7,283 research outputs found

    Plug & Test at System Level via Testable TLM Primitives

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    With the evolution of Electronic System Level (ESL) design methodologies, we are experiencing an extensive use of Transaction-Level Modeling (TLM). TLM is a high-level approach to modeling digital systems where details of the communication among modules are separated from the those of the implementation of functional units. This paper represents a first step toward the automatic insertion of testing capabilities at the transaction level by definition of testable TLM primitives. The use of testable TLM primitives should help designers to easily get testable transaction level descriptions implementing what we call a "Plug & Test" design methodology. The proposed approach is intended to work both with hardware and software implementations. In particular, in this paper we will focus on the design of a testable FIFO communication channel to show how designers are given the freedom of trading-off complexity, testability levels, and cos

    Optimizing construction of scheduled data flow graph for on-line testability

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    The objective of this work is to develop a new methodology for behavioural synthesis using a flow of synthesis, better suited to the scheduling of independent calculations and non-concurrent online testing. The traditional behavioural synthesis process can be defined as the compilation of an algorithmic specification into an architecture composed of a data path and a controller. This stream of synthesis generally involves scheduling, resource allocation, generation of the data path and controller synthesis. Experiments showed that optimization started at the high level synthesis improves the performance of the result, yet the current tools do not offer synthesis optimizations that from the RTL level. This justifies the development of an optimization methodology which takes effect from the behavioural specification and accompanying the synthesis process in its various stages. In this paper we propose the use of algebraic properties (commutativity, associativity and distributivity) to transform readable mathematical formulas of algorithmic specifications into mathematical formulas evaluated efficiently. This will effectively reduce the execution time of scheduling calculations and increase the possibilities of testability

    A Testability Analysis Framework for Non-Functional Properties

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    This paper presents background, the basic steps and an example for a testability analysis framework for non-functional properties

    MISSED: an environment for mixed-signal microsystem testing and diagnosis

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    A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debuggin

    Branch-coverage testability transformation for unstructured programs

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    Test data generation by hand is a tedious, expensive and error-prone activity, yet testing is a vital part of the development process. Several techniques have been proposed to automate the generation of test data, but all of these are hindered by the presence of unstructured control flow. This paper addresses the problem using testability transformation. Testability transformation does not preserve the traditional meaning of the program, rather it deals with preserving test-adequate sets of input data. This requires new equivalence relations which, in turn, entail novel proof obligations. The paper illustrates this using the branch coverage adequacy criterion and develops a branch adequacy equivalence relation and a testability transformation for restructuring. It then presents a proof that the transformation preserves branch adequacy

    A design for testability study on a high performance automatic gain control circuit.

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    A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

    Reconfiguration based built-in self-test for analogue front-end circuits

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    Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial self-test on an automatic gain control circuit (AGC). This paper extends the technique to INL, DNL, offset & gain error testing of analogue to digital converters (ADC's). It also shows how the same function can be used to test an AGC / ADC pair. An extension to full self-test is also proposed by the on-chip generation of input stimuli through reconfiguration of existing functions

    FORTEST: Formal methods and testing

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    Formal methods have traditionally been used for specification and development of software. However there are potential benefits for the testing stage as well. The panel session associated with this paper explores the usefulness or otherwise of formal methods in various contexts for improving software testing. A number of different possibilities for the use of formal methods are explored and questions raised. The contributors are all members of the UK FORTEST Network on formal methods and testing. Although the authors generally believe that formal methods are useful in aiding the testing process, this paper is intended to provoke discussion. Dissenters are encouraged to put their views to the panel or individually to the authors

    On testing VLSI chips for the big Viterbi decoder

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    A general technique that can be used in testing very large scale integrated (VLSI) chips for the Big Viterbi Decoder (BVD) system is described. The test technique is divided into functional testing and fault-coverage testing. The purpose of functional testing is to verify that the design works functionally. Functional test vectors are converted from outputs of software simulations which simulate the BVD functionally. Fault-coverage testing is used to detect and, in some cases, to locate faulty components caused by bad fabrication. This type of testing is useful in screening out bad chips. Finally, design for testability, which is included in the BVD VLSI chip design, is described in considerable detail. Both the observability and controllability of a VLSI chip are greatly enhanced by including the design for the testability feature
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