Sorry, we couldn’t find any results for “2016 JETTA-TTTC Best Paper Award - Masahiro Ishida, Toru Nakura, Takashi Kusaka, Satoshi Komatsu and Kunihiro Asada, "Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing, " Journal of Electronic Testing: Theory and Applications, Volume 32, Number 3, pp. 247-271. June 2016.”.

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