18 research outputs found

    On the Reliability Assessment of Artificial Neural Networks Running on AI-Oriented MPSoCs

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    Nowadays, the usage of electronic devices running artificial neural networks (ANNs)-based applications is spreading in our everyday life. Due to their outstanding computational capabilities, ANNs have become appealing solutions for safety-critical systems as well. Frequently, they are considered intrinsically robust and fault tolerant for being brain-inspired and redundant computing models. However, when ANNs are deployed on resource-constrained hardware devices, single physical faults may compromise the activity of multiple neurons. Therefore, it is crucial to assess the reliability of the entire neural computing system, including both the software and the hardware components. This article systematically addresses reliability concerns for ANNs running on multiprocessor system-on-a-chips (MPSoCs). It presents a methodology to assign resilience scores to individual neurons and, based on that, schedule the workload of an ANN on the target MPSoC so that critical neurons are neatly distributed among the available processing elements. This reliability-oriented methodology exploits an integer linear programming solver to find the optimal solution. Experimental results are given for three different convolutional neural networks trained on MNIST, SVHN, and CIFAR-10. We carried out a comprehensive assessment on an open-source artificial intelligence-based RISC-V MPSoC. The results show the reliability improvements of the proposed methodology against the traditional scheduling

    Miniaturized Transistors, Volume II

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    In this book, we aim to address the ever-advancing progress in microelectronic device scaling. Complementary Metal-Oxide-Semiconductor (CMOS) devices continue to endure miniaturization, irrespective of the seeming physical limitations, helped by advancing fabrication techniques. We observe that miniaturization does not always refer to the latest technology node for digital transistors. Rather, by applying novel materials and device geometries, a significant reduction in the size of microelectronic devices for a broad set of applications can be achieved. The achievements made in the scaling of devices for applications beyond digital logic (e.g., high power, optoelectronics, and sensors) are taking the forefront in microelectronic miniaturization. Furthermore, all these achievements are assisted by improvements in the simulation and modeling of the involved materials and device structures. In particular, process and device technology computer-aided design (TCAD) has become indispensable in the design cycle of novel devices and technologies. It is our sincere hope that the results provided in this Special Issue prove useful to scientists and engineers who find themselves at the forefront of this rapidly evolving and broadening field. Now, more than ever, it is essential to look for solutions to find the next disrupting technologies which will allow for transistor miniaturization well beyond silicon’s physical limits and the current state-of-the-art. This requires a broad attack, including studies of novel and innovative designs as well as emerging materials which are becoming more application-specific than ever before

    Design Space Exploration and Resource Management of Multi/Many-Core Systems

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    The increasing demand of processing a higher number of applications and related data on computing platforms has resulted in reliance on multi-/many-core chips as they facilitate parallel processing. However, there is a desire for these platforms to be energy-efficient and reliable, and they need to perform secure computations for the interest of the whole community. This book provides perspectives on the aforementioned aspects from leading researchers in terms of state-of-the-art contributions and upcoming trends

    MOCAST 2021

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    The 10th International Conference on Modern Circuit and System Technologies on Electronics and Communications (MOCAST 2021) will take place in Thessaloniki, Greece, from July 5th to July 7th, 2021. The MOCAST technical program includes all aspects of circuit and system technologies, from modeling to design, verification, implementation, and application. This Special Issue presents extended versions of top-ranking papers in the conference. The topics of MOCAST include:Analog/RF and mixed signal circuits;Digital circuits and systems design;Nonlinear circuits and systems;Device and circuit modeling;High-performance embedded systems;Systems and applications;Sensors and systems;Machine learning and AI applications;Communication; Network systems;Power management;Imagers, MEMS, medical, and displays;Radiation front ends (nuclear and space application);Education in circuits, systems, and communications

    Air Force Institute of Technology Research Report 2019

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    This Research Report presents the FY19 research statistics and contributions of the Graduate School of Engineering and Management (EN) at AFIT. AFIT research interests and faculty expertise cover a broad spectrum of technical areas related to USAF needs, as reflected by the range of topics addressed in the faculty and student publications listed in this report. In most cases, the research work reported herein is directly sponsored by one or more USAF or DOD agencies. AFIT welcomes the opportunity to conduct research on additional topics of interest to the USAF, DOD, and other federal organizations when adequate manpower and financial resources are available and/or provided by a sponsor. In addition, AFIT provides research collaboration and technology transfer benefits to the public through Cooperative Research and Development Agreements (CRADAs). Interested individuals may discuss ideas for new research collaborations, potential CRADAs, or research proposals with individual faculty using the contact information in this document

    Wide Bandgap Based Devices: Design, Fabrication and Applications, Volume II

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    Wide bandgap (WBG) semiconductors are becoming a key enabling technology for several strategic fields, including power electronics, illumination, and sensors. This reprint collects the 23 papers covering the full spectrum of the above applications and providing contributions from the on-going research at different levels, from materials to devices and from circuits to systems

    Mathematics in Software Reliability and Quality Assurance

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    This monograph concerns the mathematical aspects of software reliability and quality assurance and consists of 11 technical papers in this emerging area. Included are the latest research results related to formal methods and design, automatic software testing, software verification and validation, coalgebra theory, automata theory, hybrid system and software reliability modeling and assessment

    Air Force Institute of Technology Research Report 2018

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    This Research Report presents the FY18 research statistics and contributions of the Graduate School of Engineering and Management (EN) at AFIT. AFIT research interests and faculty expertise cover a broad spectrum of technical areas related to USAF needs, as reflected by the range of topics addressed in the faculty and student publications listed in this report. In most cases, the research work reported herein is directly sponsored by one or more USAF or DOD agencies. AFIT welcomes the opportunity to conduct research on additional topics of interest to the USAF, DOD, and other federal organizations when adequate manpower and financial resources are available and/or provided by a sponsor. In addition, AFIT provides research collaboration and technology transfer benefits to the public through Cooperative Research and Development Agreements (CRADAs). Interested individuals may discuss ideas for new research collaborations, potential CRADAs, or research proposals with individual faculty using the contact information in this document

    Faculty Publications & Presentations, 2005-2006

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    Interim research assessment 2003-2005 - Computer Science

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    This report primarily serves as a source of information for the 2007 Interim Research Assessment Committee for Computer Science at the three technical universities in the Netherlands. The report also provides information for others interested in our research activities
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