Main characteristics of test device.

Main characteristics of test device.</p

Indexes on cutting speed.

(a) Maximum cutting force on number of cut sets, (b) Useful power consumption on number of cut sets, (c) Cut surface quality grade on number of cut sets. Note: other factors were at level 3.</p

Indexes on number of cut sets.

(a) Maximum cutting force on number of cut sets, (b) Useful power consumption on number of cut sets, (c) Cut surface quality grade on number of cut sets. Note: other factors were at level 3.</p

Indexes on edge angle of thick cutter.

(a) Maximum cutting force on number of cut sets, (b) Useful power consumption on number of cut sets, (c) Cut surface quality grade on number of cut sets. Note: other factors were at level 3.</p

Structure diagram of banana crown cutting tool of combined cutters way.

(a) Front view, (b) Top view. 1. Thick cutter, 2. Guide rod cylinder, 3. Cylinder support frame, 4. Cutter dish, 5. Pin, 6. Connecting rod, 7. Stepper motor, 8. Cam, 9. Integral bearing, 10. Block, 11. Synchronous belt, 12. Linear bearing of flange type, 13. Stepper motor controller, 14. Axis, 15. Hollow rivet, 16. Thin cutter, 17. Hole for banana rachis.</p

Experimental prototype.

Experimental prototype.</p

Effect of cutting force on displacement.

Note: Diameter of banana rachis is between 45 and 50 mm, cutting speed is 40 mm/s, number of cut sets are 5, angle between thick cutter and axis of banana rachis is 5°, width of thick cutter is 12 mm, thickness of thick cutter is 3 mm, edge angle of thick cutter is 20°, width of thin cutter is 12mm, and thickness of thin cutter is 0.3 mm.</p

Free-body diagram of cutter cutting banana crown.

1. Banana rachis, 2. Banana crown, 3. Banana hand, 4. Cutter.</p

Levels of experimental factors.

Levels of experimental factors.</p

Structure diagram of test device.

(a) Front view, (b) Top view. 1. Thin cutter, 2. Hollow rivets, 3. Thick cutter, 4.slider, 5. Axis, 6. sliding rail, 7. Integral bearing, 8. Screw, 9. Bottom.</p