3 research outputs found
Aluminum-Doped Zinc Oxide as Highly Stable Electron Collection Layer for Perovskite Solar Cells
Although low-temperature,
solution-processed zinc oxide (ZnO) has
been widely adopted as the electron collection layer (ECL) in perovskite
solar cells (PSCs) because of its simple synthesis and excellent electrical
properties such as high charge mobility, the thermal stability of
the perovskite films deposited atop ZnO layer remains as a major issue.
Herein, we addressed this problem by employing aluminum-doped zinc
oxide (AZO) as the ECL and obtained extraordinarily thermally stable
perovskite layers. The improvement of the thermal stability was ascribed
to diminish of the Lewis acid–base chemical reaction between
perovskite and ECL. Notably, the outstanding transmittance and conductivity
also render AZO layer as an ideal candidate for transparent conductive
electrodes, which enables a simplified cell structure featuring glass/AZO/perovskite/Spiro-OMeTAD/Au.
Optimization of the perovskite layer leads to an excellent and repeatable
photovoltaic performance, with the champion cell exhibiting an open-circuit
voltage (<i>V</i><sub>oc</sub>) of 0.94 V, a short-circuit
current (<i>J</i><sub>sc</sub>) of 20.2 mA cm<sup>–2</sup>, a fill factor (FF) of 0.67, and an overall power conversion efficiency
(PCE) of 12.6% under standard 1 sun illumination. It was also revealed
by steady-state and time-resolved photoluminescence that the AZO/perovskite
interface resulted in less quenching than that between perovskite
and hole transport material
Competition between Metallic and Vacancy Defect Conductive Filaments in a CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub>‑Based Memory Device
Ion
migration, which can be classified into cation migration and
anion migration, is at the heart of redox-based resistive random access
memory. However, the coexistence of these two types of ion migration
and the resultant conductive filaments (CFs) have not been experimentally
demonstrated in a single memory cell. Here we investigate the competition
between metallic and vacancy defect CFs in a Ag/CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub>/Pt structure, where Ag and CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> serve as the top electrode and memory medium,
respectively. When the medium layer thickness is hundreds of nanometers,
the formation/diffusion of iodine vacancy (V<sub>I</sub>) CFs dominates
the resistive switching behaviors. The V<sub>I</sub>-based CFs provide
a unique opportunity for the electrical-write and optical-erase operation
in a memory cell. The Ag CFs emerge and coexist with V<sub>I</sub> ones as the medium layer thickness is reduced to ∼90 nm.
Our work not only enriches the mechanisms of the resistive switching
but also would advance the multifunctionalization of resistive random
access memory
Laser-Induced Flash-Evaporation Printing CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> Thin Films for High-Performance Planar Solar Cells
Organic–inorganic
hybrid perovskites have been emerging
as promising light-harvesting materials for high-efficiency solar
cells recently. Compared to solution-based methods, vapor-based deposition
technologies are more suitable in preparing compact, uniform, and
large-scale perovskite thin films. Here, we utilized flash-evaporation
printing (FEP), a laser-induced ultrafast single source evaporation
method employing a carbon nanotube evaporator, to fabricate high-quality
methylammonium lead iodide perovskite thin films. Stoichiometric films
with pure tetragonal perovskite phase can be achieved using a controlled
methylammonium iodide to lead iodide ratio in evaporation precursors.
The film crystallinity and crystal grain growth could further be promoted
after postannealing. Planar solar cells (0.06 cm<sup>2</sup>) employing
these perovskite films exhibit a champion power conversion efficiency
(PCE) of 16.8% with insignificant hysteresis, which is among the highest
reported PCEs using vapor-based deposition methods. Large-area (1
cm<sup>2</sup>) devices based on such perovskite films also achieved
a stabilized PCE of 11.2%, indicating the feasibility and scalability
of our FEP method in fabricating large-area perovskite films for other
optoelectronic applications