4,424 research outputs found

    Fault Testing for Reversible Circuits

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    Applications of reversible circuits can be found in the fields of low-power computation, cryptography, communications, digital signal processing, and the emerging field of quantum computation. Furthermore, prototype circuits for low-power applications are already being fabricated in CMOS. Regardless of the eventual technology adopted, testing is sure to be an important component in any robust implementation. We consider the test set generation problem. Reversibility affects the testing problem in fundamental ways, making it significantly simpler than for the irreversible case. For example, we show that any test set that detects all single stuck-at faults in a reversible circuit also detects all multiple stuck-at faults. We present efficient test set constructions for the standard stuck-at fault model as well as the usually intractable cell-fault model. We also give a practical test set generation algorithm, based on an integer linear programming formulation, that yields test sets approximately half the size of those produced by conventional ATPG.Comment: 30 pages, 8 figures. to appear in IEEE Trans. on CA

    Mitigating smart card fault injection with link-time code rewriting: a feasibility study

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    We present a feasibility study to protect smart card software against fault-injection attacks by means of binary code rewriting. We implemented a range of protection techniques in a link-time rewriter and evaluate and discuss the obtained coverage, the associated overhead and engineering effort, as well as its practical usability

    Compact Structural Test Generation for Analog Macros

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    A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IV-converter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-axes of the test configurations is investigated to identify a collapsed high-quality test se

    Vibrational Properties of Nanoscale Materials: From Nanoparticles to Nanocrystalline Materials

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    The vibrational density of states (VDOS) of nanoclusters and nanocrystalline materials are derived from molecular-dynamics simulations using empirical tight-binding potentials. The results show that the VDOS inside nanoclusters can be understood as that of the corresponding bulk system compressed by the capillary pressure. At the surface of the nanoparticles the VDOS exhibits a strong enhancement at low energies and shows structures similar to that found near flat crystalline surfaces. For the nanocrystalline materials an increased VDOS is found at high and low phonon energies, in agreement with experimental findings. The individual VDOS contributions from the grain centers, grain boundaries, and internal surfaces show that, in the nanocrystalline materials, the VDOS enhancements are mainly caused by the grain-boundary contributions and that surface atoms play only a minor role. Although capillary pressures are also present inside the grains of nanocrystalline materials, their effect on the VDOS is different than in the cluster case which is probably due to the inter-grain coupling of the modes via the grain-boundaries.Comment: 10 pages, 7 figures, accepted for publication in Phys. Rev.

    Permeability evolution during progressive development of deformation bands in porous sandstones

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    [1] Triaxial deformation experiments were carried out on large (0.1 m) diameter cores of a porous sandstone in order to investigate the evolution of bulk sample permeability as a function of axial strain and effective confining pressure. The log permeability of each sample evolved via three stages: (1) a linear decrease prior to sample failure associated with poroelastic compaction, (2) a transient increase associated with dynamic stress drop, and (3) a systematic quasi-static decrease associated with progressive formation of new deformation bands with increasing inelastic axial strain. A quantitative model for permeability evolution with increasing inelastic axial strain is used to analyze the permeability data in the postfailure stage. The model explicitly accounts for the observed fault zone geometry, allowing the permeability of individual deformation bands to be estimated from measured bulk parameters. In a test of the model for Clashach sandstone, the parameters vary systematically with confining pressure and define a simple constitutive rule for bulk permeability of the sample as a function of inelastic axial strain and effective confining pressure. The parameters may thus be useful in predicting fault permeability and sealing potential as a function of burial depth and faul

    Steady State Behavior of Mechanically Perturbed Spin Glasses and Ferromagnets

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    A zero temperature dynamics of Ising spin glasses and ferromagnets on random graphs of finite connectivity is considered, like granular media these systems have an extensive entropy of metastable states. We consider the problem of what energy a randomly prepared spin system falls to before becoming stuck in a metastable state. We then introduce a tapping mechanism, analogous to that of real experiments on granular media, this tapping, corresponding to flipping simultaneously any spin with probability pp, leads to stationary regime with a steady state energy E(p)E(p). We explicitly solve this problem for the one dimensional ferromagnet and ±J\pm J spin glass and carry out extensive numerical simulations for spin systems of higher connectivity. The link with the density of metastable states at fixed energy and the idea of Edwards that one may construct a thermodynamics with a flat measure over metastable states is discussed. In addition our simulations on the ferromagnetic systems reveal a novel first order transition, whereas the usual thermodynamic transition on these graphs is second order.Comment: 11 pages, 7 figure

    What is the Path to Fast Fault Simulation?

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    Motivated by the recent advances in fast fault simulation techniques for large combinational circuits, a panel discussion has been organized for the 1988 International Test Conference. This paper is a collective account of the position statements offered by the panelists
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