaches are proposed that are focused on the clock path of the DRAM. Two delay-locked loop (DLL) based schemes, a forwarded-clock (FC) receiver (RX) with self-tracking loop and a quadrature error corrector, are proposed. Moreover, an open-loop based scheme is presented for drift compensation in the clock distribution. The open-loop scheme consumes less power consumption and reduces design complexity. The FC RX uses DLLs to compensate for voltage and temperature (VT) drift in unmatched memory interfaces. The self-tracking loop consists of two-stage cascaded DLLs to operate in a DRAM environment. With the write training and the proposed DLL, the timing relationship between the data and the sampling clock is always optimal. The proposed scheme compensates for delay drift without relying on data transitions or re-training. The proposed FC RX is fabricated in 65-nm CMOS process and has an active area containing 4 data lanes of 0.0329 mm2. After the write training is completed at the supply voltage of 1 V, the measured timing margin remains larger than 0.31-unit interval (UI) when the supply voltage drifts in the range of 0.94 V and 1.06 V from the training voltage, 1 V. At the data rate of 6.4 Gb/s, the proposed FC RX achieves an energy efficiency of 0.45 pJ/bit. Contrary to the aforementioned scheme, an open-loop-based voltage drift compensation method is proposed to minimize power consumption and occupied area. The overall clock distribution is composed of a current mode logic (CML) path and a CMOS path. In the proposed scheme, the architecture of the CML-to-CMOS converter (C2C) and the inverter is changed to compensate for supply voltage drift. The bias generator provides bias voltages to the C2C and inverters according to supply voltage for delay adjustment. The proposed clock tree is fabricated in 40 nm CMOS process and the active area is 0.004 mm2. When the supply voltage is modulated by a sinusoidal wave with 1 MHz, 100 mV peak-to-peak swing from the center of 1.1 V, applying the proposed scheme reduces the measured root-mean-square (RMS) jitter from 3.77 psRMS to 1.61 psRMS. At 6 GHz output clock, the power consumption of the proposed scheme is 11.02 mW. A DLL-based quadrature error corrector (QEC) with a wide correction range is proposed for the DRAM whose clocks are distributed over several millimeters. The quadrature error is corrected by adjusting delay lines using information from the phase error detector. The proposed error correction method minimizes increased jitter due to phase error correction by setting at least one of the delay lines in the quadrature clock path to the minimum delay. In addition, the asynchronous calibration on-off scheme reduces power consumption after calibration is complete. The proposed QEC is fabricated in 40 nm CMOS process and has an active area of 0.048 mm2. The proposed QEC exhibits a wide correctable error range of 101.6 ps and the remaining phase errors are less than 2.18° from 0.8 GHz to 2.3 GHz clock. At 2.3 GHz, the QEC contributes 0.53 psRMS jitter. Also, at 2.3 GHz, the power consumption is reduced from 8.89 mW to 3.39 mW when the calibration is off.본 논문에서는 동적 랜덤 액세스 메모리 (DRAM)의 속도가 증가함에 따라 클록 패스에서 발생할 수 있는 문제에 대처하기 위한 세 가지 회로들을 제안하였다. 제안한 회로들 중 두 방식들은 지연동기루프 (delay-locked loop) 방식을 사용하였고 나머지 한 방식은 면적과 전력 소모를 줄이기 위해 오픈 루프 방식을 사용하였다. DRAM의 비정합 수신기 구조에서 데이터 패스와 클록 패스 간의 지연 불일치로 인해 전압 및 온도 변화에 따라 셋업 타임 및 홀드 타임이 줄어드는 문제를 해결하기 위해 지연동기루프를 사용하였다. 제안한 지연동기루프 회로는 DRAM 환경에서 동작하도록 두 개의 지연동기루프로 나누었다. 또한 초기 쓰기 훈련을 통해 데이터와 클록을 타이밍 마진 관점에서 최적의 위치에 둘 수 있다. 따라서 제안하는 방식은 데이터 천이 정보가 필요하지 않다. 65-nm CMOS 공정을 이용하여 만들어진 칩은 6.4 Gb/s에서 0.45 pJ/bit의 에너지 효율을 가진다. 또한 1 V에서 쓰기 훈련 및 지연동기루프를 고정시키고 0.94 V에서 1.06 V까지 공급 전압이 바뀌었을 때 타이밍 마진은 0.31 UI보다 큰 값을 유지하였다. 다음으로 제안하는 회로는 클록 분포 트리에서 전압 변화로 인해 클록 패스의 지연이 달라지는 것을 앞서 제시한 방식과 달리 오픈 루프 방식으로 보상하였다. 기존 클록 패스의 인버터와 CML-to-CMOS 변환기의 구조를 변경하여 바이어스 생성 회로에서 생성한 공급 전압에 따라 바뀌는 바이어스 전압을 가지고 지연을 조절할 수 있게 하였다. 40-nm CMOS 공정을 이용하여 만들어진 칩의 6 GHz 클록에서의 전력 소모는 11.02 mW로 측정되었다. 1.1 V 중심으로 1 MHz, 100 mV 피크 투 피크를 가지는 사인파 성분으로 공급 전압을 변조하였을 때 제안한 방식에서의 지터는 기존 방식의 3.77 psRMS에서 1.61 psRMS로 줄어들었다. DRAM의 송신기 구조에서 다중 위상 클록 간의 위상 오차는 송신된 데이터의 데이터 유효 창을 감소시킨다. 이를 해결하기 위해 지연동기루프를 도입하게 되면 증가된 지연으로 인해 위상이 교정된 클록에서 지터가 증가한다. 본 논문에서는 증가된 지터를 최소화하기 위해 위상 교정으로 인해 증가된 지연을 최소화하는 위상 교정 회로를 제시하였다. 또한 유휴 상태에서 전력 소모를 줄이기 위해 위상 오차를 교정하는 회로를 입력 클록과 비동기식으로 끌 수 있는 방법 또한 제안하였다. 40-nm CMOS 공정을 이용하여 만들어진 칩의 위상 교정 범위는 101.6 ps이고 0.8 GHz 부터 2.3 GHz까지의 동작 주파수 범위에서 위상 교정기의 출력 클록의 위상 오차는 2.18°보다 작다. 제안하는 위상 교정 회로로 인해 추가된 지터는 2.3 GHz에서 0.53 psRMS이고 교정 회로를 껐을 때 전력 소모는 교정 회로가 켜졌을 때인 8.89 mW에서 3.39 mW로 줄어들었다.Chapter 1 Introduction 1 1.1 Motivation 1 1.2 Thesis Organization 4 Chapter 2 Background on DRAM Interface 5 2.1 Overview 5 2.2 Memory Interface 7 Chapter 3 Background on DLL 11 3.1 Overview 11 3.2 Building Blocks 15 3.2.1 Delay Line 15 3.2.2 Phase Detector 17 3.2.3 Charge Pump 19 3.2.4 Loop filter 20 Chapter 4 Forwarded-Clock Receiver with DLL-based Self-tracking Loop for Unmatched Memory Interfaces 21 4.1 Overview 21 4.2 Proposed Separated DLL 25 4.2.1 Operation of the Proposed Separated DLL 27 4.2.2 Operation of the Digital Loop Filter in DLL 31 4.3 Circuit Implementation 33 4.4 Measurement Results 37 4.4.1 Measurement Setup and Sequence 38 4.4.2 VT Drift Measurement and Simulation 40 Chapter 5 Open-loop-based Voltage Drift Compensation in Clock Distribution 46 5.1 Overview 46 5.2 Prior Works 50 5.3 Voltage Drift Compensation Method 52 5.4 Circuit Implementation 57 5.5 Measurement Results 61 Chapter 6 Quadrature Error Corrector with Minimum Total Delay Tracking 68 6.1 Overview 68 6.2 Prior Works 70 6.3 Quadrature Error Correction Method 73 6.4 Circuit Implementation 82 6.5 Measurement Results 88 Chapter 7 Conclusion 96 Bibliography 98 초록 102Docto

One way Doppler extractor. Volume 1: Vernier technique

A feasibility analysis, trade-offs, and implementation for a One Way Doppler Extraction system are discussed. A Doppler error analysis shows that quantization error is a primary source of Doppler measurement error. Several competing extraction techniques are compared and a Vernier technique is developed which obtains high Doppler resolution with low speed logic. Parameter trade-offs and sensitivities for the Vernier technique are analyzed, leading to a hardware design configuration. A detailed design, operation, and performance evaluation of the resulting breadboard model is presented which verifies the theoretical performance predictions. Performance tests have verified that the breadboard is capable of extracting Doppler, on an S-band signal, to an accuracy of less than 0.02 Hertz for a one second averaging period. This corresponds to a range rate error of no more than 3 millimeters per second

Low jitter phase-locked loop clock synthesis with wide locking range

The fast growing demand of wireless and high speed data communications has driven efforts to increase the levels of integration in many communications applications. Phase noise and timing jitter are important design considerations for these communications applications. The desire for highly complex levels of integration using low cost CMOS technologies works against the minimization of timing jitter and phase noise for communications systems which employ a phase-locked loop for frequency and clock synthesis with on-chip VCO. This dictates an integrated CMOS implementation of the VCO with very low phase noise performance. The ring oscillator VCOs based on differential delay cell chains have been used successfully in communications applications, but thermal noise induced phase noise have to be minimized in order not to limit their applicability to some applications which impose stringent timing jitter and phase noise requirements on the PLL clock synthesizer. Obtaining lower timing jitter and phase noise at the PLL output also requires the minimization of noise in critical circuit design blocks as well as the optimization of the loop bandwidth of the PLL. In this dissertation the fundamental performance limits of CMOS PLL clock synthesizers based on ring oscillator VCOs are investigated. The effect of flicker and thermal noise in MOS transistors on timing jitter and phase noise are explored, with particular emphasis on source coupled NMOS differential delay cells with symmetric load elements. Several new circuit architectures are employed for the charge pump circuit and phase-frequency detector (PFD) to minimize the timing jitter due to the finite dead zone in the PFD and the current mismatch in the charge pump circuit. The selection of the optimum PLL loop bandwidth is critical in determining the phase noise performance at the PLL output. The optimum loop bandwidth and the phase noise performance of the PLL is determined using behavioral simulations. These results are compared with transistor level simulated results and experimental results for the PLL clock synthesizer fabricated in a 0.35 µm CMOS technology with good agreement. To demonstrate the proposed concept, a fully integrated CMOS PLL clock synthesizer utilizing integer-N frequency multiplier technique to synthesize several clock signals in the range of 20-400 MHz with low phase noise was designed. Implemented in a standard 0.35-µm N-well CMOS process technology, the PLL achieves a period jitter of 6.5-ps (rms) and 38-ps (peak-to-peak) at 216 MHz with a phase noise of -120 dBc/Hz at frequency offsets above 10 KHz. The specific research contributions of this work include (1) proposing, designing, and implementing a new charge pump circuit architecture that matches current levels and therefore minimizes one source of phase noise due to fluctuations in the control voltage of the VCO, (2) an improved phase-frequency detector architecture which has improved characteristics in lock condition, (3) an improved ring oscillator VCO with excellent thermal noise induced phase noise characteristics, (4) the application of selfbiased techniques together with fixed bias to CMOS low phase noise PLL clock synthesizer for digital video communications ,and (5) an analytical model that describes the phase noise performance of the proposed VCO and PLL clock synthesizer

Delay Flip-Flop (DFF) Metastability Impact on Clock and Data Recovery (CDR) and Phase-Locked Loop (PLL) Circuits

Modeling delay flip-flops for binary (e.g., Alexander) phase detectors requires paying close attention to three important timing parameters: setup time, hold time, and clock edge-to-output (or briefly C2Q time). These parameters have a critical role in determining the status of the system on the circuit level. This study provided a guideline for designing an optimum DFF for an Alexander phase detector in a clock and data recovery circuit. Furthermore, it indicated DFF timing requirements for a high-speed phase detector in a clock and data recovery circuit. The CDR was also modeled by Verilog-A, and the results were compared with Simulink model achievements. Eventually designed in 45 nm CMOS technology, for 10 Gbps random sequence, the recovered clock contained 0.136 UI and 0.15 UI peak-to-peak jitter on the falling and rising edges respectively, and the lock time was 125 ns. The overall power dissipation was 21 mW from a 1 V supply voltage. Future work includes layout design and manufacturing of the proposed design

Phase Locked Loop (PLL) based Clock and Data Recovery Circuits (CDR) using Calibrated Delay Flip Flop

A Delay Flip Flop (DFF) is used in the phase detector circuit of the clock and data recovery circuit. A DFF consists of the three important timing parameters: setup time, hold time, and clock-to-output delay. These timing parameters play a vital role in designing a system at the transistor level. This thesis paper explains the impact of metastablity on the clock and data recovery (CDR) system and the importance of calibrating the DFF using a metastable circuit to improve a system\u27s lock time and peak-to-peak jitter performance. The DFF was modeled in MATLAB Simulink software and calibrated by adjusting timing parameters. The CDR system was simulated in Simulink for three different cases: 1) equal setup and hold times, 2) setup time greater than the hold time, and 3) hold time greater than the setup time. The Simulink results were then compared with the Cadence simulation results, and it was observed that the calibration of DFF using a metastable circuit improved the CDR system\u27s lock time and jitter tolerance performance. The overall power dissipation of the designed CDR system was 2.4 mW from a 1 volt supply voltage