2,505 research outputs found
Learning Tractable Probabilistic Models for Fault Localization
In recent years, several probabilistic techniques have been applied to
various debugging problems. However, most existing probabilistic debugging
systems use relatively simple statistical models, and fail to generalize across
multiple programs. In this work, we propose Tractable Fault Localization Models
(TFLMs) that can be learned from data, and probabilistically infer the location
of the bug. While most previous statistical debugging methods generalize over
many executions of a single program, TFLMs are trained on a corpus of
previously seen buggy programs, and learn to identify recurring patterns of
bugs. Widely-used fault localization techniques such as TARANTULA evaluate the
suspiciousness of each line in isolation; in contrast, a TFLM defines a joint
probability distribution over buggy indicator variables for each line. Joint
distributions with rich dependency structure are often computationally
intractable; TFLMs avoid this by exploiting recent developments in tractable
probabilistic models (specifically, Relational SPNs). Further, TFLMs can
incorporate additional sources of information, including coverage-based
features such as TARANTULA. We evaluate the fault localization performance of
TFLMs that include TARANTULA scores as features in the probabilistic model. Our
study shows that the learned TFLMs isolate bugs more effectively than previous
statistical methods or using TARANTULA directly.Comment: Fifth International Workshop on Statistical Relational AI (StaR-AI
2015
Test Case Purification for Improving Fault Localization
Finding and fixing bugs are time-consuming activities in software
development. Spectrum-based fault localization aims to identify the faulty
position in source code based on the execution trace of test cases. Failing
test cases and their assertions form test oracles for the failing behavior of
the system under analysis. In this paper, we propose a novel concept of
spectrum driven test case purification for improving fault localization. The
goal of test case purification is to separate existing test cases into small
fractions (called purified test cases) and to enhance the test oracles to
further localize faults. Combining with an original fault localization
technique (e.g., Tarantula), test case purification results in better ranking
the program statements. Our experiments on 1800 faults in six open-source Java
programs show that test case purification can effectively improve existing
fault localization techniques
Amortising the Cost of Mutation Based Fault Localisation using Statistical Inference
Mutation analysis can effectively capture the dependency between source code
and test results. This has been exploited by Mutation Based Fault Localisation
(MBFL) techniques. However, MBFL techniques suffer from the need to expend the
high cost of mutation analysis after the observation of failures, which may
present a challenge for its practical adoption. We introduce SIMFL (Statistical
Inference for Mutation-based Fault Localisation), an MBFL technique that allows
users to perform the mutation analysis in advance against an earlier version of
the system. SIMFL uses mutants as artificial faults and aims to learn the
failure patterns among test cases against different locations of mutations.
Once a failure is observed, SIMFL requires either almost no or very small
additional cost for analysis, depending on the used inference model. An
empirical evaluation of SIMFL using 355 faults in Defects4J shows that SIMFL
can successfully localise up to 103 faults at the top, and 152 faults within
the top five, on par with state-of-the-art alternatives. The cost of mutation
analysis can be further reduced by mutation sampling: SIMFL retains over 80% of
its localisation accuracy at the top rank when using only 10% of generated
mutants, compared to results obtained without sampling
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