14 research outputs found
PCE, FF, J<sub>sc</sub>, and V<sub>oc</sub> of OPVs fabricated using different additive solvents.
<p>PCE, FF, J<sub>sc</sub>, and V<sub>oc</sub> of OPVs fabricated using different additive solvents.</p
SEM image of the MoO<sub>3</sub> thin film fabricated by the spin-coating process.
<p>The concentration of MoO<sub>3</sub> aqueous solution was 0.05 wt%.</p
Current-density-voltage characteristics of OPVs incorporating MoO<sub>3</sub> layer fabricated using different concentrations of acetone.
<p>Current-density-voltage characteristics of OPVs incorporating MoO<sub>3</sub> layer fabricated using different concentrations of acetone.</p
OPV characteristics as a function of acetone concentration.
<p>OPV characteristics as a function of acetone concentration.</p
AFM images of MoO<sub>3</sub> thin films fabricated using different concentrations of acetone.
<p>Concentrations were (a) 0, (b) 20, (c) 30, (d) 40, and (e) 50 vol%.</p
Current-density-voltage characteristics of OPVs with MoO<sub>3</sub> layers fabricated using different additive solvents.
<p>Current-density-voltage characteristics of OPVs with MoO<sub>3</sub> layers fabricated using different additive solvents.</p
Schematic configuration of the ESD setup.
<p>Schematic configuration of the ESD setup.</p
SEM images of MoO<sub>3</sub> thin films fabricated with different concentrations of acetone.
<p>Concentrations ranged as (a) 0, (b) 20, (c) 30, (d) 40, and (e) 50 vol%.</p
