SoC Test: Trends and Recent Standards

The well-known approaching test cost crisis, where semiconductor test costs begin to approach or exceed manufacturing costs has led test engineers to apply new solutions to the problem of testing System-On-Chip (SoC) designs containing multiple IP (Intellectual Property) cores. While it is not yet possible to apply generic test architectures to an IP core within a SoC, the emergence of a number of similar approaches, and the release of new industry standards, such as IEEE 1500 and IEEE 1450.6, may begin to change this situation. This paper looks at these standards and at some techniques currently used by SoC test engineers. An extensive reference list is included, reflecting the purpose of this publication as a review paper

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

DeSyRe: on-Demand System Reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

A Hardware Security Solution against Scan-Based Attacks

Scan based Design for Test (DfT) schemes have been widely used to achieve high fault coverage for integrated circuits. The scan technique provides full access to the internal nodes of the device-under-test to control them or observe their response to input test vectors. While such comprehensive access is highly desirable for testing, it is not acceptable for secure chips as it is subject to exploitation by various attacks. In this work, new methods are presented to protect the security of critical information against scan-based attacks. In the proposed methods, access to the circuit containing secret information via the scan chain has been severely limited in order to reduce the risk of a security breach. To ensure the testability of the circuit, a built-in self-test which utilizes an LFSR as the test pattern generator (TPG) is proposed. The proposed schemes can be used as a countermeasure against side channel attacks with a low area overhead as compared to the existing solutions in literature

Development and certification of mixed-criticality embedded systems based on probabilistic timing analysis

An increasing variety of emerging systems relentlessly replaces or augments the functionality of mechanical subsystems with embedded electronics. For quantity, complexity, and use, the safety of such subsystems is an increasingly important matter. Accordingly, those systems are subject to safety certification to demonstrate system's safety by rigorous development processes and hardware/software constraints. The massive augment in embedded processors' complexity renders the arduous certification task significantly harder to achieve. The focus of this thesis is to address the certification challenges in multicore architectures: despite their potential to integrate several applications on a single platform, their inherent complexity imperils their timing predictability and certification. Recently, the Measurement-Based Probabilistic Timing Analysis (MBPTA) technique emerged as an alternative to deal with hardware/software complexity. The innovation that MBPTA brings about is, however, a major step from current certification procedures and standards. The particular contributions of this Thesis include: (i) the definition of certification arguments for mixed-criticality integration upon multicore processors. In particular we propose a set of safety mechanisms and procedures as required to comply with functional safety standards. For timing predictability, (ii) we present a quantitative approach to assess the likelihood of execution-time exceedance events with respect to the risk reduction requirements on safety standards. To this end, we build upon the MBPTA approach and we present the design of a safety-related source of randomization (SoR), that plays a key role in the platform-level randomization needed by MBPTA. And (iii) we evaluate current certification guidance with respect to emerging high performance design trends like caches. Overall, this Thesis pushes the certification limits in the use of multicore and MBPTA technology in Critical Real-Time Embedded Systems (CRTES) and paves the way towards their adoption in industry.Una creciente variedad de sistemas emergentes reemplazan o aumentan la funcionalidad de subsistemas mecánicos con componentes electrónicos embebidos. El aumento en la cantidad y complejidad de dichos subsistemas electrónicos así como su cometido, hacen de su seguridad una cuestión de creciente importancia. Tanto es así que la comercialización de estos sistemas críticos está sujeta a rigurosos procesos de certificación donde se garantiza la seguridad del sistema mediante estrictas restricciones en el proceso de desarrollo y diseño de su hardware y software. Esta tesis trata de abordar los nuevos retos y dificultades dadas por la introducción de procesadores multi-núcleo en dichos sistemas críticos: aunque su mayor rendimiento despierta el interés de la industria para integrar múltiples aplicaciones en una sola plataforma, suponen una mayor complejidad. Su arquitectura desafía su análisis temporal mediante los métodos tradicionales y, asimismo, su certificación es cada vez más compleja y costosa. Con el fin de lidiar con estas limitaciones, recientemente se ha desarrollado una novedosa técnica de análisis temporal probabilístico basado en medidas (MBPTA). La innovación de esta técnica, sin embargo, supone un gran cambio cultural respecto a los estándares y procedimientos tradicionales de certificación. En esta línea, las contribuciones de esta tesis están agrupadas en tres ejes principales: (i) definición de argumentos de seguridad para la certificación de aplicaciones de criticidad-mixta sobre plataformas multi-núcleo. Se definen, en particular, mecanismos de seguridad, técnicas de diagnóstico y reacción de faltas acorde con el estándar IEC 61508 sobre una arquitectura multi-núcleo de referencia. Respecto al análisis temporal, (ii) presentamos la cuantificación de la probabilidad de exceder un límite temporal y su relación con los requisitos de reducción de riesgos derivados de los estándares de seguridad funcional. Con este fin, nos basamos en la técnica MBPTA y presentamos el diseño de una fuente de números aleatorios segura; un componente clave para conseguir las propiedades aleatorias requeridas por MBPTA a nivel de plataforma. Por último, (iii) extrapolamos las guías actuales para la certificación de arquitecturas multi-núcleo a una solución comercial de 8 núcleos y las evaluamos con respecto a las tendencias emergentes de diseño de alto rendimiento (caches). Con estas contribuciones, esta tesis trata de abordar los retos que el uso de procesadores multi-núcleo y MBPTA implican en el proceso de certificación de sistemas críticos de tiempo real y facilita, de esta forma, su adopción por la industria.Postprint (published version

Modeling, Analysis and Design of Reliable Digital Imaging System

Charge Coupled Device (CCD) is one of the most popular imaging sensors such as digital camera, digital camcorders, and digital x-ray diagnosis systems to mention a few. As the need for high resolution and high sensitive CCDs, high yield and solid reliability are becoming critical requirements for CCDs. In this context, soft-test/repair method must be developed to achieve high yield and reliability for CCDs. The purpose of this study was to propose soft-test and repair methods for defective pixels in CCD system, thereby realizing more reliable and cost-effective CCD Systems. Various test/repair algorithms are proposed and verified, and BIST/BISR architecture was proposed and the design was verified through verilog HDL simulation. Extensive parametric simulation results are also shown.Computer Science Departmen

Observation mechanisms for in-field software-based self-test

When electronic systems are used in safety critical applications, as in the space, avionic, automotive or biomedical areas, it is required to maintain a very low probability of failures due to faults of any kind. Standards and regulations play a significant role, forcing companies to devise and adopt solutions able to achieve predefined targets in terms of dependability. Different techniques can be used to reduce fault occurrence or to minimize the probability that those faults produce critical failures (e.g., by introducing redundancy). Unfortunately, most of these techniques have a severe impact on the cost of the resulting product and, in some cases, the probability of failures is too large anyway. Hence, a solution commonly used in several scenarios lies on periodically performing a test able to detect the occurrence of any fault before it produces a failure (in-field test). This solution is normally based on forcing the processor inside the Device Under Test to execute a properly written test program, which is able to activate possible faults and to make their effects visible in some observable locations. This approach is also called Software-Based Self-Test, or SBST. If compared with testing in an end of manufacturing scenario, in-field testing has strong limitations in terms of access to the system inputs and outputs because Design for Testability structures and testing equipment are usually not available. As a consequence there are reduced possibilities to activate the faults and to observe their effects. This reduced observability particularly affects the ability to detect performance faults, i.e. faults that modify the timing but not the final value of computations. This kind of faults are hard to detect by only observing the final content of predefined memory locations, that is the usual test result observation method used in-field. Initially, the present work was focused on fault tolerance techniques against transient faults induced by ionizing radiation, the so called Single Event Upsets (SEUs). The main contribution of this early stage of the thesis lies in the experimental validation of the feasibility of achieving a safe system by using an architecture that combines task-level redundancy with already available IP cores, thus minimizing the development time. Task execution is replicated and Memory Protection is used to guarantee that any SEU may affect one and only one of the replicas. A proof of concept implementation was developed and validated using fault injection. Results outline the effectiveness of the architecture, and the overhead analysis shows that the proposed architecture is effective in reducing the resource occupation with respect to N-modular redundancy, at an affordable cost in terms of application execution time. The main part of the thesis is focused on in-field software-based self-test of permanent faults. A set of observation methods exploiting existing or ad-hoc hardware is proposed, aimed at obtaining a better coverage, in particular of performance faults. An extensive quantitative evaluation of the proposed methods is presented, including a comparison with the observation methods traditionally used in end of manufacturing and in-field testing. Results show that the proposed methods are a good complement to the traditionally used final memory content observation. Moreover, they show that an adequate combination of these complementary methods allows for achieving nearly the same fault coverage achieved when continuously observing all the processor outputs, which is an observation method commonly used for production test but usually not available in-field. A very interesting by-product of what is described above is a detailed description of how to compute the fault coverage achieved by functional in-field tests using a conventional fault simulator, a tool that is usually applied in an end of manufacturing testing scenario. Finally, another relevant result in the testing area is a method to detect permanent faults inside the cache coherence logic integrated in each cache controller of a multi-core system, based on the concurrent execution of a test program by the different cores in a coordinated manner. By construction, the method achieves full fault coverage of the static faults in the addressed logic.Cuando se utilizan sistemas electrónicos en aplicaciones críticas como en las áreas biomédica, aeroespacial o automotriz, se requiere mantener una muy baja probabilidad de malfuncionamientos debidos a cualquier tipo de fallas. Los estándares y normas juegan un papel importante, forzando a los desarrolladores a diseñar y adoptar soluciones que sean capaces de alcanzar objetivos predefinidos en cuanto a seguridad y confiabilidad. Pueden utilizarse diferentes técnicas para reducir la ocurrencia de fallas o para minimizar la probabilidad de que esas fallas produzcan mal funcionamientos críticos, por ejemplo a través de la incorporación de redundancia. Lamentablemente, muchas de esas técnicas afectan en gran medida el costo de los productos y, en algunos casos, la probabilidad de malfuncionamiento sigue siendo demasiado alta. En consecuencia, una solución usada a menudo en varios escenarios consiste en realizar periódicamente un test que sea capaz de detectar la ocurrencia de una falla antes de que esta produzca un mal funcionamiento (test en campo). En general, esta solución se basa en forzar a un procesador existente dentro del dispositivo bajo prueba a ejecutar un programa de test que sea capaz de activar las posibles fallas y de hacer que sus efectos sean visibles en puntos observables. A esta metodología también se la llama auto-test basado en software, o en inglés Software-Based Self-Test (SBST). Si se lo compara con un escenario de test de fin de fabricación, el test en campo tiene fuertes limitaciones en términos de posibilidad de acceso a las entradas y salidas del sistema, porque usualmente no se dispone de equipamiento de test ni de la infraestructura de Design for Testability. En consecuencia se tiene menos posibilidades de activar las fallas y de observar sus efectos. Esta observabilidad reducida afecta particularmente la habilidad para detectar fallas de performance, es decir fallas que modifican la temporización pero no el resultado final de los cálculos. Este tipo de fallas es difícil de detectar por la sola observación del contenido final de lugares de memoria, que es el método usual que se utiliza para observar los resultados de un test en campo. Inicialmente, el presente trabajo estuvo enfocado en técnicas para tolerar fallas transitorias inducidas por radiación ionizante, llamadas en inglés Single Event Upsets (SEUs). La principal contribución de esa etapa inicial de la tesis reside en la validación experimental de la viabilidad de obtener un sistema seguro, utilizando una arquitectura que combina redundancia a nivel de tareas con el uso de módulos hardware (IP cores) ya disponibles, que minimiza en consecuencia el tiempo de desarrollo. Se replica la ejecución de las tareas y se utiliza protección de memoria para garantizar que un SEU pueda afectar a lo sumo a una sola de las réplicas. Se desarrolló una implementación para prueba de concepto que fue validada mediante inyección de fallas. Los resultados muestran la efectividad de la arquitectura, y el análisis de los recursos utilizados muestra que la arquitectura propuesta es efectiva en reducir la ocupación con respecto a la redundancia modular con N réplicas, a un costo accesible en términos de tiempo de ejecución. La parte principal de esta tesis se enfoca en el área de auto-test en campo basado en software para la detección de fallas permanentes. Se propone un conjunto de métodos de observación utilizando hardware existente o ad-hoc, con el fin de obtener una mejor cobertura, en particular de las fallas de performance. Se presenta una extensa evaluación cuantitativa de los métodos propuestos, que incluye una comparación con los métodos tradicionalmente utilizados en tests de fin de fabricación y en campo. Los resultados muestran que los métodos propuestos son un buen complemento del método tradicionalmente usado que consiste en observar el valor final del contenido de memoria. Además muestran que una adecuada combinación de estos métodos complementarios permite alcanzar casi los mismos valores de cobertura de fallas que se obtienen mediante la observación continua de todas las salidas del procesador, método comúnmente usado en tests de fin de fabricación, pero que usualmente no está disponible en campo. Un subproducto muy interesante de lo arriba expuesto es la descripción detallada del procedimiento para calcular la cobertura de fallas lograda mediante tests funcionales en campo por medio de un simulador de fallas convencional, una herramienta que usualmente se aplica en escenarios de test de fin de fabricación. Finalmente, otro resultado relevante en el área de test es un método para detectar fallas permanentes dentro de la lógica de coherencia de cache que está integrada en el controlador de cache de cada procesador en un sistema multi procesador. El método está basado en la ejecución de un programa de test en forma coordinada por parte de los diferentes procesadores. Por construcción, el método cubre completamente las fallas de la lógica mencionad

Adaptive Distributed Architectures for Future Semiconductor Technologies.

Year after year semiconductor manufacturing has been able to integrate more components in a single computer chip. These improvements have been possible through systematic shrinking in the size of its basic computational element, the transistor. This trend has allowed computers to progressively become faster, more efficient and less expensive. As this trend continues, experts foresee that current computer designs will face new challenges, in utilizing the minuscule devices made available by future semiconductor technologies. Today's microprocessor designs are not fit to overcome these challenges, since they are constrained by their inability to handle component failures by their lack of adaptability to a wide range of custom modules optimized for specific applications and by their limited design modularity. The focus of this thesis is to develop original computer architectures, that can not only survive these new challenges, but also leverage the vast number of transistors available to unlock better performance and efficiency. The work explores and evaluates new software and hardware techniques to enable the development of novel adaptive and modular computer designs. The thesis first explores an infrastructure to quantitatively assess the fallacies of current systems and their inadequacy to operate on unreliable silicon. In light of these findings, specific solutions are then proposed to strengthen digital system architectures, both through hardware and software techniques. The thesis culminates with the proposal of a radically new architecture design that can fully adapt dynamically to operate on the hardware resources available on chip, however limited or abundant those may be.PHDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/102405/1/apellegr_1.pd

DeSyRe: On-demand system reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect-/fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints. (C) 2013 Elsevier B.V. All rights reserved

Design and Validation of Network-on-Chip Architectures for the Next Generation of Multi-synchronous, Reliable, and Reconfigurable Embedded Systems

NETWORK-ON-CHIP (NoC) design is today at a crossroad. On one hand, the design principles to efficiently implement interconnection networks in the resource-constrained on-chip setting have stabilized. On the other hand, the requirements on embedded system design are far from stabilizing. Embedded systems are composed by assembling together heterogeneous components featuring differentiated operating speeds and ad-hoc counter measures must be adopted to bridge frequency domains. Moreover, an unmistakable trend toward enhanced reconfigurability is clearly underway due to the increasing complexity of applications. At the same time, the technology effect is manyfold since it provides unprecedented levels of system integration but it also brings new severe constraints to the forefront: power budget restrictions, overheating concerns, circuit delay and power variability, permanent fault, increased probability of transient faults. Supporting different degrees of reconfigurability and flexibility in the parallel hardware platform cannot be however achieved with the incremental evolution of current design techniques, but requires a disruptive approach and a major increase in complexity. In addition, new reliability challenges cannot be solved by using traditional fault tolerance techniques alone but the reliability approach must be also part of the overall reconfiguration methodology. In this thesis we take on the challenge of engineering a NoC architectures for the next generation systems and we provide design methods able to overcome the conventional way of implementing multi-synchronous, reliable and reconfigurable NoC. Our analysis is not only limited to research novel approaches to the specific challenges of the NoC architecture but we also co-design the solutions in a single integrated framework. Interdependencies between different NoC features are detected ahead of time and we finally avoid the engineering of highly optimized solutions to specific problems that however coexist inefficiently together in the final NoC architecture. To conclude, a silicon implementation by means of a testchip tape-out and a prototype on a FPGA board validate the feasibility and effectivenes