Exploring Design Dimensions in Flash-based Mass-memory Devices

Mission-critical space system applications present several issues: a typical one is the design of a mass-memory device (i.e., a solid- state recorder). This goal could be accomplished by using flash- memories: the exploration of a huge number of parameters and trade-offs is needed. On the one hand flash-memories are nonvolatile, shock-resistant and power-economic, but on the other hand their cost is higher than normal hard disk, the number of erasure cycles is bounded and other different drawbacks have to be considered. In addition space environment presents various issues especially because of radiations: the design of a flash- memory based solid-state recorder implies the exploration of different and quite often contrasting dimensions. No systematic approach has so far been proposed to consider them all as a whole: as a consequence the design of flash-based mass-memory device for space applications is intended to be supported by a novel design environment currently under development and refinemen

International White Book on DER Protection : Review and Testing Procedures

This white book provides an insight into the issues surrounding the impact of increasing levels of DER on the generator and network protection and the resulting necessary improvements in protection testing practices. Particular focus is placed on ever increasing inverter-interfaced DER installations and the challenges of utility network integration. This white book should also serve as a starting point for specifying DER protection testing requirements and procedures. A comprehensive review of international DER protection practices, standards and recommendations is presented. This is accompanied by the identifi cation of the main performance challenges related to these protection schemes under varied network operational conditions and the nature of DER generator and interface technologies. Emphasis is placed on the importance of dynamic testing that can only be delivered through laboratory-based platforms such as real-time simulators, integrated substation automation infrastructure and fl exible, inverter-equipped testing microgrids. To this end, the combination of fl exible network operation and new DER technologies underlines the importance of utilising the laboratory testing facilities available within the DERlab Network of Excellence. This not only informs the shaping of new protection testing and network integration practices by end users but also enables the process of de-risking new DER protection technologies. In order to support the issues discussed in the white paper, a comparative case study between UK and German DER protection and scheme testing practices is presented. This also highlights the level of complexity associated with standardisation and approval mechanisms adopted by different countries

Integrating emerging cryptographic engineering research and security education

Unlike traditional embedded systems such as secure smart cards, emerging secure deeply embedded systems, e.g., implantable and wearable medical devices, have larger “attack surface”. A security breach in such systems which are embedded deeply in human bodies or objects would be life-threatening, for which adopting traditional solutions might not be practical due to tight constraints of these often-battery-powered systems. Unfortunately, although emerging cryptographic engineering research mechanisms have started solving this critical problem, university education (at both graduate and undergraduate level) lags comparably. One of the pivotal reasons for such a lag is the multi-disciplinary nature of the emerging security bottlenecks (mathematics, engineering, science, and medicine, to name a few). Based on the aforementioned motivation, in this paper, we present an effective research and education integration strategy to overcome this issue at Rochester Institute of Technology. Moreover, we present the results of more than one year implementation of the presented strategy at graduate level through “side-channel analysis attacks” case studies. The results of the presented work show the success of the presented methodology while pinpointing the challenges encountered compared to traditional embedded system security research/teaching integration

Selective SWIFT-R. A Flexible Software-Based Technique for Soft Error Mitigation in Low-Cost Embedded Systems

Commercial off-the-shelf microprocessors are the core of low-cost embedded systems due to their programmability and cost-effectiveness. Recent advances in electronic technologies have allowed remarkable improvements in their performance. However, they have also made microprocessors more susceptible to transient faults induced by radiation. These non-destructive events (soft errors), may cause a microprocessor to produce a wrong computation result or lose control of a system with catastrophic consequences. Therefore, soft error mitigation has become a compulsory requirement for an increasing number of applications, which operate from the space to the ground level. In this context, this paper uses the concept of selective hardening, which is aimed to design reduced-overhead and flexible mitigation techniques. Following this concept, a novel flexible version of the software-based fault recovery technique known as SWIFT-R is proposed. Our approach makes possible to select different registers subsets from the microprocessor register file to be protected on software. Thus, design space is enriched with a wide spectrum of new partially protected versions, which offer more flexibility to designers. This permits to find the best trade-offs between performance, code size, and fault coverage. Three case studies have been developed to show the applicability and flexibility of the proposal.This work was funded by the Ministry of Science and Innovation in Spain with the project ‘RENASER+: Integral Analysis of Digital Circuits and Systems for Aerospace Applications’ (TEC2010-22095-C03-01)

Reliability and Security Assessment of Modern Embedded Devices

L'abstract è presente nell'allegato / the abstract is in the attachmen

Systematic Model-based Design Assurance and Property-based Fault Injection for Safety Critical Digital Systems

With advances in sensing, wireless communications, computing, control, and automation technologies, we are witnessing the rapid uptake of Cyber-Physical Systems across many applications including connected vehicles, healthcare, energy, manufacturing, smart homes etc. Many of these applications are safety-critical in nature and they depend on the correct and safe execution of software and hardware that are intrinsically subject to faults. These faults can be design faults (Software Faults, Specification faults, etc.) or physically occurring faults (hardware failures, Single-event-upsets, etc.). Both types of faults must be addressed during the design and development of these critical systems. Several safety-critical industries have widely adopted Model-Based Engineering paradigms to manage the design assurance processes of these complex CPSs. This thesis studies the application of IEC 61508 compliant model-based design assurance methodology on a representative safety-critical digital architecture targeted for the Nuclear power generation facilities. The study presents detailed experiences and results to demonstrate the benefits of Model testing in finding design flaws and its relevance to subsequent verification steps in the workflow. Additionally, to study the impact of physical faults on the digital architecture we develop a novel property-based fault injection method that overcomes few deficiencies of traditional fault injection methods. The model-based fault injection approach presented here guarantees high efficiency and near-exhaustive input/state/fault space coverage, by utilizing formal model checking principles to identify fault activation conditions and prove the fault tolerance features. The fault injection framework facilitates automated integration of fault saboteurs throughout the model to enable exhaustive fault location coverage in the model

Toward Fault-Tolerant Applications on Reconfigurable Systems-on-Chip

L'abstract è presente nell'allegato / the abstract is in the attachmen