Three-Dimensional Single-Shot Ptychography

Here we introduce three-dimensional single-shot ptychography (3DSSP). 3DSSP leverages an additional constraint unique to the single-shot geometry to deconvolve multiple 2D planes of a 3D object. Numeric simulations and analytic calculations demonstrate that 3DSSP reconstructs multiple planes in an extended 3D object with a minimum separation consistent with the depth of field for a conventional microscope. We experimentally demonstrate 3DSSP by reconstructing orthogonal hair strands axially separated by 5 mm. Three-dimensional single-shot ptychography provides a pathway towards volumetric imaging of dynamically evolving systems on ultrafast timescales

Supplementary document for Spatiospectral Characterization of Ultrafast Pulse-Beams by Multiplexed Broadband Ptychography - 5444836.pdf

Supplemental Documen

Wavelength-multiplexed single-shot ptychography

Diagnostics capable of interrogating dynamics in harsh environments such as plasma have remained essentially unchanged in recent decades. Developments in advanced microscopy techniques will improve our understanding of the physics involved in these events. Recently developed single-shot ptychography (SSP) provides a pathway towards sophisticated plasma metrologies. Here we introduce wavelength-multiplexed single-shot ptychography (WM-SSP), which allows for hyperspectral, spatially and temporally resolved phase and amplitude contrast imaging. Furthermore, we introduce a novel probe constraint common to all wavelength multiplexed modalities in the single-shot geometry and present modifications to SSP that improve reconstruction fidelity and robustness. WM-SSP was experimentally realized and simulations show the technique's ability to deconvolve the electron and neutral densities within the plasma. WM-SSP will pave the way to a new generation of quantitative plasma imaging techniques

spatialChirpGif3.gif

Visualization 1 shows propagation of the central five spectral components of the spatially chirped pulse-beam from the prism experiment without the knife-edge. The top row shows the spatial profile of each beamlet as it propagates. The bottom left panel shows the summed intensity of these spectral components which is calculated from the individually propagated beamlets. The two bottom right panels show sagittal and tangential views of the beams colored by their local wavelengths, which are the same as Fig 3.a) and b). Here we are also showing the propagation of the beamlets, which are colored according to wavelength and have sizes proportional to their second moments. Based on these panels we can separately identify the beamlet crossing plane and focal plane of the beams in each direction

Supplementary document for At-Focus Scanning Ptychography for High Resolution Imaging with a Wide Field of View - 6719937.pdf

Supplementary document supporting the main manuscript. The .zip files contains the default Optica Latex template files, main text document, and figures

Supplementary document for At-Focus Scanning Ptychography for High Resolution Imaging with a Wide Field of View - 6719937.pdf

Supplementary document supporting the main manuscript. The .zip files contains the default Optica Latex template files, main text document, and figures

Supplementary document for Single-pulse, reference-free, spatiotemporal characterization of ultrafast laser pulse-beams via broadband ptychography - 6406177.pdf

suplemental documen

Supplementary document for Single-pulse, reference-free, spatiospectral measurement of ultrashort pulse-beams - 5951026.pdf

Supplemental information - resubmission after peer revie

Supplementary document for High-resolution ptychographic imaging at a seeded free-electron laser source using OAM beams - 6798568.pdf

Revised Supplemental Documen