23 research outputs found
Charge Transport in Dual Gated Bilayer Graphene with Corbino Geometry
The resistance of dual-gated bilayer graphene is measured as a function of temperature and gating electric fields in the Corbino geometry which precludes edge transport. The temperature-dependent resistance is quantitatively described by a two-channel conductance model including parallel thermal activation and variable range hopping channels, which gives the electric-field-dependent band gap whose magnitude is found to be in good agreement with infrared absorption experiments. Low-temperature transport is similar to that seen in previous studies of dual-gated bilayer graphene with edges, suggesting that edge transport does not play an important role
Charge Inhomogeneity Determines Oxidative Reactivity of Graphene on Substrates
Single-layer graphene (SLG) supported on SiO2 shows anomalously large chemical reactivity compared to thicker graphene, with charge inhomogeneity-induced potential fluctuations or topographic corrugations proposed as the cause. Here we systematically probe the oxidative reactivity of graphene supported on substrates with different surface roughnesses and charged impurity densities: hexagonal boron nitride (hBN), mica, thermally grown SiO2 on Si, and SiO2 nanoparticle thin films. SLG on low charge trap density hBN is not etched and shows little doping after oxygen treatment at temperatures up to 550 °C, in sharp contrast with oxidative etching under similar conditions of graphene on high charge trap density SiO2 and mica. Furthermore, bilayer graphene shows reduced reactivity compared to SLG regardless of its substrate-induced roughness. Together the observations indicate that graphene’s reactivity is predominantly controlled by charge inhomogeneity-induced potential fluctuations rather than surface roughness
Anisotropic Etching of Atomically Thin MoS<sub>2</sub>
Exposure to oxygen at 300–340
°C results in triangular etch pits with uniform orientation on
the surfaces of atomically thin molybdenum disulfide (MoS<sub>2</sub>), indicating anisotropic etching terminating on lattice planes.
The triangular pits grow laterally with oxidation time. The density
of pits scarcely depends on oxidation time, temperature, and MoS<sub>2</sub> thickness but varies significantly from sample to sample,
indicating that etching is initiated at native defect sites on the
basal plane surface rather than activated by substrate effects such
as charged impurities or surface roughness. Raman spectroscopy confirms
that oxygen treatment produces no molybdenum oxide (MoO<sub>3</sub>) below 340 °C. However, upon oxidation above 200 °C, the
Raman A<sub>1g</sub> mode upshifts and the linewidth decreases, indicating
p-type doping of MoS<sub>2</sub>. Oxidation at 400 °C results
in complete conversion to MoO<sub>3</sub>
Ambipolar Surface State Thermoelectric Power of Topological Insulator Bi<sub>2</sub>Se<sub>3</sub>
We measure gate-tuned thermoelectric
power of mechanically exfoliated
Bi<sub>2</sub>Se<sub>3</sub> thin films in the topological insulator
regime. The sign of the thermoelectric power changes across the charge
neutrality point as the majority carrier type switches from electron
to hole, consistent with the ambipolar electric field effect observed
in conductivity and Hall effect measurements. Near the charge neutrality
point and at low temperatures, the gate-dependent thermoelectric power
follows the semiclassical Mott relation using the expected surface
state density of states but is larger than expected at high electron
doping, possibly reflecting a large density of states in the bulk
gap. The thermoelectric power factor shows significant enhancement
near the electron–hole puddle carrier density ∼0.5 ×
10<sup>12</sup> cm<sup>–2</sup> per surface at all temperatures.
Together with the expected reduction of lattice thermal conductivity
in low-dimensional structures, the results demonstrate that nanostructuring
and Fermi level tuning of three-dimensional topological insulators
can be promising routes to realize efficient thermoelectric devices
Passivating Graphene and Suppressing Interfacial Phonon Scattering with Mechanically Transferred Large-Area Ga<sub>2</sub>O<sub>3</sub>
We demonstrate a large-area passivation layer for graphene
by mechanical
transfer of ultrathin amorphous Ga2O3 synthesized
on liquid Ga metal. A comparison of temperature-dependent electrical
measurements of millimeter-scale passivated and bare graphene on SiO2/Si indicates that the passivated graphene maintains its high
field effect mobility desirable for applications. Surprisingly, the
temperature-dependent resistivity is reduced in passivated graphene
over a range of temperatures below 220 K, due to the interplay of
screening of the surface optical phonon modes of the SiO2 by high-dielectric-constant Ga2O3 and the
relatively high characteristic phonon frequencies of Ga2O3. Raman spectroscopy and electrical measurements indicate
that Ga2O3 passivation also protects graphene
from further processing such as plasma-enhanced atomic layer deposition
of Al2O3
Hybridized hyperbolic surface phonon polaritons at {\alpha}-MoO3 and polar dielectric interfaces
Surface phonon polaritons (SPhPs) in polar dielectrics offer new opportunities for infrared nanophotonics due to sub-diffraction confinement with low optical losses. Though the polaritonic field confinement can be significantly improved by modifying the dielectric environment, it is challenging to break the fundamental limits in photon confinement and propagation behavior of SPhP modes. In particular, as SPhPs inherently propagate isotropically in these bulk polar dielectrics, how to collectively realize ultra-large field confinement, in-plane hyperbolicity and unidirectional propagation remains elusive. Here, we report an approach to solve the aforementioned issues of bulk polar dielectric's SPhPs at one go by constructing a heterostructural interface between biaxial van der Waals material (e.g., MoO3) and bulk polar dielectric (e.g., SiC, AlN, and GaN). Due to anisotropy-oriented mode couplings at the interface, the hybridized SPhPs with a large confinement factor (>100) show in-plane hyperbolicity that has been switched to the orthogonal direction as compared to that in natural MoO3. More interestingly, this proof of concept allows steerable, angle-dependent and unidirectional polariton excitation by suspending MoO3 on patterned SiC air cavities. Our finding exemplifies a generalizable framework to manipulate the flow of nano-light and engineer unusual polaritonic responses in many other hybrid systems consisting of van der Waals materials and bulk polar dielectrics
Self-Limiting Layer-by-Layer Oxidation of Atomically Thin WSe<sub>2</sub>
Growth of a uniform oxide film with
a tunable thickness on two-dimensional transition metal dichalcogenides
is of great importance for electronic and optoelectronic applications.
Here we demonstrate homogeneous surface oxidation of atomically thin
WSe<sub>2</sub> with a self-limiting thickness from single- to trilayers.
Exposure to ozone (O<sub>3</sub>) below 100 °C leads to the lateral
growth of tungsten oxide selectively along selenium zigzag-edge orientations
on WSe<sub>2</sub>. With further O<sub>3</sub> exposure, the oxide
regions coalesce and oxidation terminates leaving a uniform thickness
oxide film on top of unoxidized WSe<sub>2</sub>. At higher temperatures,
oxidation evolves in the layer-by-layer regime up to trilayers. The
oxide films formed on WSe<sub>2</sub> are nearly atomically flat.
Using photoluminescence and Raman spectroscopy, we find that the underlying
single-layer WSe<sub>2</sub> is decoupled from the top oxide but hole-doped.
Our findings offer a new strategy for creating atomically thin heterostructures
of semiconductors and insulating oxides with potential for applications
in electronic devices
Electrochemically Prepared Polycrystalline Copper Surface for the Growth of Hexagonal Boron Nitride
The
controlled and reproducible growth of hexagonal boron nitride
(h-BN) by chemical vapor deposition on polycrystalline copper foil
substrates remains a challenge as typical growth surfaces contain
microscopic ridges (height ≈ 100 μm) arising from the
foil manufacturing process. In this work, we report a method to prepare
commercially cold-rolled polycrystalline copper substrates for greatly
improved growth of h-BN by a combination of thermal annealing in a
reducing environment and electrochemical polishing to create an excellent
surface that enables control of BN nucleation sites. We report a root
mean square roughness of ∼1.2 nm for the Cu substrate after
electropolishing and a reduction of nucleation sites along with enlargement
of h-BN crystals with this combined approach. We also assess the potential
role of surface features that exist on the Cu surface as nucleation
sites. The development of an electrochemical process to prepare two-dimensional
(2D) material growth substrates and demonstration of greatly improved
growth of 2D materials directly point to more pragmatic large scale
processing of 2D materials since such techniques are already utilized
in large scale industrial processing
Oxidation of Monolayer WS in Ambient is a Photoinduced Process
We have studied the ambient air oxidation of chemical vapor deposition (CVD) grown monolayers of the semiconducting transition metal dichalcogenide (S-TMD) WS using optical microscopy, laser scanning confocal microscopy (LSCM), photoluminescence (PL) spectroscopy, and atomic force microscopy (AFM). Monolayer WS exposed to ambient conditions in the presence of light (typical laboratory ambient light for weeks, or typical PL spectroscopy map), exhibits damage due to oxidation which can be detected with the LSCM and AFM; though may not be evident in conventional optical microscopy due to poorer contrast and resolution. Additionally, this oxidation was not random, and correlated with 'high-symmetry' and red-shifted areas in the PL spectroscopy map - areas thought to contain a higher concentration of sulfur vacancies. In contrast, samples kept in ambient and darkness showed no signs of oxidation for up to 10 months. Low-irradiance/fluence experiments showed that samples subjected to excitation energies at or above the trion excitation energy (532 nm/2.33 eV and 660 nm/1.88 eV) oxidized in as little as 7 days, even for irradiances and fluences eight and four orders of magnitude lower (respectively) than previously reported. No significant oxidation was observed for 760 nm/1.63 eV light exposure, which lies below the trion excitation energy in WS. The strong wavelength dependence and apparent lack of irradiance dependence suggests that ambient oxidation of WS is initiated by photon-mediated electronic band transitions, that is, photo-oxidation. These findings have important implications for prior, present and future studies concerning S-TMDs measured, stored or manipulated in ambient conditions
