Classification via Incoherent Subspaces

This article presents a new classification framework that can extract individual features per class. The scheme is based on a model of incoherent subspaces, each one associated to one class, and a model on how the elements in a class are represented in this subspace. After the theoretical analysis an alternate projection algorithm to find such a collection is developed. The classification performance and speed of the proposed method is tested on the AR and YaleB databases and compared to that of Fisher's LDA and a recent approach based on on $\ell_1$ minimisation. Finally connections of the presented scheme to already existing work are discussed and possible ways of extensions are pointed out.Comment: 22 pages, 2 figures, 4 table

Dimension Reduction by Mutual Information Discriminant Analysis

In the past few decades, researchers have proposed many discriminant analysis (DA) algorithms for the study of high-dimensional data in a variety of problems. Most DA algorithms for feature extraction are based on transformations that simultaneously maximize the between-class scatter and minimize the withinclass scatter matrices. This paper presents a novel DA algorithm for feature extraction using mutual information (MI). However, it is not always easy to obtain an accurate estimation for high-dimensional MI. In this paper, we propose an efficient method for feature extraction that is based on one-dimensional MI estimations. We will refer to this algorithm as mutual information discriminant analysis (MIDA). The performance of this proposed method was evaluated using UCI databases. The results indicate that MIDA provides robust performance over different data sets with different characteristics and that MIDA always performs better than, or at least comparable to, the best performing algorithms.Comment: 13pages, 3 tables, International Journal of Artificial Intelligence & Application

Global and Local Two-Sample Tests via Regression

Two-sample testing is a fundamental problem in statistics. Despite its long history, there has been renewed interest in this problem with the advent of high-dimensional and complex data. Specifically, in the machine learning literature, there have been recent methodological developments such as classification accuracy tests. The goal of this work is to present a regression approach to comparing multivariate distributions of complex data. Depending on the chosen regression model, our framework can efficiently handle different types of variables and various structures in the data, with competitive power under many practical scenarios. Whereas previous work has been largely limited to global tests which conceal much of the local information, our approach naturally leads to a local two-sample testing framework in which we identify local differences between multivariate distributions with statistical confidence. We demonstrate the efficacy of our approach both theoretically and empirically, under some well-known parametric and nonparametric regression methods. Our proposed methods are applied to simulated data as well as a challenging astronomy data set to assess their practical usefulness

Joint cross-domain classification and subspace learning for unsupervised adaptation

Domain adaptation aims at adapting the knowledge acquired on a source domain to a new different but related target domain. Several approaches have beenproposed for classification tasks in the unsupervised scenario, where no labeled target data are available. Most of the attention has been dedicated to searching a new domain-invariant representation, leaving the definition of the prediction function to a second stage. Here we propose to learn both jointly. Specifically we learn the source subspace that best matches the target subspace while at the same time minimizing a regularized misclassification loss. We provide an alternating optimization technique based on stochastic sub-gradient descent to solve the learning problem and we demonstrate its performance on several domain adaptation tasks.Comment: Paper is under consideration at Pattern Recognition Letter