Design for testability method at register transfer level

The testing of sequential circuit is more complex compared to combinational circuit because it needs a sequence of vectors to detect a fault. Its test cost increases with the complexity of the sequential circuit-under-test (CUT). Thus, design for testability (DFT) concept has been introduced to reduce testing complexity, as well as to improve testing effectiveness and efficiency. Scan technique is one of the mostly used DFT method. However, it has cost overhead in terms of area due to the number of added multiplexers for each flip-flop, and test application time due to shifting of test patterns. This research is motivated to introduce non-scan DFT method at register transfer level (RTL) in order to reduce test cost. DFT at RTL level is done based on functional information of the CUT and the connectivity of CUT registers. The process of chaining a register to another register is more effective in terms of area overhead and test application time. The first contribution of this work is the introduction of a non-scan DFT method at the RTL level that considers the information of controllability and observability of CUT that can be extracted from RTL description. It has been proven through simulation that the proposed method has higher fault coverage of around 90%, shorter test application time, shorter test generation time and 10% reduction in area overhead compared to other methods in literature for most benchmark circuits. The second contribution of this work is the introduction of built-in self-test (BIST) method at the RTL level which uses multiple input signature registers (MISRs) as BIST components instead of concurrent built-in logic block observers (CBILBOs). The selection of MISR as test register is based on extended minimum feedback vertex set algorithm. This new BIST method results in lower area overhead by about 32.9% and achieves similar higher fault coverage compared to concurrent BIST method. The introduction of non-scan DFT at the RTL level is done before logic synthesis process. Thus, the testability violations can be fixed without repeating the logic synthesis process during DFT insertion at the RTL level

From FPGA to ASIC: A RISC-V processor experience

This work document a correct design flow using these tools in the Lagarto RISC- V Processor and the RTL design considerations that must be taken into account, to move from a design for FPGA to design for ASIC

Design of a Scan Chain for Side Channel Attacks on AES Cryptosystem for Improved Security

Scan chain-based attacks are side-channel attacks focusing on one of the most significant features of hardware test circuitry. A technique called Design for Testability (DfT) involves integrating certain testability components into a hardware design. However, this creates a side channel for cryptanalysis, providing crypto devices vulnerable to scan-based attacks. Advanced Encryption Standard (AES) has been proven as the most powerful and secure symmetric encryption algorithm announced by USA Government and it outperforms all other existing cryptographic algorithms. Furthermore, the on-chip implementation of private key algorithms like AES has faced scan-based side-channel attacks. With the aim of protecting the data for secure communication, a new hybrid pipelined AES algorithm with enhanced security features is implemented. This paper proposes testing an AES core with unpredictable response compaction and bit level-masking throughout the scan chain process. A bit-level scan flipflop focused on masking as a scan protection solution for secure testing. The experimental results show that the best security is provided by the randomized addition of masked scan flipflop through the scan chain and also provides minimal design difficulty and power expansion overhead with some negligible delay measures. Thus, the proposed technique outperforms the state-of-the-art LUT-based S-box and the composite sub-byte transformation model regarding throughput rate 2 times and 15 times respectively. And security measured in the avalanche effect for the sub-pipelined model has been increased up to 95 per cent with reduced computational complexity. Also, the proposed sub-pipelined S-box utilizing a composite field arithmetic scheme achieves 7 per cent area effectiveness and 2.5 times the hardware complexity compared to the LUT-based model

Scalable algorithms for software based self test using formal methods

textTransistor scaling has kept up with Moore's law with a doubling of the number of transistors on a chip. More logic on a chip means more opportunities for manufacturing defects to slip in. This, in turn, has made processor testing after manufacturing a significant challenge. At-speed functional testing, being completely non-intrusive, has been seen as the ideal way of testing chips. However for processor testing, generating instruction level tests for covering all faults is a challenge given the issue of scalability. Data-path faults are relatively easier to control and observe compared to control-path faults. In this research we present a novel method to generate instruction level tests for hard to detect control-path faults in a processor. We initially map the gate level stuck-at fault to the Register Transfer Level (RTL) and build an equivalent faulty RTL model. The fault activation and propagation constraints are captured using Control and Data Flow Graphs of the RTL as a Liner Temporal Logic (LTL) property. This LTL property is then negated and given to a Bounded Model Checker based on a Bit-Vector Satisfiability Module Theories (SMT) solver. From the counter-example to the property we can extract a sequence of instructions that activates the gate level fault and propagates the fault effect to one of the observable points in the design. Other than the user supplying instruction constraints, this approach is completely automatic and does not require any manual intervention. Not all the design behaviors are required to generate a test for a fault. We use this insight to scale our previous methodology further. Underapproximations are design abstractions that only capture a subset of the original design behaviors. The use of RTL for test generation affords us two types of under-approximations: bit-width reduction and operator approximation. These are abstractions that perform reductions based on semantics of the RTL design. We also explore structural reductions of the RTL, called path based search, where we search through error propagation paths incrementally. This approach increases the size of the test generation problem step by step. In this way the SMT solver searches through the state space piecewise rather than doing the entire search at once. Experimental results show that our methods are robust and scalable for generating functional tests for hard to detect faults.Electrical and Computer Engineerin

Test and Testability of Asynchronous Circuits

The ever-increasing transistor shrinkage and higher clock frequencies are causing serious clock distribution, power management, and reliability issues. Asynchronous design is predicted to have a significant role in tackling these challenges because of its distributed control mechanism and on-demand, rather than continuous, switching activity. Null Convention Logic (NCL) is a robust and low-power asynchronous paradigm that introduces new challenges to test and testability algorithms because 1) the lack of deterministic timing in NCL complicates the management of test timing, 2) all NCL gates are state-holding and even simple combinational circuits show sequential behaviour, and 3) stuck-at faults on gate internal feedback (GIF) of NCL gates do not always cause an incorrect output and therefore are undetectable by automatic test pattern generation (ATPG) algorithms. Existing test methods for NCL use clocked hardware to control the timing of test. Such test hardware could introduce metastability issues into otherwise highly robust NCL devices. Also, existing test techniques for NCL handle the high-statefulness of NCL circuits by excessive incorporation of test hardware which imposes additional area, propagation delay and power consumption. This work, first, proposes a clockless self-timed ATPG that detects all faults on the gate inputs and a share of the GIF faults with no added design for test (DFT). Then, the efficacy of quiescent current (IDDQ) test for detecting GIF faults undetectable by a DFT-less ATPG is investigated. Finally, asynchronous test hardware, including test points, a scan cell, and an interleaved scan architecture, is proposed for NCL-based circuits. To the extent of our knowledge, this is the first work that develops clockless, self-timed test techniques for NCL while minimising the need for DFT, and also the first work conducted on IDDQ test of NCL. The proposed methods are applied to multiple NCL circuits with up to 2,633 NCL gates (10,000 CMOS Boolean gates), in 180 and 45 nm technologies and show average fault coverage of 88.98% for ATPG alone, 98.52% including IDDQ test, and 99.28% when incorporating test hardware. Given that this fault coverage includes detection of GIF faults, our work has 13% higher fault coverage than previous work. Also, because our proposed clockless test hardware eliminates the need for double-latching, it reduces the average area and delay overhead of previous studies by 32% and 50%, respectively

The impact of design techniques in the reduction of power consumption of SoCs Multimedia

Orientador: Guido Costa Souza de AraújoDissertação (mestrado) - Universidade Estadual de Campinas, Instituto de ComputaçãoResumo: A indústria de semicondutores sempre enfrentou fortes demandas em resolver problema de dissipação de calor e reduzir o consumo de energia em dispositivos. Esta tendência tem sido intensificada nos últimos anos com o movimento de sustentabilidade ambiental. A concepção correta de um sistema eletrônico de baixo consumo de energia é um problema de vários níveis de complexidade e exige estratégias sistemáticas na sua construção. Fora disso, a adoção de qualquer técnica de redução de energia sempre está vinculada com objetivos especiais e provoca alguns impactos no projeto. Apesar dos projetistas conheçam bem os impactos de forma qualitativa, as detalhes quantitativas ainda são incógnitas ou apenas mantidas dentro do 'know-how' das empresas. Neste trabalho, de acordo com resultados experimentais baseado num plataforma de SoC1 industrial, tentamos quantificar os impactos derivados do uso de técnicas de redução de consumo de energia. Nos concentramos em relacionar o fator de redução de energia de cada técnica aos impactos em termo de área, desempenho, esforço de implementação e verificação. Na ausência desse tipo de dados, que relacionam o esforço de engenharia com as metas de consumo de energia, incertezas e atrasos serão frequentes no cronograma de projeto. Esperamos que este tipo de orientações possam ajudar/guiar os arquitetos de projeto em selecionar as técnicas adequadas para reduzir o consumo de energia dentro do alcance de orçamento e cronograma de projetoAbstract: The semiconductor industry has always faced strong demands to solve the problem of heat dissipation and reduce the power consumption in electronic devices. This trend has been increased in recent years with the action of environmental sustainability. The correct conception of an electronic system for low power consumption is an issue with multiple levels of complexities and requires systematic approaches in its construction. However, the adoption of any technique for reducing the power consumption is always linked with some specific goals and causes some impacts on the project. Although the designers know well that these impacts can affect the design in a quality aspect, the quantitative details are still unkown or just be kept inside the company's know-how. In this work, according to the experimental results based on an industrial SoC2 platform, we try to quantify the impacts of the use of low power techniques. We will relate the power reduction factor of each technique to the impact in terms of area, performance, implementation and verification effort. In the absence of such data, which relates the engineering effort to the goals of power consumption, uncertainties and delays are frequent. We hope that such guidelines can help/guide the project architects in selecting the appropriate techniques to reduce the power consumption within the limit of budget and project scheduleMestradoCiência da ComputaçãoMestre em Ciência da Computaçã

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important

FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE

The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test (DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification

Power constrained test scheduling in system-on-chip design

With the development of VLSI technologies, especially with the coming of deep sub-micron semiconductor process technologies, power dissipation becomes a critical factor that cannot be ignored either in normal operation or in test mode of digital systems. Test scheduling has to take into consideration of both test concurrency and power dissipation constraints. For satisfying high fault coverage goals with minimum test application time under certain power dissipation constraints, the testing of all components on the system should be performed in parallel as much as possible. The main objective of this thesis is to address the test-scheduling problem faced by SOC designers at system level. Through the analysis of several existing scheduling approaches, we enlarge the basis that current approaches based on to minimize test application time and propose an efficient and integrated technique for the test scheduling of SOCs under power-constraint. The proposed merging approach is based on a tree growing technique and can be used to overlay the block-test sessions in order to reduce further test application time. A number of experiments, based on academic benchmarks and industrial designs, have been carried out to demonstrate the usefulness and efficiency of the proposed approaches

Case Study: First-Time Success ASIC Design Methodology Applied to a Multi-Processor System-on-Chip

Achieving first-time success is crucial in the ASIC design league considering the soaring cost, tight time-to-market window, and competitive business environment. One key factor in ensuring first-time success is a well-defined ASIC design methodology. Here we propose a novel ASIC design methodology that has been proven for the RUMPS401 (Rahman University Multi-Processor System 401) Multiprocessor System-on-Chip (MPSoC) project. The MPSoC project is initiated by Universiti Tunku Abdul Rahman (UTAR) VLSI design center. The proposed methodology includes the use of Universal Verification Methodology (UVM). The use of electronic design automation (EDA) software during each step of the design methodology is also presented. The first-time success RUMPS401 demonstrates the use of the proposed ASIC design methodology and the good of using one. Especially this project is carried on in educational environment that is even more limited in budget, resources and know-how, compared to the business and industrial counterparts. Here a novel ASIC design methodology that is tailored to first-time success MPSoC is presented