Three dimensions, two microscopes, one code: automatic differentiation for x-ray nanotomography beyond the depth of focus limit

Conventional tomographic reconstruction algorithms assume that one has obtained pure projection images, involving no within-specimen diffraction effects nor multiple scattering. Advances in x-ray nanotomography are leading towards the violation of these assumptions, by combining the high penetration power of x-rays which enables thick specimens to be imaged, with improved spatial resolution which decreases the depth of focus of the imaging system. We describe a reconstruction method where multiple scattering and diffraction effects in thick samples are modeled by multislice propagation, and the 3D object function is retrieved through iterative optimization. We show that the same proposed method works for both full-field microscopy, and for coherent scanning techniques like ptychography. Our implementation utilizes the optimization toolbox and the automatic differentiation capability of the open-source deep learning package TensorFlow, which demonstrates a much straightforward way to solve optimization problems in computational imaging, and endows our program great flexibility and portability

Using Automatic Differentiation as a General Framework for Ptychographic Reconstruction

Coherent diffraction imaging methods enable imaging beyond lens-imposed resolution limits. In these methods, the object can be recovered by minimizing an error metric that quantifies the difference between diffraction patterns as observed, and those calculated from a present guess of the object. Efficient minimization methods require analytical calculation of the derivatives of the error metric, which is not always straightforward. This limits our ability to explore variations of basic imaging approaches. In this paper, we propose to substitute analytical derivative expressions with the automatic differentiation method, whereby we can achieve object reconstruction by specifying only the physics-based experimental forward model. We demonstrate the generality of the proposed method through straightforward object reconstruction for a variety of complex ptychographic experimental models

A matrix-free Levenberg-Marquardt algorithm for efficient ptychographic phase retrieval

The phase retrieval problem, where one aims to recover a complex-valued image from far-field intensity measurements, is a classic problem encountered in a range of imaging applications. Modern phase retrieval approaches usually rely on gradient descent methods in a nonlinear minimization framework. Calculating closed-form gradients for use in these methods is tedious work, and formulating second order derivatives is even more laborious. Additionally, second order techniques often require the storage and inversion of large matrices of partial derivatives, with memory requirements that can be prohibitive for data-rich imaging modalities. We use a reverse-mode automatic differentiation (AD) framework to implement an efficient matrix-free version of the Levenberg-Marquardt (LM) algorithm, a longstanding method that finds popular use in nonlinear least-square minimization problems but which has seen little use in phase retrieval. Furthermore, we extend the basic LM algorithm so that it can be applied for general constrained optimization problems beyond just the least-square applications. Since we use AD, we only need to specify the physics-based forward model for a specific imaging application; the derivative terms are calculated automatically through matrix-vector products, without explicitly forming any large Jacobian or Gauss-Newton matrices. We demonstrate that this algorithm can be used to solve both the unconstrained ptychographic object retrieval problem and the constrained "blind" ptychographic object and probe retrieval problems, under both the Gaussian and Poisson noise models, and that this method outperforms best-in-class first-order ptychographic reconstruction methods: it provides excellent convergence guarantees with (in many cases) a superlinear rate of convergence, all with a computational cost comparable to, or lower than, the tested first-order algorithms

Bayesian optimization for autoalignment of an x-ray focusing system

We describe a multi-objective Bayesian Optimization routine to automatically align and stabilize an x-ray focusing system. We develop our technique in an ultra-realistic digital twin and implement it in a hard-x-ray synchrotron beamline

AutoFocus: AI-driven alignment of nanofocusing X-ray mirror systems

We describe the application of aan AI-driven system to autonomously align and focus complex x-ray mirror systems . The system has been developed and studied on a digital twin of nanofocusing X-ray beamlines, built using advanced optical simulation tools calibrated with wavefront sensing data collected at the beamline.We experimentally demonstrated that the system is systematically capable of positioning a focused beam on the sample, both by simulating the life cycle of the beamline with random perturbations due to typical variations in the light source and optical elements over time, and by conducting similar tests on an actual focusing system

Adorym: A multi-platform generic x-ray image reconstruction framework based on automatic differentiation

We describe and demonstrate an optimization-based x-ray image reconstruction framework called Adorym. Our framework provides a generic forward model, allowing one code framework to be used for a wide range of imaging methods ranging from near-field holography to and fly-scan ptychographic tomography. By using automatic differentiation for optimization, Adorym has the flexibility to refine experimental parameters including probe positions, multiple hologram alignment, and object tilts. It is written with strong support for parallel processing, allowing large datasets to be processed on high-performance computing systems. We demonstrate its use on several experimental datasets to show improved image quality through parameter refinement

Supplementary document for AutoFocus: AI-driven alignment of nanofocusing X-ray mirror systems - 6655208.pdf

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