27 research outputs found

    Flash-based security primitives: Evolution, challenges and future directions

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    Over the last two decades, hardware security has gained increasing attention in academia and industry. Flash memory has been given a spotlight in recent years, with the question of whether or not it can prove useful in a security role. Because of inherent process variation in the characteristics of flash memory modules, they can provide a unique fingerprint for a device and have thus been proposed as locations for hardware security primitives. These primitives include physical unclonable functions (PUFs), true random number generators (TRNGs), and integrated circuit (IC) counterfeit detection. In this paper, we evaluate the efficacy of flash memory-based security primitives and categorize them based on the process variations they exploit, as well as other features. We also compare and evaluate flash-based security primitives in order to identify drawbacks and essential design considerations. Finally, we describe new directions, challenges of research, and possible security vulnerabilities for flash-based security primitives that we believe would benefit from further exploration

    Cost-Efficient Soft-Error Resiliency for ASIP-based Embedded Systems

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    Recent decades have witnessed the rapid growth of embedded systems. At present, embedded systems are widely applied in a broad range of critical applications including automotive electronics, telecommunication, healthcare, industrial electronics, consumer electronics military and aerospace. Human society will continue to be greatly transformed by the pervasive deployment of embedded systems. Consequently, substantial amount of efforts from both industry and academic communities have contributed to the research and development of embedded systems. Application-specific instruction-set processor (ASIP) is one of the key advances in embedded processor technology, and a crucial component in some embedded systems. Soft errors have been directly observed since the 1970s. As devices scale, the exponential increase in the integration of computing systems occurs, which leads to correspondingly decrease in the reliability of computing systems. Today, major research forums state that soft errors are one of the major design technology challenges at and beyond the 22 nm technology node. Therefore, a large number of soft-error solutions, including error detection and recovery, have been proposed from differing perspectives. Nonetheless, most of the existing solutions are designed for general or high-performance systems which are different to embedded systems. For embedded systems, the soft-error solutions must be cost-efficient, which requires the tailoring of the processor architecture with respect to the feature of the target application. This thesis embodies a series of explorations for cost-efficient soft-error solutions for ASIP-based embedded systems. In this exploration, five major solutions are proposed. The first proposed solution realizes checkpoint recovery in ASIPs. By generating customized instructions, ASIP-implemented checkpoint recovery can perform at a finer granularity than what was previously possible. The fault-free performance overhead of this solution is only 1.45% on average. The recovery delay is only 62 cycles at the worst case. The area and leakage power overheads are 44.4% and 45.6% on average. The second solution explores utilizing two primitive error recovery techniques jointly. This solution includes three application-specific optimization methodologies. This solution generates the optimized error-resilient ASIPs, based on the characteristics of primitive error recovery techniques, static reliability analysis and design constraints. The resultant ASIP can be configured to perform at runtime according to the optimized recovery scheme. This solution can strategically enhance cost-efficiency for error recovery. In order to guarantee cost-efficiency in unpredictable runtime situations, the third solution explores runtime adaptation for error recovery. This solution aims to budget and adapt the error recovery operations, so as to spend the resources intelligently and to tolerate adverse influences of runtime variations. The resultant ASIP can make runtime decisions to determine the activation of spatial and temporal redundancies, according to the runtime situations. At the best case, this solution can achieve almost 50x reliability gain over the state of the art solutions. Given the increasing demand for multi-core computing systems, the last two proposed solutions target error recovery in multi-core ASIPs. The first solution of these two explores ASIP-implemented fine-grained process migration. This solution is a key infrastructure, which allows cost-efficient task management, for realizing cost-efficient soft-error recovery in multi-core ASIPs. The average time cost is only 289 machine cycles to perform process migration. The last solution explores using dynamic and adaptive mapping to assign heterogeneous recovery operations to the tasks in the multi-core context. This solution allows each individual ASIP-based processing core to dynamically adapt its specific error recovery functionality according to the corresponding task's characteristics, in terms of soft error vulnerability and execution time deadline. This solution can significantly improve the reliability of the system by almost two times, with graceful constraint penalty, in comparison to the state-of-the-art counterparts

    A Survey on the Integration of NAND Flash Storage in the Design of File Systems and the Host Storage Software Stack

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    With the ever-increasing amount of data generate in the world, estimated to reach over 200 Zettabytes by 2025, pressure on efficient data storage systems is intensifying. The shift from HDD to flash-based SSD provides one of the most fundamental shifts in storage technology, increasing performance capabilities significantly. However, flash storage comes with different characteristics than prior HDD storage technology. Therefore, storage software was unsuitable for leveraging the capabilities of flash storage. As a result, a plethora of storage applications have been design to better integrate with flash storage and align with flash characteristics. In this literature study we evaluate the effect the introduction of flash storage has had on the design of file systems, which providing one of the most essential mechanisms for managing persistent storage. We analyze the mechanisms for effectively managing flash storage, managing overheads of introduced design requirements, and leverage the capabilities of flash storage. Numerous methods have been adopted in file systems, however prominently revolve around similar design decisions, adhering to the flash hardware constrains, and limiting software intervention. Future design of storage software remains prominent with the constant growth in flash-based storage devices and interfaces, providing an increasing possibility to enhance flash integration in the host storage software stack

    A Survey on the Integration of NAND Flash Storage in the Design of File Systems and the Host Storage Software Stack

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    With the ever-increasing amount of data generate in the world, estimated to reach over 200 Zettabytes by 2025, pressure on efficient data storage systems is intensifying. The shift from HDD to flash-based SSD provides one of the most fundamental shifts in storage technology, increasing performance capabilities significantly. However, flash storage comes with different characteristics than prior HDD storage technology. Therefore, storage software was unsuitable for leveraging the capabilities of flash storage. As a result, a plethora of storage applications have been design to better integrate with flash storage and align with flash characteristics. In this literature study we evaluate the effect the introduction of flash storage has had on the design of file systems, which providing one of the most essential mechanisms for managing persistent storage. We analyze the mechanisms for effectively managing flash storage, managing overheads of introduced design requirements, and leverage the capabilities of flash storage. Numerous methods have been adopted in file systems, however prominently revolve around similar design decisions, adhering to the flash hardware constrains, and limiting software intervention. Future design of storage software remains prominent with the constant growth in flash-based storage devices and interfaces, providing an increasing possibility to enhance flash integration in the host storage software stack

    Satisfiability-Based Methods for Digital Circuit Design, Debug, and Optimization

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    Designing digital circuits well is notoriously difficult. This difficulty stems in part from the very many degrees of freedom inherent in circuit design, typically coupled with the need to satisfy various constraints. In this thesis, we demonstrate how formulations of satisfiability problems can be used automatically to complete a design, or to find a specific design architecture that satisfies certain constraints; how these can be used to create, debug, and optimize designs; and introduce a domain-specific language particularly well-suited for satisfiability-assisted design, debug, and optimization. In the first application, we show how explicit uncertainties called âholesâ can both be natural to use and conducive to the creation of formal satisfiability problems useful for designing circuits. We further develop a Scala-hosted Domain Specific Language (DSL) with appropriate syntactic sugar to make design with holes easy and effective. We then show how, utilizing the same kind of satisfiability formulation, we can automatically instrument a given buggy design to replace suspicious syntax fragments with potentially-correct alternatives. The satisfiability solver then determines if there is any possible set of alternative fragments which fix the bug. We also demonstrate that this approach is reasonably scalable, in part because there is less need for a fully-precise specification in the formulation of the satisfiability problem. We then advance beyond mere hole-filling and show how a tight integration of design elaboration with satisfiability solvers allows totally new approaches. To point, we use this tight integration to create the first known methods to optimize Gate-Level Information Flow Track- ing (GLIFT) model circuits and to make principled trade-offs in their precision. Finally, integrating all the previous work, we propose a more powerful DSL specifically designed to address the shortcomings of the first âhole-fillingâ language. This language, which we call Nasadiya, affords more general integrations of satisfiability into circuit design and optimization, and provides built-in modeling functionality useful for optimizing extra-functional properties like critical path delay and circuit area. We demonstrate the utility of these features by implementing an automatic power optimizer for a popular type of parallel prefix adders

    MOCAST 2021

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    The 10th International Conference on Modern Circuit and System Technologies on Electronics and Communications (MOCAST 2021) will take place in Thessaloniki, Greece, from July 5th to July 7th, 2021. The MOCAST technical program includes all aspects of circuit and system technologies, from modeling to design, verification, implementation, and application. This Special Issue presents extended versions of top-ranking papers in the conference. The topics of MOCAST include:Analog/RF and mixed signal circuits;Digital circuits and systems design;Nonlinear circuits and systems;Device and circuit modeling;High-performance embedded systems;Systems and applications;Sensors and systems;Machine learning and AI applications;Communication; Network systems;Power management;Imagers, MEMS, medical, and displays;Radiation front ends (nuclear and space application);Education in circuits, systems, and communications

    Analogue filter networks: developments in theory, design and analyses

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    Dependable Embedded Systems

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    This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

    Solid State Circuits Technologies

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    The evolution of solid-state circuit technology has a long history within a relatively short period of time. This technology has lead to the modern information society that connects us and tools, a large market, and many types of products and applications. The solid-state circuit technology continuously evolves via breakthroughs and improvements every year. This book is devoted to review and present novel approaches for some of the main issues involved in this exciting and vigorous technology. The book is composed of 22 chapters, written by authors coming from 30 different institutions located in 12 different countries throughout the Americas, Asia and Europe. Thus, reflecting the wide international contribution to the book. The broad range of subjects presented in the book offers a general overview of the main issues in modern solid-state circuit technology. Furthermore, the book offers an in depth analysis on specific subjects for specialists. We believe the book is of great scientific and educational value for many readers. I am profoundly indebted to the support provided by all of those involved in the work. First and foremost I would like to acknowledge and thank the authors who worked hard and generously agreed to share their results and knowledge. Second I would like to express my gratitude to the Intech team that invited me to edit the book and give me their full support and a fruitful experience while working together to combine this book
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