3,082 research outputs found

    CHARACTERIZATION OF ENGINEERED SURFACES

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    In the recent years there has been an increasing interest in manufacturing products where surface topography plays a functional role. These surfaces are called engineered surfaces and are used in a variety of industries like semi conductor, data storage, micro- optics, MEMS etc. Engineered products are designed, manufactured and inspected to meet a variety of specifications such as size, position, geometry and surface finish to control the physical, chemical, optical and electrical properties of the surface. As the manufacturing industry strive towards shrinking form factor resulting in miniaturization of surface features, measurement of such micro and nanometer scale surfaces is becoming more challenging. Great strides have been made in the area of instrumentation to capture surface data, but the area of algorithms and procedures to determine form, size and orientation information of surface features still lacks the advancement needed to support the characterization requirements of R&D and high volume manufacturing. This dissertation addresses the development of fast and intelligent surface scanning algorithms and methodologies for engineered surfaces to determine form, size and orientation of significant surface features. Object recognition techniques are used to identify the surface features and CMM type fitting algorithms are applied to calculate the dimensions of the features. Recipes can be created to automate the characterization and process multiple features simultaneously. The developed methodologies are integrated into a surface analysis toolbox developed in MATLAB environment. The deployment of the developed application on the web is demonstrated

    Workshop proceedings: Information Systems for Space Astrophysics in the 21st Century, volume 1

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    The Astrophysical Information Systems Workshop was one of the three Integrated Technology Planning workshops. Its objectives were to develop an understanding of future mission requirements for information systems, the potential role of technology in meeting these requirements, and the areas in which NASA investment might have the greatest impact. Workshop participants were briefed on the astrophysical mission set with an emphasis on those missions that drive information systems technology, the existing NASA space-science operations infrastructure, and the ongoing and planned NASA information systems technology programs. Program plans and recommendations were prepared in five technical areas: Mission Planning and Operations; Space-Borne Data Processing; Space-to-Earth Communications; Science Data Systems; and Data Analysis, Integration, and Visualization

    Photoelastic Stress Analysis

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    Comparison of Small Baseline Interferometric SAR Processors for Estimating Ground Deformation

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    The small Baseline Synthetic Aperture Radar (SAR) Interferometry (SBI) technique has been widely and successfully applied in various ground deformation monitoring applications. Over the last decade, a variety of SBI algorithms have been developed based on the same fundamental concepts. Recently developed SBI toolboxes provide an open environment for researchers to apply different SBI methods for various purposes. However, there has been no thorough discussion that compares the particular characteristics of different SBI methods and their corresponding performance in ground deformation reconstruction. Thus, two SBI toolboxes that implement a total of four SBI algorithms were selected for comparison. This study discusses and summarizes the main differences, pros and cons of these four SBI implementations, which could help users to choose a suitable SBI method for their specific application. The study focuses on exploring the suitability of each SBI module under various data set conditions, including small/large number of interferograms, the presence or absence of larger time gaps, urban/vegetation ground coverage, and temporally regular/irregular ground displacement with multiple spatial scales. Within this paper we discuss the corresponding theoretical background of each SBI method. We present a performance analysis of these SBI modules based on two real data sets characterized by different environmental and surface deformation conditions. The study shows that all four SBI processors are capable of generating similar ground deformation results when the data set has sufficient temporal sampling and a stable ground backscatter mechanism like urban area. Strengths and limitations of different SBI processors were analyzed based on data set configuration and environmental conditions and are summarized in this paper to guide future users of SBI techniques

    On the integration of deformation and relief measurement using ESPI

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    The combination of relief and deformation measurement is investigated for improving the accuracy of Electronic Speckle-Pattern Interferometry (ESPI) data. The nature of sensitivity variations within different types of interferometers and with different shapes of objects is analysed, revealing significant variations for some common interferometers. Novel techniques are developed for real-time measurement of dynamic events by means of carrier fringes. This allows quantification of deformation and relief, where the latter is used in the correction of the sensitivity variations of the former

    A Fringe Projection System for Measurement of Condensing Fluid Films in Reduced Gravity

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    The thesis describes the design of a fringe projection system to study the dynamics of condensation with potential application in a reduced gravity environment. The concept is that an optical system for imaging the condensation layer enables extraction of valuable data from the image because of the ability of the optical system to image the perturbations in the condensation films. By acquiring a sequence of images of the deformed fringe pattern, the change in the surface topology can be observed over time, giving greater understanding of condensation dynamics in reduced gravity

    Workflows For X-ray And Neutron Interferometry/Tomography As Applied To Additive Manufacturing

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    Grating-based interferometry/tomography is being rapidly developed for non-destructive evaluation of additive manufacturing test articles. An application requiring an efficient workflow is extremely necessary for stress and fatigue testing samples. At present, scientific workflows play an important role for computational experiments in additive manufacturing 3D printing and interferometry/tomography imaging analysis. A clear workflow template allows scientists to process experiments easier and faster. Work flow library grows, but to find an appropriate workflow for their task is challenging. In our research, there are mainly three portions in the workflow, interferometry analysis, image reconstruction and 3D visualization. Currently, the hierarchy of workflows in interferom etry/tomography projects is Mathematica, TomoPy/ASTRA/Jupyter notebook, VisTrails and Dragonfly. In general, two methods of interferometry analysis have been used in the first portion of workflow, single-shot interferometry and stepped-grating interferometry. As for the second portion, with a Jupyter notebook, the reconstruction method ’Gridrec’ in TomoPy and ’SIRT’ (Simultaneous Iterative Reconstruction Technique) in ASTRA gener ated a powerful reconstruction volume for absorption projections and dark-field projections separately. For the last portion, Dragonfly developed by ORS (Object Research System) company is a 3D visualization software with powerful scripting capabilities implemented in Python macros. Meanwhile, the VisTrails workflow incorporated both interferometry anal ysis and image reconstruction portions into VisTrails modules. Workflows in VisTrails hide much of the complexity of Mathematica or Python programming from users. Instead, with a simple GUI, it is possible for users to make their interferometry/tomography workflows through VisTrails modules. Especially, for DPC (differential phase contrast) images in grating-based interferome try/tomography, we addressed the phase unwrapping issue with the method of 2D integra tion through generating phase images. With the algorithm, we have demonstrated the 2D integrated phase images denote a clearer contrast than DPC images

    Development of temporal phase unwrapping algorithms for depth-resolved measurements using an electronically tuned Ti:Sa laser

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    This thesis is concerned with (a) the development of full-field, multi-axis and phase contrast wavelength scanning interferometer, using an electronically tuned CW Ti:Sa laser for the study of depth resolved measurements in composite materials such as GFRPs and (b) the development of temporal phase unwrapping algorithms for depth re-solved measurements. Item (a) was part of the ultimate goal of successfully extracting the 3-D, depth-resolved, constituent parameters (Young s modulus E, Poisson s ratio v etc.) that define the mechanical behaviour of composite materials like GFRPs. Considering the success of OCT as an imaging modality, a wavelength scanning interferometer (WSI) capable of imaging the intensity AND the phase of the interference signal was proposed as the preferred technique to provide the volumetric displacement/strain fields (Note that displacement/strain fields are analogous to phase fields and thus a phase-contrast interferometer is of particular interest in this case). These would then be passed to the VFM and yield the sought parameters provided the loading scheme is known. As a result, a number of key opto-mechanical hardware was developed. First, a multiple channel (x6) tomographic interferometer realised in a Mach-Zehnder arrangement was built. Each of the three channels would provide the necessary information to extract the three orthogonal displacement/strain components while the other three are complementary and were included in the design in order to maximize the penetration depth (sample illuminated from both sides). Second, a miniature uniaxial (tensile and/or compression) loading machine was designed and built for the introduction of controlled and low magnitude displacements. Last, a rotation stage for the experimental determination of the sensitivity vectors and the re-registration of the volumetric data from the six channels was also designed and built. Unfortunately, due to the critical failure of the Ti:Sa laser data collection using the last two items was not possible. However, preliminary results at a single wavelength suggested that the above items work as expected. Item (b) involved the development of an optical sensor for the dynamic monitoring of wavenumber changes during a full 100 nm scan. The sensor is comprised of a set of four wedges in a Fizeau interferometer setup that became part of the multi-axis interferometer (7th channel). Its development became relevant due to the large amount of mode-hops present during a full scan of the Ti:Sa source. These are associated to the physics of the laser and have the undesirable effect of randomising the signal and thus preventing successful depth reconstructions. The multi-wedge sensor was designed so that it provides simultaneously high wavenumber change resolution and immunity to the large wavenumber jumps from the Ti:Sa. The analysis algorithms for the extraction of the sought wavenumber changes were based on 2-D Fourier transform method followed by temporal phase unwrapping. At first, the performance of the sensor was tested against that of a high-end commercial wavemeter for a limited scan of 1nm. A root mean square (rms) difference in measured wavenumber shift between the two of ∼4 m-1 has been achieved, equivalent to an rms wavelength shift error of ∼0.4 pm. Second, by resampling the interference signal and the wavenumber-change axis onto a uniformly sampled k-space, depth resolutions that are close to the theoretical limits were achieved for scans of up to 37 nm. Access of the full 100 nm range that is characterised by wavelength steps down to picometers level was achieved by introducing a number of improvements to the original temporal phase unwrapping algorithm reported in ref [1] tailored to depth resolved measurements. These involved the estimation and suppression of intensity background artefacts, improvements on the 2-D Fourier transform phase detection based on a previously developed algorithm in ref [2] and finally the introduction of two modifications to the original TPU. Both approaches are adaptive and involve signal re-referencing at regular intervals throughout the scan. Their purpose is to compensate for systematic and non-systematic errors owing to a small error in the value of R (a scaling factor applied to the lower sensitivity wedge phase-change signal used to unwrap the higher sensitivity one), or small changes in R with wavelength due to the possibility of a mismatch in the refractive dispersion curves of the wedges and/or a mismatch in the wedge angles. A hybrid approach combining both methods was proposed and used to analyse the data from each of the four wedges. It was found to give the most robust results of all the techniques considered, with a clear Fourier peak at the expected frequency, with significantly reduced spectral artefacts and identical depth resolutions for all four wedges of 2.2 μm measured at FWHM. The ability of the phase unwrapping strategy in resolving the aforementioned issues was demonstrated by successfully measuring the absolute thickness of four fused silica glasses using real experimental data. The results were compared with independent micrometer measurements and showed excellent agreement. Finally, due to the lack of additional experimental data and in an attempt to justify the validity of the proposed temporal phase unwrapping strategy termed as the hybrid approach, a set of simulations that closely matched the parameters characterising the real experimental data set analysed were produced and were subsequently analysed. The results of this final test justify that the various fixes included in the hybrid approach have not evolved to solve the problems of a particular data set but are rather of general nature thereby, highlighting its importance for PC-WSI applications concerning the processing and analysis of large scans
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