3,032 research outputs found

    Combinatorial methods for the evaluation of yield and operational reliability of fault-tolerant systems-on-chip

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    In this paper we develop combinatorial methods for the evaluation of yield and operational reliability of fault-tolerant systems-on-chip. The method for yield computation assumes that defects are produced according to a model in which defects are lethal and affect given components of the system following a distribution common to all defects; the method for the computation of operational reliability also assumes that the fault-tree function of the system is increasing. The distribution of the number of defects is arbitrary. The methods are based on the formulation of, respectively, the yield and the operational reliability as the probability that a given boolean function with multiple-valued variables has value 1. That probability is computed by analyzing a ROMDD (reduced ordered multiple-value decision diagram) representation of the function. For efficiency reasons, a coded ROBDD (reduced ordered binary decision diagram) representation of the function is built first and, then, that coded ROBDD is transformed into the ROMDD required by the methods. We present numerical experiments showing that the methods are able to cope with quite large systems in moderate CPU times.Postprint (published version

    Software reliability experiments data analysis and investigation

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    The objectives are to investigate the fundamental reasons which cause independently developed software programs to fail dependently, and to examine fault tolerant software structures which maximize reliability gain in the presence of such dependent failure behavior. The authors used 20 redundant programs from a software reliability experiment to analyze the software errors causing coincident failures, to compare the reliability of N-version and recovery block structures composed of these programs, and to examine the impact of diversity on software reliability using subpopulations of these programs. The results indicate that both conceptually related and unrelated errors can cause coincident failures and that recovery block structures offer more reliability gain than N-version structures if acceptance checks that fail independently from the software components are available. The authors present a theory of general program checkers that have potential application for acceptance tests

    Study of fault tolerant software technology for dynamic systems

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    The major aim of this study is to investigate the feasibility of using systems-based failure detection isolation and compensation (FDIC) techniques in building fault-tolerant software and extending them, whenever possible, to the domain of software fault tolerance. First, it is shown that systems-based FDIC methods can be extended to develop software error detection techniques by using system models for software modules. In particular, it is demonstrated that systems-based FDIC techniques can yield consistency checks that are easier to implement than acceptance tests based on software specifications. Next, it is shown that systems-based failure compensation techniques can be generalized to the domain of software fault tolerance in developing software error recovery procedures. Finally, the feasibility of using fault-tolerant software in flight software is investigated. In particular, possible system and version instabilities, and functional performance degradation that may occur in N-Version programming applications to flight software are illustrated. Finally, a comparative analysis of N-Version and recovery block techniques in the context of generic blocks in flight software is presented

    A combinatorial method for the evaluation of yield of fault-tolerant systems-on-chip

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    In this paper we develop a combinatorial method for the evaluation of yield of fault-tolerant systems-on-chip. The method assumes that defects are produced according to a model in which defects are lethal and affect given components of the system following a distribution common to all defects. The distribution of the number of defects is arbitrary. The method is based on the formulation of the yield as 1 minus the probability that a given boolean function with multiple-valued variables has value 1. That probability is computed by analyzing a ROMDD (reduced ordered multiple-valuedecision diagram) representation of the function. For efficiency reasons, we first build a coded ROBDD (reduced ordered binary decision diagram) representation of the function and then transform that coded ROBDD into the ROMDD required by the method. We present numerical experiments showing that the method is able to cope with quite large systems in moderate CPU times.Postprint (published version

    Combining Error-Correcting Codes and Decision Diagrams for the Design of Fault-Tolerant Logic

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    In modern logic circuits, fault-tolerance is increasingly important, since even atomic-scale imperfections can result in circuit failures as the size of the components is shrinking. Therefore, in addition to existing techniques for providing fault-tolerance to logic circuits, it is important to develop new techniques for detecting and correcting possible errors resulting from faults in the circuitry. Error-correcting codes are typically used in data transmission for error detection and correction. Their theory is far developed, and linear codes, in particular, have many useful properties and fast decoding algorithms. The existing fault-tolerance techniques utilizing error-correcting codes require less redundancy than other error detection and correction schemes, and such techniques are usually implemented using special decoding circuits. Decision diagrams are an efficient graphical representation for logic functions, which, depending on the technology, directly determine the complexity and layout of the circuit. Therefore, they are easy to implement. In this thesis, error-correcting codes are combined with decision diagrams to obtain a new method for providing fault-tolerance in logic circuits. The resulting method of designing fault-tolerant logic, namely error-correcting decision diagrams, introduces redundancy already to the representations of logic functions, and as a consequence no additional checker circuits are needed in the circuit layouts obtained with the new method. The purpose of the thesis is to introduce this original concept and provide fault-tolerance analysis for the obtained decision diagrams. The fault-tolerance analysis of error-correcting decision diagrams carried out in this thesis shows that the obtained robust diagrams have a significantly reduced probability for an incorrect output in comparison with non-redundant diagrams. However, such useful properties are not obtained without a cost, since adding redundancy also adds complexity, and consequently better error-correcting properties result in increased complexity in the circuit layout. /Kir1

    Advanced flight control system study

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    The architecture, requirements, and system elements of an ultrareliable, advanced flight control system are described. The basic criteria are functional reliability of 10 to the minus 10 power/hour of flight and only 6 month scheduled maintenance. A distributed system architecture is described, including a multiplexed communication system, reliable bus controller, the use of skewed sensor arrays, and actuator interfaces. Test bed and flight evaluation program are proposed

    Data Mining Applications to Fault Diagnosis in Power Electronic Systems: A Systematic Review

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    A Hierarchical Approach for Dynamic Fault Trees Solution Through Semi-Markov Process

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    Dynamic fault tree (DFT) is a top-down deductive technique extended to model systems with complex failure behaviors and interactions. In two last decades, different methods have been applied to improve its capabilities, such as computational complexity reduction, modularization, intricate failure distribution, and reconfiguration. This paper uses semi-Markov process (SMP) theorem for DFT solution with the motivation of obviating the model state-explosion, considering nonexponential failure distribution through a hierarchical solution. In addition, in the proposed method, a universal SMP for static and dynamic gates is introduced, which can generalize dynamic behaviors like functional dependencies, sequences, priorities, and spares in a single model. The efficiency of the method regarding precision and competitiveness with commercial tools, repeated events consideration, computational complexity reduction, nonexponential failure distribution consideration, and repairable events in DFT is studied by a number of examples, and the results are then compared to those of the selected existing methods

    Fault Tolerant Control Systems:a Development Method and Real-Life Case Study

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