6,955 research outputs found
Radiation Tolerance of 65nm CMOS Transistors
We report on the effects of ionizing radiation on 65nm CMOS transistors held
at approximately -20C during irradiation. The pattern of damage observed after
a total dose of 1 Grad is similar to damage reported in room temperature
exposures, but we observe less damage than was observed at room temperature
Search for CP Violation in the decays D+ -> K_S pi+ and D+ -> K_S K+
A high statistics sample of photo-produced charm from the FOCUS(E831)
experiment at Fermilab has been used to search for direct CP violation in the
decays D+->K_S pi+ and D+ -> K_S K+. We have measured the following asymmetry
parameters relative to D+->K-pi+pi+: A_CP(K_S pi+) = (-1.6 +/- 1.5 +/- 0.9)%,
A_CP(K_S K+) = (+6.9 +/- 6.0 +/- 1.5)% and A_CP(K_S K+) = (+7.1 +/- 6.1 +/-
1.2)% relative to D+->K_S pi+. The first errors quoted are statistical and the
second are systematic. We also measure the relative branching ratios:
\Gamma(D+->\bar{K0}pi+)/\Gamma(D+->K-pi+pi+) = (30.60 +/- 0.46 +/- 0.32)%,
\Gamma(D+->\bar{K0}K+)/\Gamma(D+->K-pi+pi+) = (6.04 +/- 0.35 +/- 0.30)% and
\Gamma(D+->\bar{K0}K+)/\Gamma(D+->\bar{K0}pi+) = (19.96 +/- 1.19 +/- 0.96)%.Comment: 4 pages, 3 figure
A Measurement of the Ds+ Lifetime
A high statistics measurement of the Ds+ lifetime from the Fermilab
fixed-target FOCUS photoproduction experiment is presented. We describe the
analysis of the two decay modes, Ds+ -> phi(1020)pi+ and Ds+ ->
\bar{K}*(892)0K+, used for the measurement. The measured lifetime is 507.4 +/-
5.5 (stat.) +/- 5.1 (syst.) fs using 8961 +/- 105 Ds+ -> phi(1020)pi+ and 4680
+/- 90 Ds+ -> \bar{K}*(892)0K+ decays. This is a significant improvement over
the present world average.Comment: 5 pages, 3 figures, 2 tables, submitted to PR
New FOCUS results on charm mixing and CP violation
We present a summary of recent results on CP violation and mixing in the
charm quark sector based on a high statistics sample collected by
photoproduction experiment FOCUS (E831 at Fermilab). We have measured the
difference in lifetimes for the decays: and . This translates into a measurement of the mixing parameter in
the \d0d0 system, under the assumptions that is an equal mixture of
CP odd and CP even eigenstates, and CP violation is negligible in the neutral
charm meson system. We verified the latter assumption by searching for a CP
violating asymmetry in the Cabibbo suppressed decay modes , and . We show preliminary
results on a measurement of the branching ratio .Comment: 9 pages, 6 figures, requires espcrc2.sty. Presented by S.Bianco at
CPConf2000, September 2000, Ferrara (Italy). In this revision, fixed several
stylistic flaws, add two significant references, fixed a typo in Tab.
Measurement of the Inclusive Semi-electronic Branching Fraction
Using the angular correlation between the emitted in a decay and the emitted in the subsequent decay, we have measured the branching fraction for the
inclusive semi-electronic decay of the meson to be: {\cal B}(D^0
\rightarrow X e^+ \nu) = [6.64 \pm 0.18 (stat.) \pm 0.29 (syst.)] \%. The
result is based on 1.7 fb of collisions recorded by the CLEO II
detector located at the Cornell Electron Storage Ring (CESR). Combining the
analysis presented in this paper with previous CLEO results we find,
\frac{{\cal B} (D^0 \rightarrow X e^+ \nu)}
{{\cal B} (D^0 \rightarrow K^- \pi^+)}
= 1.684 \pm 0.056 (stat.) \pm 0.093(syst.) and
\frac{{\cal B}(D\rightarrow K^-e^+\nu)}
{{\cal B}(D\rightarrow Xe^+\nu)}
= 0.581 \pm 0.023 (stat.) \pm 0.028(syst.).
The difference between the inclusive rate and the sum of the measured
exclusive branching fractions (measured at CLEO and other experiments) is of the inclusive rate.Comment: Latex file, 33pages, 4 figures Submitted to PR
Search for the standard model Higgs boson in the H to ZZ to 2l 2nu channel in pp collisions at sqrt(s) = 7 TeV
A search for the standard model Higgs boson in the H to ZZ to 2l 2nu decay
channel, where l = e or mu, in pp collisions at a center-of-mass energy of 7
TeV is presented. The data were collected at the LHC, with the CMS detector,
and correspond to an integrated luminosity of 4.6 inverse femtobarns. No
significant excess is observed above the background expectation, and upper
limits are set on the Higgs boson production cross section. The presence of the
standard model Higgs boson with a mass in the 270-440 GeV range is excluded at
95% confidence level.Comment: Submitted to JHE
A High Statistics Measurement of the Lambdac+ Lifetime
A high statistics measurement of the Lambdac+ lifetime from the Fermilab
fixed-target FOCUS photoproduction experiment is presented. We describe the
analysis technique with particular attention to the determination of the
systematic uncertainty. The measured value of 204.6 +/- 3.4 (stat.) +/- 2.5
(syst.) fs from 8034 +/- 122 Lambdac -> pKpi decays represents a significant
improvement over the present world average.Comment: Submitted to Physical Review Letter
Combined search for the quarks of a sequential fourth generation
Results are presented from a search for a fourth generation of quarks
produced singly or in pairs in a data set corresponding to an integrated
luminosity of 5 inverse femtobarns recorded by the CMS experiment at the LHC in
2011. A novel strategy has been developed for a combined search for quarks of
the up and down type in decay channels with at least one isolated muon or
electron. Limits on the mass of the fourth-generation quarks and the relevant
Cabibbo-Kobayashi-Maskawa matrix elements are derived in the context of a
simple extension of the standard model with a sequential fourth generation of
fermions. The existence of mass-degenerate fourth-generation quarks with masses
below 685 GeV is excluded at 95% confidence level for minimal off-diagonal
mixing between the third- and the fourth-generation quarks. With a mass
difference of 25 GeV between the quark masses, the obtained limit on the masses
of the fourth-generation quarks shifts by about +/- 20 GeV. These results
significantly reduce the allowed parameter space for a fourth generation of
fermions.Comment: Replaced with published version. Added journal reference and DO
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