Report from the MPP Working Group to the NASA Associate Administrator for Space Science and Applications

NASA's Office of Space Science and Applications (OSSA) gave a select group of scientists the opportunity to test and implement their computational algorithms on the Massively Parallel Processor (MPP) located at Goddard Space Flight Center, beginning in late 1985. One year later, the Working Group presented its report, which addressed the following: algorithms, programming languages, architecture, programming environments, the way theory relates, and performance measured. The findings point to a number of demonstrated computational techniques for which the MPP architecture is ideally suited. For example, besides executing much faster on the MPP than on conventional computers, systolic VLSI simulation (where distances are short), lattice simulation, neural network simulation, and image problems were found to be easier to program on the MPP's architecture than on a CYBER 205 or even a VAX. The report also makes technical recommendations covering all aspects of MPP use, and recommendations concerning the future of the MPP and machines based on similar architectures, expansion of the Working Group, and study of the role of future parallel processors for space station, EOS, and the Great Observatories era

Requirements for a Research-oriented IC Design System

Computer-aided design techniques for integrated circuits grown in an incremental way, responding to various perceived needs, so that today there are a number of useful programs for logic generation, simulation at various levels, test preparation, artwork generation and analysis (including design rule checking), and interactive graphical editing. While the design of many circuits has benefitted from these programs, when industry wants to produce a high-volume part, the design and layout are done manually, followed by digitizing and perhaps some graphic editing before it is converted to pattern generation format, leading to the often heard statement that computer-aided design of integrated circuits doesn't work. If progress is to be made, it seems clear that the entire design process has to be thought through in basic terms, and much more attention must be paid to the way in which computational techniques can complement the designer's abilities. Currently, it is appropriate to try to characterize the design process in abstract terms, so that implementation and technological biases don't cloud the view of a desired system. In this paper, we briefly describe the conversion of algorithms to masks at a very general level, and then describe several projects at MIT which aim to provide contributions to an integrated design system. It is emphasized that no complete system design exists now at MIT, and that we believe that general design considerations must constantly be tested by building (and rebuilding) the various subcomponents, the structure of which is guided by our view of the overall design process

大規模システムLSI設計のための統一的ハードウェア・ソフトウェア協調検証手法

Currently, the complexity of embedded LSI system is growing faster than the productivity of system design. This trend results in a design productivity gap, particularly in tight development time. Since the verification task takes bigger part of development task, it becomes a major challenge in LSI system design. In order to guarantee system reliability and quality of results (QoR), verifying large coverage of system functionality requires huge amount of relevant test cases and various scenario of evaluations. To overcome these problems, verification methodology is evolving toward supporting higher level of design abstraction by employing HW-SW co-verification. In this study, we present a novel approach for verification LSI circuit which is called as unified HW/SW co-verification framework. The study aims to improve design efficiency while maintains implementation consistency in the point of view of system-level performance. The proposed data-driven simulation and flexible interface of HW and SW design become the backbone of verification framework. In order to avoid time consuming, prone error, and iterative design spin-off in a large team, the proposed framework has to support multiple design abstractions. Hence, it can close the loop of design, exploration, optimization, and testing. Furthermore, the proposed methodology is also able to co-operate with system-level simulation in high-level abstraction, which is easy to extend for various applications and enables fast-turn around design modification. These contributions are discussed in chapter 3. In order to show the effectiveness and the use-cases of the proposed verification framework, the evaluation and metrics assessments of Very High Throughput wireless LAN system design are carried out. Two application examples are provided. The first case in chapter 4 is intended for fast verification and design exploration of large circuit. The Maximum Likelihood Detection (MLD) MIMO decoder is considered as Design Under Test (DUT). The second case, as presented in chapter 5, is the evaluation for system-level simulation. The full transceiver system based on IEEE 802.11ac standard is employed as DUT. Experimental results show that the proposed verification approach gives significant improvements of verification time (e.g. up to 10,000 times) over the conventional scheme. The proposed framework is also able to support various schemes of system level evaluations and cross-layer evaluation of wireless system.九州工業大学博士学位論文 学位記番号：情工博甲第328号 学位授与年月日：平成29年6月30日1 Introduction|2 Design and Verification in LSI System Design|3 Unified HW/SW Co-verification Methodology|4 Fast Co-verification and Design Exploration in Complex Circuits|5 Unified System Level Simulator for Very High Throughput Wireless Systems|6 Conclusion and Future Work九州工業大学平成29年

RELEASE: A High-level Paradigm for Reliable Large-scale Server Software

Erlang is a functional language with a much-emulated model for building reliable distributed systems. This paper outlines the RELEASE project, and describes the progress in the first six months. The project aim is to scale the Erlang’s radical concurrency-oriented programming paradigm to build reliable general-purpose software, such as server-based systems, on massively parallel machines. Currently Erlang has inherently scalable computation and reliability models, but in practice scalability is constrained by aspects of the language and virtual machine. We are working at three levels to address these challenges: evolving the Erlang virtual machine so that it can work effectively on large scale multicore systems; evolving the language to Scalable Distributed (SD) Erlang; developing a scalable Erlang infrastructure to integrate multiple, heterogeneous clusters. We are also developing state of the art tools that allow programmers to understand the behaviour of massively parallel SD Erlang programs. We will demonstrate the effectiveness of the RELEASE approach using demonstrators and two large case studies on a Blue Gene

IEEE Standard 1500 Compliance Verification for Embedded Cores

Core-based design and reuse are the two key elements for an efficient system-on-chip (SoC) development. Unfortunately, they also introduce new challenges in SoC testing, such as core test reuse and the need of a common test infrastructure working with cores originating from different vendors. The IEEE 1500 Standard for Embedded Core Testing addresses these issues by proposing a flexible hardware test wrapper architecture for embedded cores, together with a core test language (CTL) used to describe the implemented wrapper functionalities. Several intellectual property providers have already announced IEEE Standard 1500 compliance in both existing and future design blocks. In this paper, we address the problem of guaranteeing the compliance of a wrapper architecture and its CTL description to the IEEE Standard 1500. This step is mandatory to fully trust the wrapper functionalities in applying the test sequences to the core. We present a systematic methodology to build a verification framework for IEEE Standard 1500 compliant cores, allowing core providers and/or integrators to verify the compliance of their products (sold or purchased) to the standar

Software safety : a definition and some preliminary thoughts

Software safety is the subject of a research project in its initial stages at the University of California Irvine. This research deals with critical real-time software where the cost of an error is high, e.g. human life. In this paper software techniques having a bearing on safety are described and evaluated. Initial definitions of software safety concepts are presented along with some preliminary thoughts and research questions

A Methodology to Emulate Single Event Upsets in Flip-Flops using FPGAs through Partial Reconfiguration and Instrumentation

This paper presents a methodology to emulate Single Event Upsets (SEUs) in FPGA flip-flops (FFs). Since the content of a FF is not modifiable through the FPGA configuration memory bits, a dedicated design is required for fault injection in the FFs. The method proposed in this paper is a hybrid approach that combines FPGA partial reconfiguration and extra logic added to the circuit under test, without modifying its operation. This approach has been integrated into a fault-injection platform, named NESSY (Non intrusive ErrorS injection SYstem), developed by our research group. Finally, this paper includes results on a Virtex-5 FPGA demonstrating the validity of the method on the ITC’99 benchmark set and a Feed-Forward Equalization (FFE) filter. In comparison with other approaches in the literature, this methodology reduces the resource consumption introduced to carry out the fault injection in FFs, at the cost of adding very little time overhead (1.6 �μs per fault)

Automated Debugging Methodology for FPGA-based Systems

Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computers, home automation, etc. to name a few. The modern designs constitute billions of transistors. However, with this evolution, ensuring that the devices fulfill the designer’s expectation under variable conditions has also become a great challenge. This requires a lot of design time and effort. Whenever an error is encountered, the process is re-started. Hence, it is desired to minimize the number of spins required to achieve an error-free product, as each spin results in loss of time and effort. Software-based simulation systems present the main technique to ensure the verification of the design before fabrication. However, few design errors (bugs) are likely to escape the simulation process. Such bugs subsequently appear during the post-silicon phase. Finding such bugs is time-consuming due to inherent invisibility of the hardware. Instead of software simulation of the design in the pre-silicon phase, post-silicon techniques permit the designers to verify the functionality through the physical implementations of the design. The main benefit of the methodology is that the implemented design in the post-silicon phase runs many order-of-magnitude faster than its counterpart in pre-silicon. This allows the designers to validate their design more exhaustively. This thesis presents five main contributions to enable a fast and automated debugging solution for reconfigurable hardware. During the research work, we used an obstacle avoidance system for robotic vehicles as a use case to illustrate how to apply the proposed debugging solution in practical environments. The first contribution presents a debugging system capable of providing a lossless trace of debugging data which permits a cycle-accurate replay. This methodology ensures capturing permanent as well as intermittent errors in the implemented design. The contribution also describes a solution to enhance hardware observability. It is proposed to utilize processor-configurable concentration networks, employ debug data compression to transmit the data more efficiently, and partially reconfiguring the debugging system at run-time to save the time required for design re-compilation as well as preserve the timing closure. The second contribution presents a solution for communication-centric designs. Furthermore, solutions for designs with multi-clock domains are also discussed. The third contribution presents a priority-based signal selection methodology to identify the signals which can be more helpful during the debugging process. A connectivity generation tool is also presented which can map the identified signals to the debugging system. The fourth contribution presents an automated error detection solution which can help in capturing the permanent as well as intermittent errors without continuous monitoring of debugging data. The proposed solution works for designs even in the absence of golden reference. The fifth contribution proposes to use artificial intelligence for post-silicon debugging. We presented a novel idea of using a recurrent neural network for debugging when a golden reference is present for training the network. Furthermore, the idea was also extended to designs where golden reference is not present

Memory built-in self-repair and correction for improving yield: a review

Nanometer memories are highly prone to defects due to dense structure, necessitating memory built-in self-repair as a must-have feature to improve yield. Today’s system-on-chips contain memories occupying an area as high as 90% of the chip area. Shrinking technology uses stricter design rules for memories, making them more prone to manufacturing defects. Further, using 3D-stacked memories makes the system vulnerable to newer defects such as those coming from through-silicon-vias (TSV) and micro bumps. The increased memory size is also resulting in an increase in soft errors during system operation. Multiple memory repair techniques based on redundancy and correction codes have been presented to recover from such defects and prevent system failures. This paper reviews recently published memory repair methodologies, including various built-in self-repair (BISR) architectures, repair analysis algorithms, in-system repair, and soft repair handling using error correcting codes (ECC). It provides a classification of these techniques based on method and usage. Finally, it reviews evaluation methods used to determine the effectiveness of the repair algorithms. The paper aims to present a survey of these methodologies and prepare a platform for developing repair methods for upcoming-generation memories

Hardware Fault Injection

Hardware fault injection is the widely accepted approach to evaluate the behavior of a circuit in the presence of faults. Thus, it plays a key role in the design of robust circuits. This chapter presents a comprehensive review of hardware fault injection techniques, including physical and logical approaches. The implementation of effective fault injection systems is also analyzed. Particular emphasis is made on the recently developed emulation-based techniques, which can provide large flexibility along with unprecedented levels of performance. These capabilities provide a way to tackle reliability evaluation of complex circuits.Publicad