Device-circuit interactions and impact on TFT circuit-system design

This paper reviews the importance of device-circuit interactions (DCI) and its consideration when designing thin film transistor circuits and systems. We examine temperature- and process-induced variations and propose a way to evaluate the maximum achievable intrinsic performance of the TFT. This is aimed at determining when DCI becomes crucial for a specific application. Compensation methods are then reviewed to show examples of how DCI is considered in the design of AMOLED displays. Other designs such as analog front-end and image sensors are also discussed, where alternate circuits should be designed to overcome the limitations of the intrinsic device properties

Modeling of OLED degradation for prediction and compensation of AMOLED aging artifacts

Degradation is still the most challenging issue for OLED, which causes the image-sticking artifact on AMOLED displays and limits their lifetime. To overcome the demerit, OLED degradation is modeled in this thesis, and compensation based on the models is applied for AMOLEDs. A data-counting model is firstly developed to quantitatively evaluate the degradation on OLEDs, with consideration of the accumulation stress during operation. An electro-optical model is further built, based on an equivalent circuit. It can simulate the electro-optical characteristic (I-V, Eff-V) and the degradation behaviors in aging process. Besides, the correlation model is aimed to derive the current efficiency decay with measurable electrical values, delivering more dependable results at strongly aged state. The prediction and compensation are implemented based on developed models. The results show that the models exactly predict the efficiency decay during operation. The image-sticking aging artifact on AMOLED can be suppressed by applying compensation, so that the display lifetime is extended.Durch das Einbrennen von Bildern in AMOLED Displays wird deren Lebensdauer verringert; dieser Qualitätsverlust stellt nach wie vor die größte Herausforderung für die OLED Technologie dar. In dieser Thesis wird die Degradation der OLEDs modelliert und eine Kompensierung anhand der Modelle erreicht. Zunächst wurde ein Data-counting Modell entwickelt, um die Degradation von OLEDs unter Berücksichtigung der akkumulierten Belastung während des Betriebs quantitativ zu bewerten. Des Weiteren wurde ein elektro-optisches Modell entwickelt, das auf einem äquivalenten Schaltungsmodell basiert. Es kann die elektro-optischen Eigenschaft (I-V, Eff-V) und das Degradationsverhalten im Alterungsprozess simulieren. Außer den beiden Modellen wird noch ein Korrelationsmodell entwickelt, das darauf abzielt, die Abnahme der Stromeffizienz aus den messbaren elektrischen Werten abzuleiten. Dieses Modell liefert im stark gealterten Zustand zuverlässigere Ergebnisse. Aufbauend auf die entwickelten Modelle wurden die Vorhersage und die Kompensierung implementiert. Die Ergebnisse zeigen, dass die Modelle den Effizienzverlust während des Betriebes genau vorhersagen. Das Einbrennen des Bildes in das AMOLED-Display kann durch das Anwenden der Kompensierung unterdrückt werden, so dass die Lebensdauer des Displays verlängert wird

A unified OLED aging model combining three modeling approaches for extending AMOLED lifetime

Aging is still the most challenging issue for organic light-emitting diodes (OLEDs), which causes the image-sticking artifacts on active-matrix organic light-emitting diode (AMOLED) displays and limits their lifetime. To overcome this demerit, an aging model is necessary to compensate for aging artifacts. In this paper, we present a unified OLED aging model, which combines three feasible modeling approaches of OLED degradation, namely, datacounting, electro-optical, and correlation methods. The model can be used to predict the efficiency decay of OLED pixels during operation. It mitigates weaknesses and limitations of each of these three models and deploys their strengths, respectively. In the first aging stage, the data-counting model is prioritized, and in the later stages, it is calibrated using the correlation model. The dependency of the efficiency decay on the operation point of OLED is covered by the electro-optical model. The unified model is based on both phenomenal and physical effects. It delivers more reliability to determine an OLED's degradation over a long-term operation and a wide operation range like current amplitude and/or temperature range. The unified aging model applies to either an analog or a digital driving scheme. A corresponding compensation based on the aging model can be applied for extending the AMOLED lifetime

AMOLED Displays with In-Pixel Photodetector

The focus of this chapter is to consider additional functionalities beyond the regular display function of an active matrix organic light-emitting diode (AMOLED) display. We will discuss how to improve the resolution of the array with OLED lithography pushing to AR/VR standards. Also, the chapter will give an insight into pixel design and layout with a strong focus on high resolution, enabling open areas in pixels for additional functionalities. An example of such additional functionalities would be to include a photodetector in pixel, requiring the need to include in-panel TFT readout at the peripherals of the full-display sensor array for applications such as finger and palmprint sensing