Achieving Functional Correctness in Large Interconnect Systems.

In today's semi-conductor industry, large chip-multiprocessors and systems-on-chip are being developed, integrating a large number of components on a single chip. The sheer size of these designs and the intricacy of the communication patterns they exhibit have propelled the development of network-on-chip (NoC) interconnects as the basis for the communication infrastructure in these systems. Faced with the interconnect's growing size and complexity, several challenges hinder its effective validation. During the interconnect's development, the functional verification process relies heavily on the use of emulation and post-silicon validation platforms. However, detecting and debugging errors on these platforms is a difficult endeavour due to the limited observability, and in turn the low verification capabilities, they provide. Additionally, with the inherent incompleteness of design-time validation efforts, the potential of design bugs escaping into the interconnect of a released product is also a concern, as these bugs can threaten the viability of the entire system. This dissertation provides solutions to enable the development of functionally correct interconnect designs. We first address the challenges encountered during design-time verification efforts, by providing two complementary mechanisms that allow emulation and post-silicon verification frameworks to capture a detailed overview of the functional behaviour of the interconnect. Our first solution re-purposes the contents of in-flight traffic to log debug data from the interconnect's execution. This approach enables the validation of the interconnect using synthetic traffic workloads, while attaining over 80% observability of the routes followed by packets and capturing valuable debugging information. We also develop an alternative mechanism that boosts observability by taking periodic snapshots of execution, thus extending the verification capabilities to run both synthetic traffic and real-application workloads. The collected snapshots enhance detection and debugging support, and they provide observability of over 50% of packets and reconstructs at least half of each of their routes. Moreover, we also develop error detection and recovery solutions to address the threat of design bugs escaping into the interconnect's runtime operation. Our runtime techniques can overcome communication errors without needing to store replicate copies of all in-flight packets, thereby achieving correctness at minimal area costsPhDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/116741/1/rawanak_1.pd

Automated Debugging Methodology for FPGA-based Systems

Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computers, home automation, etc. to name a few. The modern designs constitute billions of transistors. However, with this evolution, ensuring that the devices fulfill the designer’s expectation under variable conditions has also become a great challenge. This requires a lot of design time and effort. Whenever an error is encountered, the process is re-started. Hence, it is desired to minimize the number of spins required to achieve an error-free product, as each spin results in loss of time and effort. Software-based simulation systems present the main technique to ensure the verification of the design before fabrication. However, few design errors (bugs) are likely to escape the simulation process. Such bugs subsequently appear during the post-silicon phase. Finding such bugs is time-consuming due to inherent invisibility of the hardware. Instead of software simulation of the design in the pre-silicon phase, post-silicon techniques permit the designers to verify the functionality through the physical implementations of the design. The main benefit of the methodology is that the implemented design in the post-silicon phase runs many order-of-magnitude faster than its counterpart in pre-silicon. This allows the designers to validate their design more exhaustively. This thesis presents five main contributions to enable a fast and automated debugging solution for reconfigurable hardware. During the research work, we used an obstacle avoidance system for robotic vehicles as a use case to illustrate how to apply the proposed debugging solution in practical environments. The first contribution presents a debugging system capable of providing a lossless trace of debugging data which permits a cycle-accurate replay. This methodology ensures capturing permanent as well as intermittent errors in the implemented design. The contribution also describes a solution to enhance hardware observability. It is proposed to utilize processor-configurable concentration networks, employ debug data compression to transmit the data more efficiently, and partially reconfiguring the debugging system at run-time to save the time required for design re-compilation as well as preserve the timing closure. The second contribution presents a solution for communication-centric designs. Furthermore, solutions for designs with multi-clock domains are also discussed. The third contribution presents a priority-based signal selection methodology to identify the signals which can be more helpful during the debugging process. A connectivity generation tool is also presented which can map the identified signals to the debugging system. The fourth contribution presents an automated error detection solution which can help in capturing the permanent as well as intermittent errors without continuous monitoring of debugging data. The proposed solution works for designs even in the absence of golden reference. The fifth contribution proposes to use artificial intelligence for post-silicon debugging. We presented a novel idea of using a recurrent neural network for debugging when a golden reference is present for training the network. Furthermore, the idea was also extended to designs where golden reference is not present

Harnessing Simulation Acceleration to Solve the Digital Design Verification Challenge.

Today, design verification is by far the most resource and time-consuming activity of any new digital integrated circuit development. Within this area, the vast majority of the verification effort in industry relies on simulation platforms, which are implemented either in hardware or software. A "simulator" includes a model of each component of a design and has the capability of simulating its behavior under any input scenario provided by an engineer. Thus, simulators are deployed to evaluate the behavior of a design under as many input scenarios as possible and to identify and debug all incorrect functionality. Two features are critical in simulators for the validation effort to be effective: performance and checking/debugging capabilities. A wide range of simulator platforms are available today: on one end of the spectrum there are software-based simulators, providing a very rich software infrastructure for checking and debugging the design's functionality, but executing only at 1-10 simulation cycles per second (while actual chips operate at GHz speeds). At the other end of the spectrum, there are hardware-based platforms, such as accelerators, emulators and even prototype silicon chips, providing higher performances by 4 to 9 orders of magnitude, at the cost of very limited or non-existent checking/debugging capabilities. As a result, today, simulation-based validation is crippled: one can either have satisfactory performance on hardware-accelerated platforms or critical infrastructures for checking/debugging on software simulators, but not both. This dissertation brings together these two ends of the spectrum by presenting solutions that offer high-performance simulation with effective checking and debugging capabilities. Specifically, it addresses the performance challenge of software simulators by leveraging inexpensive off-the-shelf graphics processors as massively parallel execution substrates, and then exposing the parallelism inherent in the design model to that architecture. For hardware-based platforms, the dissertation provides solutions that offer enhanced checking and debugging capabilities by abstracting the relevant data to be logged during simulation so to minimize the cost of collection, transfer and processing. Altogether, the contribution of this dissertation has the potential to solve the challenge of digital design verification by enabling effective high-performance simulation-based validation.PHDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/99781/1/dchatt_1.pd

Formal Verification of a MESI-based Cache Implementation

Cache coherency is crucial to multi-core systems with a shared memory programming model. Coherency protocols have been formally verified at the architectural level with relative ease. However, several subtle issues creep into the hardware realization of cache in a multi-processor environment. The assumption, made in the abstract model, that state transitions are atomic, is invalid for the HDL implementation. Each transition is composed of many concurrent multi-core operations. As a result, even with a blocking bus, several transient states come into existence. Most modern processors optimize communication with a split-transaction bus, this results in further transient states and race conditions. Therefore, the design and verification of cache coherency is increasingly complex and challenging. Simulation techniques are insufficient to ensure memory consistency and the absence of deadlock, livelock, and starvation. At best, it is tediously complex and time consuming to reach confidence in functionality with simulation. Formal methods are ideally suited to identify the numerous race conditions and subtle failures. In this study, we perform formal property verification on the RTL of a multi-core level-1 cache design based on snooping MESI protocol. We demonstrate full-proof verification of the coherence module in JasperGold using complexity reduction techniques through parameterization. We verify that the assumptions needed to constrain inputs of the stand-alone cache coherence module are satisfied as valid assertions in the instantiation environment. We compare results obtained from formal property verification against a state-of-the-art UVM environment. We highlight the benefits of a synergistic collaboration between simulation and formal techniques. We present formal analysis as a generic toolkit with numerous usage models in the digital design process

Reining in the Functional Verification of Complex Processor Designs with Automation, Prioritization, and Approximation

Our quest for faster and efficient computing devices has led us to processor designs with enormous complexity. As a result, functional verification, which is the process of ascertaining the correctness of a processor design, takes up a lion's share of the time and cost spent on making processors. Unfortunately, functional verification is only a best-effort process that cannot completely guarantee the correctness of a design, often resulting in defective products that may have devastating consequences.Functional verification, as practiced today, is unable to cope with the complexity of current and future processor designs. In this dissertation, we identify extensive automation as the essential step towards scalable functional verification of complex processor designs. Moreover, recognizing that a complete guarantee of design correctness is impossible, we argue for systematic prioritization and prudent approximation to realize fast and far-reaching functional verification solutions. We partition the functional verification effort into three major activities: planning and test generation, test execution and bug detection, and bug diagnosis. Employing a perspective we refer to as the automation, prioritization, and approximation (APA) approach, we develop solutions that tackle challenges across these three major activities. In pursuit of efficient planning and test generation for modern systems-on-chips, we develop an automated process for identifying high-priority design aspects for verification. In addition, we enable the creation of compact test programs, which, in our experiments, were up to 11 times smaller than what would otherwise be available at the beginning of the verification effort. To tackle challenges in test execution and bug detection, we develop a group of solutions that enable the deployment of automatic and robust mechanisms for catching design flaws during high-speed functional verification. By trading accuracy for speed, these solutions allow us to unleash functional verification platforms that are over three orders of magnitude faster than traditional platforms, unearthing design flaws that are otherwise impossible to reach. Finally, we address challenges in bug diagnosis through a solution that fully automates the process of pinpointing flawed design components after detecting an error. Our solution, which identifies flawed design units with over 70% accuracy, eliminates weeks of diagnosis effort for every detected error.PHDComputer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/137057/1/birukw_1.pd

Low-cost and efficient fault detection and diagnosis schemes for modern cores

Continuous improvements in transistor scaling together with microarchitectural advances have made possible the widespread adoption of high-performance processors across all market segments. However, the growing reliability threats induced by technology scaling and by the complexity of designs are challenging the production of cheap yet robust systems. Soft error trends are haunting, especially for combinational logic, and parity and ECC codes are therefore becoming insufficient as combinational logic turns into the dominant source of soft errors. Furthermore, experts are warning about the need to also address intermittent and permanent faults during processor runtime, as increasing temperatures and device variations will accelerate inherent aging phenomena. These challenges specially threaten the commodity segments, which impose requirements that existing fault tolerance mechanisms cannot offer. Current techniques based on redundant execution were devised in a time when high penalties were assumed for the sake of high reliability levels. Novel light-weight techniques are therefore needed to enable fault protection in the mass market segments. The complexity of designs is making post-silicon validation extremely expensive. Validation costs exceed design costs, and the number of discovered bugs is growing, both during validation and once products hit the market. Fault localization and diagnosis are the biggest bottlenecks, magnified by huge detection latencies, limited internal observability, and costly server farms to generate test outputs. This thesis explores two directions to address some of the critical challenges introduced by unreliable technologies and by the limitations of current validation approaches. We first explore mechanisms for comprehensively detecting multiple sources of failures in modern processors during their lifetime (including transient, intermittent, permanent and also design bugs). Our solutions embrace a paradigm where fault tolerance is built based on exploiting high-level microarchitectural invariants that are reusable across designs, rather than relying on re-execution or ad-hoc block-level protection. To do so, we decompose the basic functionalities of processors into high-level tasks and propose three novel runtime verification solutions that combined enable global error detection: a computation/register dataflow checker, a memory dataflow checker, and a control flow checker. The techniques use the concept of end-to-end signatures and allow designers to adjust the fault coverage to their needs, by trading-off area, power and performance. Our fault injection studies reveal that our methods provide high coverage levels while causing significantly lower performance, power and area costs than existing techniques. Then, this thesis extends the applicability of the proposed error detection schemes to the validation phases. We present a fault localization and diagnosis solution for the memory dataflow by combining our error detection mechanism, a new low-cost logging mechanism and a diagnosis program. Selected internal activity is continuously traced and kept in a memory-resident log whose capacity can be expanded to suite validation needs. The solution can catch undiscovered bugs, reducing the dependence on simulation farms that compute golden outputs. Upon error detection, the diagnosis algorithm analyzes the log to automatically locate the bug, and also to determine its root cause. Our evaluations show that very high localization coverage and diagnosis accuracy can be obtained at very low performance and area costs. The net result is a simplification of current debugging practices, which are extremely manual, time consuming and cumbersome. Altogether, the integrated solutions proposed in this thesis capacitate the industry to deliver more reliable and correct processors as technology evolves into more complex designs and more vulnerable transistors.El continuo escalado de los transistores junto con los avances microarquitectónicos han posibilitado la presencia de potentes procesadores en todos los segmentos de mercado. Sin embargo, varios problemas de fiabilidad están desafiando la producción de sistemas robustos. Las predicciones de "soft errors" son inquietantes, especialmente para la lógica combinacional: soluciones como ECC o paridad se están volviendo insuficientes a medida que dicha lógica se convierte en la fuente predominante de soft errors. Además, los expertos están alertando acerca de la necesidad de detectar otras fuentes de fallos (causantes de errores permanentes e intermitentes) durante el tiempo de vida de los procesadores. Los segmentos "commodity" son los más vulnerables, ya que imponen unos requisitos que las técnicas actuales de fiabilidad no ofrecen. Estas soluciones (generalmente basadas en re-ejecución) fueron ideadas en un tiempo en el que con tal de alcanzar altos nivel de fiabilidad se asumían grandes costes. Son por tanto necesarias nuevas técnicas que permitan la protección contra fallos en los segmentos más populares. La complejidad de los diseños está encareciendo la validación "post-silicon". Su coste excede el de diseño, y el número de errores descubiertos está aumentando durante la validación y ya en manos de los clientes. La localización y el diagnóstico de errores son los mayores problemas, empeorados por las altas latencias en la manifestación de errores, por la poca observabilidad interna y por el coste de generar las señales esperadas. Esta tesis explora dos direcciones para tratar algunos de los retos causados por la creciente vulnerabilidad hardware y por las limitaciones de los enfoques de validación. Primero exploramos mecanismos para detectar múltiples fuentes de fallos durante el tiempo de vida de los procesadores (errores transitorios, intermitentes, permanentes y de diseño). Nuestras soluciones son de un paradigma donde la fiabilidad se construye explotando invariantes microarquitectónicos genéricos, en lugar de basarse en re-ejecución o en protección ad-hoc. Para ello descomponemos las funcionalidades básicas de un procesador y proponemos tres soluciones de `runtime verification' que combinadas permiten una detección de errores a nivel global. Estas tres soluciones son: un verificador de flujo de datos de registro y de computación, un verificador de flujo de datos de memoria y un verificador de flujo de control. Nuestras técnicas usan el concepto de firmas y permiten a los diseñadores ajustar los niveles de protección a sus necesidades, mediante compensaciones en área, consumo energético y rendimiento. Nuestros estudios de inyección de errores revelan que los métodos propuestos obtienen altos niveles de protección, a la vez que causan menos costes que las soluciones existentes. A continuación, esta tesis explora la aplicabilidad de estos esquemas a las fases de validación. Proponemos una solución de localización y diagnóstico de errores para el flujo de datos de memoria que combina nuestro mecanismo de detección de errores, junto con un mecanismo de logging de bajo coste y un programa de diagnóstico. Cierta actividad interna es continuamente registrada en una zona de memoria cuya capacidad puede ser expandida para satisfacer las necesidades de validación. La solución permite descubrir bugs, reduciendo la necesidad de calcular los resultados esperados. Al detectar un error, el algoritmo de diagnóstico analiza el registro para automáticamente localizar el bug y determinar su causa. Nuestros estudios muestran un alto grado de localización y de precisión de diagnóstico a un coste muy bajo de rendimiento y área. El resultado es una simplificación de las prácticas actuales de depuración, que son enormemente manuales, incómodas y largas. En conjunto, las soluciones de esta tesis capacitan a la industria a producir procesadores más fiables, a medida que la tecnología evoluciona hacia diseños más complejos y más vulnerables

Fuzz, Penetration, and AI Testing for SoC Security Verification: Challenges and Solutions

The ever-increasing usage and application of system-on-chips (SoCs) has resulted in the tremendous modernization of these architectures. For a modern SoC design, with the inclusion of numerous complex and heterogeneous intellectual properties (IPs), and its privacy-preserving declaration, there exists a wide variety of highly sensitive assets. These assets must be protected from any unauthorized access and against a diverse set of attacks. Attacks for obtaining such assets could be accomplished through different sources, including malicious IPs, malicious or vulnerable firmware/software, unreliable and insecure interconnection and communication protocol, and side-channel vulnerabilities through power/performance profiles. Any unauthorized access to such highly sensitive assets may result in either a breach of company secrets for original equipment manufactures (OEM) or identity theft for the end-user. Unlike the enormous advances in functional testing and verification of the SoC architecture, security verification is still on the rise, and little endeavor has been carried out by academia and industry. Unfortunately, there exists a huge gap between the modernization of the SoC architectures and their security verification approaches. With the lack of automated SoC security verification in modern electronic design automation (EDA) tools, we provide a comprehensive overview of the requirements that must be realized as the fundamentals of the SoC security verification process in this paper. By reviewing these requirements, including the creation of a unified language for SoC security verification, the definition of security policies, formulation of the security verification, etc., we put forward a realization of the utilization of self-refinement techniques, such as fuzz, penetration, and AI testing, for security verification purposes. We evaluate all the challenges and resolution possibilities, and we provide the potential approaches for the realization of SoC security verification via these self-refinement techniques

The impact of design techniques in the reduction of power consumption of SoCs Multimedia

Orientador: Guido Costa Souza de AraújoDissertação (mestrado) - Universidade Estadual de Campinas, Instituto de ComputaçãoResumo: A indústria de semicondutores sempre enfrentou fortes demandas em resolver problema de dissipação de calor e reduzir o consumo de energia em dispositivos. Esta tendência tem sido intensificada nos últimos anos com o movimento de sustentabilidade ambiental. A concepção correta de um sistema eletrônico de baixo consumo de energia é um problema de vários níveis de complexidade e exige estratégias sistemáticas na sua construção. Fora disso, a adoção de qualquer técnica de redução de energia sempre está vinculada com objetivos especiais e provoca alguns impactos no projeto. Apesar dos projetistas conheçam bem os impactos de forma qualitativa, as detalhes quantitativas ainda são incógnitas ou apenas mantidas dentro do 'know-how' das empresas. Neste trabalho, de acordo com resultados experimentais baseado num plataforma de SoC1 industrial, tentamos quantificar os impactos derivados do uso de técnicas de redução de consumo de energia. Nos concentramos em relacionar o fator de redução de energia de cada técnica aos impactos em termo de área, desempenho, esforço de implementação e verificação. Na ausência desse tipo de dados, que relacionam o esforço de engenharia com as metas de consumo de energia, incertezas e atrasos serão frequentes no cronograma de projeto. Esperamos que este tipo de orientações possam ajudar/guiar os arquitetos de projeto em selecionar as técnicas adequadas para reduzir o consumo de energia dentro do alcance de orçamento e cronograma de projetoAbstract: The semiconductor industry has always faced strong demands to solve the problem of heat dissipation and reduce the power consumption in electronic devices. This trend has been increased in recent years with the action of environmental sustainability. The correct conception of an electronic system for low power consumption is an issue with multiple levels of complexities and requires systematic approaches in its construction. However, the adoption of any technique for reducing the power consumption is always linked with some specific goals and causes some impacts on the project. Although the designers know well that these impacts can affect the design in a quality aspect, the quantitative details are still unkown or just be kept inside the company's know-how. In this work, according to the experimental results based on an industrial SoC2 platform, we try to quantify the impacts of the use of low power techniques. We will relate the power reduction factor of each technique to the impact in terms of area, performance, implementation and verification effort. In the absence of such data, which relates the engineering effort to the goals of power consumption, uncertainties and delays are frequent. We hope that such guidelines can help/guide the project architects in selecting the appropriate techniques to reduce the power consumption within the limit of budget and project scheduleMestradoCiência da ComputaçãoMestre em Ciência da Computaçã

Advanced information processing system: The Army fault tolerant architecture conceptual study. Volume 2: Army fault tolerant architecture design and analysis

Described here is the Army Fault Tolerant Architecture (AFTA) hardware architecture and components and the operating system. The architectural and operational theory of the AFTA Fault Tolerant Data Bus is discussed. The test and maintenance strategy developed for use in fielded AFTA installations is presented. An approach to be used in reducing the probability of AFTA failure due to common mode faults is described. Analytical models for AFTA performance, reliability, availability, life cycle cost, weight, power, and volume are developed. An approach is presented for using VHSIC Hardware Description Language (VHDL) to describe and design AFTA's developmental hardware. A plan is described for verifying and validating key AFTA concepts during the Dem/Val phase. Analytical models and partial mission requirements are used to generate AFTA configurations for the TF/TA/NOE and Ground Vehicle missions