Fault- and Yield-Aware On-Chip Memory Design and Management

Ever decreasing device size causes more frequent hard faults, which becomes a serious burden to processor design and yield management. This problem is particularly pronounced in the on-chip memory which consumes up to 70% of a processor' s total chip area. Traditional circuit-level techniques, such as redundancy and error correction code, become less effective in error-prevalent environments because of their large area overhead. In this work, we suggest an architectural solution to building reliable on-chip memory in the future processor environment. Our approaches have two parts, a design framework and architectural techniques for on-chip memory structures. Our design framework provides important architectural evaluation metrics such as yield, area, and performance based on low level defects and process variations parameters. Processor architects can quickly evaluate their designs' characteristics in terms of yield, area, and performance. With the framework, we develop architectural yield enhancement solutions for on-chip memory structures including L1 cache, L2 cache and directory memory. Our proposed solutions greatly improve yield with negligible area and performance overhead. Furthermore, we develop a decoupled yield model of compute cores and L2 caches in CMPs, which show that there will be many more L2 caches than compute cores in a chip. We propose efficient utilization techniques for excess caches. Evaluation results show that excess caches significantly improve overall performance of CMPs

Self-Healing Cellular Automata to Correct Soft Errors in Defective Embedded Program Memories

Static Random Access Memory (SRAM) cells in ultra-low power Integrated Circuits (ICs) based on nanoscale Complementary Metal Oxide Semiconductor (CMOS) devices are likely to be the most vulnerable to large-scale soft errors. Conventional error correction circuits may not be able to handle the distributed nature of such errors and are susceptible to soft errors themselves. In this thesis, a distributed error correction circuit called Self-Healing Cellular Automata (SHCA) that can repair itself is presented. A possible way to deploy a SHCA in a system of SRAM-based embedded program memories (ePM) for one type of chip multi-processors is also discussed. The SHCA is compared with conventional error correction approaches and its strengths and limitations are analyzed

Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recovery

The trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge. New reliability techniques for handling soft errors in the logic and memories that allow meeting the desired failures-in-time (FIT) target are key to keep harnessing the benefits of Moore's law. The failure to scale the soft error rate caused by particle strikes, may soon limit the total number of cores that one may have running at the same time. This paper proposes a light-weight and scalable architecture to eliminate silent data corruption errors (SDC) and detected unrecoverable errors (DUE) of a core. The architecture uses acoustic wave detectors for error detection. We propose to recover by confining the errors in the cache hierarchy, allowing us to deal with the relatively long detection latencies. Our results show that the proposed mechanism protects the whole core (logic, latches and memory arrays) incurring performance overhead as low as 0.60%. © 2014 IEEE.Peer ReviewedPostprint (author's final draft

Soft-error resilient on-chip memory structures

Soft errors induced by energetic particle strikes in on-chip memory structures, such as L1 data/instruction caches and register files, have become an increasing challenge in designing new generation reliable microprocessors. Due to their transient/random nature, soft errors cannot be captured by traditional verification and testing process due to the irrelevancy to the correctness of the logic. This dissertation is thus focusing on the reliability characterization and cost-effective reliable design of on-chip memories against soft errors. Due to various performance, area/size, and energy constraints in various target systems, many existing unoptimized protection schemes on cache memories may eventually prove significantly inadequate and ineffective. This work develops new lifetime models for data and tag arrays residing in both the data and instruction caches. These models facilitate the characterization of cache vulnerability of the stored items at various lifetime phases. The design methodology is further exemplified by the proposed reliability schemes targeting at specific vulnerable phases. Benchmarking is carried out to showcase the effectiveness of these approaches. The tag array demands high reliability against soft errors while the data array is fully protected in on-chip caches, because of its crucial importance to the correctness of cache accesses. Exploiting the address locality of memory accesses, this work proposes a Tag Replication Buffer (TRB) to protect information integrity of the tag array in the data cache with low performance, energy and area overheads. To provide a comprehensive evaluation of the tag array reliability, this work also proposes a refined evaluation metric, detected-without-replica-TVF (DOR-TVF), which combines the TVF and access-with-replica (AWR) analysis. Based on the DOR-TVF analysis, a TRB scheme with early write-back (TRB-EWB) is proposed, which achieves a zero DOR-TVF at a negligible performance overhead. Recent research, as well as the proposed optimization schemes in this cache vulnerability study, have focused on the design of cost-effective reliable data caches in terms of performance, energy, and area overheads based on the assumption of fixed error rates. However, for systems in operating environments that vary with time or location, those schemes will be either insufficient or over-designed for the changing error rates. This work explores the design of a self-adaptive reliable data cache that dynamically adapts its employed reliability schemes to the changing operating environments in order to maintain a target reliability. The experimental evaluation shows that the self-adaptive data cache achieves similar reliability to a cache protected by the most reliable scheme, while simultaneously minimizing the performance and power overheads. Besides the data/instruction caches, protecting the register file and its data buses is crucial to reliable computing in high-performance microprocessors. Since the register file is in the critical path of the processor pipeline, any reliable design that increases either the pressure on the register file or the register file access latency is not desirable. This work proposes to exploit narrow-width register values, which represent the majority of generated values, for making the duplicates within the same register data item. A detailed architectural vulnerability factor (AVF) analysis shows that this in-register duplication (IRD) scheme significantly reduces the AVF in the register file compared to the conventional design. The experimental evaluation also shows that IRD provides superior read-with-duplicate (RWD) and error detection/recovery rates under heavy error injection as compared to previous reliability schemes, while only incurring a small power overhead. By integrating the proposed reliable designs in data/instruction caches and register files, the vulnerability of the entire microprocessor is dramatically reduced. The new lifetime model, the self-adaptive design and the narrow-width value duplication scheme proposed in this work can also provide guidance to architects toward highly efficient reliable system design

ECC Memory for Fault Tolerant RISC-V Processors

Numerous processor cores based on the popular RISC-V Instruction Set Architecture have been developed in the past few years and are freely available. The same applies for RISC-V ecosystems that allow to implement System-on-Chips with RISC-V processors on ASICs or FPGAs. However, so far only very little concepts and implementations for fault tolerant RISC-V processors are existing. This inhibits the use of RISC-V for safety-critical applications (as in the automotive domain) or within radiation environments (as in the aerospace domain). This work enhances the existing implementations Rocket and BOOM with a generic Error Correction Code (ECC) protected memory as a first step towards fault tolerance. The impact of the ECC additions on performance and resource utilization are discussed

Single Event Effects Assessment of UltraScale+ MPSoC Systems under Atmospheric Radiation

The AMD UltraScale+ XCZU9EG device is a Multi-Processor System-on-Chip (MPSoC) with embedded Programmable Logic (PL) that excels in many Edge (e.g., automotive or avionics) and Cloud (e.g., data centres) terrestrial applications. However, it incorporates a large amount of SRAM cells, making the device vulnerable to Neutron-induced Single Event Upsets (NSEUs) or otherwise soft errors. Semiconductor vendors incorporate soft error mitigation mechanisms to recover memory upsets (i.e., faults) before they propagate to the application output and become an error. But how effective are the MPSoC's mitigation schemes? Can they effectively recover upsets in high altitude or large scale applications under different workloads? This article answers the above research questions through a solid study that entails accelerated neutron radiation testing and dependability analysis. We test the device on a broad range of workloads, like multi-threaded software used for pose estimation and weather prediction or a software/hardware (SW/HW) co-design image classification application running on the AMD Deep Learning Processing Unit (DPU). Assuming a one-node MPSoC system in New York City (NYC) at 40k feet, all tested software applications achieve a Mean Time To Failure (MTTF) greater than 148 months, which shows that upsets are effectively recovered in the processing system of the MPSoC. However, the SW/HW co-design (i.e., DPU) in the same one-node system at 40k feet has an MTTF = 4 months due to the high failure rate of its PL accelerator, which emphasises that some MPSoC workloads may require additional NSEU mitigation schemes. Nevertheless, we show that the MTTF of the DPU can increase to 87 months without any overhead if one disregards the failure rate of tolerable errors since they do not affect the correctness of the classification output.Comment: This manuscript is under review at IEEE Transactions on Reliabilit

Smart hardware designs for probabilistically-analyzable processor architectures

Future Critical Real-Time Embedded Systems (CRTES), like those is planes, cars or trains, require more and more guaranteed performance in order to satisfy the increasing performance demands of advanced complex software features. While increased performance can be achieved by deploying processor techniques currently used in High-Performance Computing (HPC) and mainstream domains, their use challenges the software timing analysis, a necessary step in CRTES' verification and validation. Cache memories are known to have high impact in performance, and in fact, current CRTES include multicores usually with several levels of cache. In this line, this Thesis aims at increasing the guaranteed performance of CRTES by using techniques for caches building upon time randomization and providing probabilistic guarantees of tasks' execution time. In this Thesis, we first focus on on improving cache placement and replacement to improve guaranteed performance. For placement, different existing policies are explored in a multi-level cache setup, and a solution is reached in which different of those policies are combined. For cache replacement, we analyze a pathological scenario that no cache policy so far accounts and propose several policies that fix this pathological scenario. For shared caches in multicore we observe that contention is mainly caused by private writes that go through to the shared cache, yet using a pure write-back policy also has its drawbacks. We propose a hybrid approach to mitigate this contention. Building on this solution, the next contribution tackles a problem caused by the need of some reliability mechanisms in CRTES. Implementing reliability close to the processor's core has a significant impact in performance. A look-ahead error detection solution is proposed to greatly mitigate the performance impact. The next contribution proposes the first hardware prefetcher for CRTES with arbitrary cache hierarchies. Given its speculative nature, prefetchers that have a guaranteed positive impact on performance are difficult to design. We present a framework that provides execution time guarantees and obtains a performance benefit. Finally, we focus on the impact of timing anomalies in CRTES with caches. For the first time, a definition and taxonomy of timing anomalies is given for Measurement-Based Timing Analysis. Then, we focus on a specific timing anomaly that can happen with caches and provide a solution to account for it in the execution time estimates.Los Sistemas Empotrados de Tiempo-Real Crítico (SETRC), como los de los aviones, coches o trenes, requieren más y más rendimiento garantizado para satisfacer la demanda al alza de rendimiento para funciones complejas y avanzadas de software. Aunque el incremento en rendimiento puede ser adquirido utilizando técnicas de arquitectura de procesadores actualmente utilizadas en la Computación de Altas Prestaciones (CAP) i en los dominios convencionales, este uso presenta retos para el análisis del tiempo de software, un paso necesario en la verificación y validación de SETRC. Las memorias caches son conocidas por su gran impacto en rendimiento y, de hecho, los actuales SETRC incluyen multicores normalmente con diversos niveles de cache. En esta línea, esta Tesis tiene como objetivo mejorar el rendimiento garantizado de los SETRC utilizando técnicas para caches y utilizando métodos como la randomización del tiempo y proveyendo garantías probabilísticas de tiempo de ejecución de las tareas. En esta Tesis, primero nos centramos en mejorar la colocación y el reemplazo de caches para mejorar el rendimiento garantizado. Para la colocación, diferentes políticas son exploradas en un sistema cache multi-nivel, y se llega a una solución donde diversas de estas políticas son combinadas. Para el reemplazo, analizamos un escenario patológico que ninguna política actual tiene en cuenta, y proponemos varias políticas que solucionan este escenario patológico. Para caches compartidas en multicores, observamos que la contención es causada principalmente por escrituras privadas que van a través de la cache compartida, pero usar una política de escritura retardada pura también tiene sus consecuencias. Proponemos un enfoque híbrido para mitigar la contención. Sobre esta solución, la siguiente contribución ataca un problema causado por la necesidad de mecanismos de fiabilidad en SETRC. Implementar fiabilidad cerca del núcleo del procesador tiene un impacto significativo en rendimiento. Una solución basada en anticipación se propone para mitigar el impacto en rendimiento. La siguiente contribución propone el primer prefetcher hardware para SETRC con una jerarquía de caches arbitraria. Por primera vez, se da una definición y taxonomía de anomalías temporales para Análisis Temporal Basado en Medidas. Después, nos centramos en una anomalía temporal concreta que puede pasar con caches y ofrecemos una solución que la tiene en cuenta en las estimaciones del tiempo de ejecución.Postprint (published version