319,774 research outputs found
Scanning Electron Microscopy (SEM) Portfolio 2016
Portfolio for the Scanning Electron Microscopy course, Fall 2016. Submitted to Dr. Susan Anagnost
Microscopy of glazed layers formed during high temperature sliding wear at 750C
The evolution of microstructures in the glazed layer formed during high temperature sliding wear of Nimonic 80A against Stellite 6 at 750 ◦C using a speed of 0.314ms−1 under a load of 7N has been investigated using scanning electron microscopy (SEM), energy dispersive analysis by X-ray (EDX), X-ray diffraction (XRD) analysis, scanning tunnelling microscopy (STM) and transmission electron microscopy (TEM). The results indicate the formation of a wear resistant nano-structured glazed layer. The mechanisms responsible for the formation of the nano-polycrystalline glazed layer are discussed
A scanning electron microscopy study of the macro-crystalline structure of 2-(2,4-dinitrobenzyl) pyridine
The compound, 2-(2,4-dinitrobenzyl) pyridine, was synthesized in the laboratory; an introductory level electron microscopy study of the macro-crystalline structure was conducted using the scanning electron microscope (SEM). The structure of these crystals was compared with the macrostructure of the crystal of 2-(2,4-dinitrobenzyl) pyridinium bromide, the hydrobromic salt of the compound which was also synthesized in the laboratory. A scanning electron microscopy crystal study was combined with a study of the principle of the electron microscope
Effects of surface chemistry on hot corrosion life
Hot corrosion life prediction methodology based on a combination of laboratory test data and field service turbine components, which show evidence of hot corrosion, were examined. Components were evaluated by optical metallography, scanning electron microscopy (SEM), and electron micropulse (EMP) examination
A fundamental approach to adhesion: Synthesis, surface analysis, thermodynamics and mechanics
Pretreated and primed Ti 6-4 surfaces were characterized by scanning electron microscopy/energy dispersive analysis of X-rays (SEM/EDAX) and electron spectroscopy for chemical analysis (ESCA). Fractured lap shear bonded Ti 6-4 specimens were also characterized by SEM/EDAX and ESCA. A number of surface techniques were used to characterize Ti02 powders
Residual strain in free-standing CdTe nanowires overgrown with HgTe
We investigate the crystal properties of CdTe nanowires overgrown with HgTe.
Scanning electron microscopy (SEM) and scanning transmission electron
microscopy (STEM) confirm, that the growth results in a high ensemble
uniformity and that the individual heterostructures are single-crystalline,
respectively. We use high-resolution X-ray diffraction (HRXRD) to investigate
strain, caused by the small lattice mismatch between the two materials. We find
that both CdTe and HgTe show changes in lattice constant compared to the
respective bulk lattice constants. The measurements reveal a complex strain
pattern with signatures of both uniaxial and shear strains present in the
overgrown nanowires
Electronic Trap Microscopy - A New Mode for Scanning Electron Microscopy (SEM)
Insulating layers on conducting substrate are investigated by means of secondary electron field emission SEFE in a digital SEM. The kinetics of charge storage and release with time and temperature are controlled and recorded by an external computer.The evaluation is performed pixel-wise with respect to electronic trap concentration nt0, trap capture cross section σc and thermal activation energy Et. Mapping of these trap parameters indicates hidden inhomogenities, defects and pre-treatments of the dielectric layers as well as the pattern of thermal bleaching and release of electrons. The latter ones appear as inhomogeneous processes starting with blinking centers and increasing their concentration with time and temperature
A combined FEG-SEM and TEM study of silicon nanodot assembly
Nanodots forming dense assembly on a substrate are difficult to characterize in terms of size, density, morphology and cristallinity. The present study shows how valuable information can be obtained by a combination of electron microscopy techniques. A silicon nanodots deposit has been studied by Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) to estimate essentially the dot size and density, quantities emphasized because of their high interest for application. High resolution SEM indicates a density of 1.6 × 1012 dots/cm2 for a 5 nm to 10 nm dot size. TEM imaging using a phase retrieval treatment of a focus series gives a higher dot density (2 × 1012 dots/cm2) for a 5 nm dot size. High Resolution Transmission Electron Microscopy (HRTEM) indicates that the dots are crystalline which is confirmed by electron diffraction. According to HRTEM and electron diffraction, the dot size is about 3 nm which is significantly smaller than the SEM and TEM results. These differences are not contradictory but attributed to the fact that each technique is probing a different phenomenon. A core-shell structure for the dot is proposed which reconcile all the results. All along the study, Fourier transforms have been widely used under many aspects
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