12 research outputs found
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Brønsted-Acid-Catalyzed Exchange in Polyester Dynamic Covalent Networks
The effect of catalyst
strength on polyesterâalcohol dynamic
covalent exchange was systematically studied using Brønsted acids
and a low-<i>T</i><sub>g</sub> polyÂ(4-methylcaprolactone)
vitrimer formulation. Relaxation times, activation energies, and Arrhenius
prefactors are correlated with p<i>K</i><sub>a</sub>. Strong
protic acids induce facile network relaxation at 25 °C on the
order of 10<sup>4</sup>â10<sup>5</sup> s, significantly faster
than Lewis acid alternatives that function only above 100 °C.
Activation energies span 49â67 kJ/mol and increase as p<i>K</i><sub>a</sub> decreases. The opposite trend is observed
with the Arrhenius prefactor. We anticipate that the quantitative
understanding of Brønsted acid effects disclosed herein will
be of utility in future studies that exploit acid-catalyzed dynamic
covalent bond exchange
Thin Film Self-Assembly of Poly(trimethylsilylstyreneâ<i>b</i>âd,lâlactide) with Sub-10 nm Domains
Integrating block copolymer self-assembly with existing
lithography
processes to enhance their patterning capability is a promising approach
for manufacturing a variety of semiconductor devices and next-generation
magnetic storage media. Sub-10 nm block copolymer domains are specifically
targeted in many of these applications, yet there are relatively few
block copolymers that can achieve these dimensions. Here the synthesis
and self-assembly characteristics of a new block copolymer polyÂ(trimethylsilylstyrene-<i>b</i>-d,l-lactide) (PTMSS-<i>b</i>-PLA) capable of forming domains as small as âź5 nm are described.
Several lamellar and cylinder forming diblocks were synthesized with
bulk domain periodicities of 12â15 nm which are among the smallest
domains yet reported for any neat block copolymer. Such small domains
are possible because this new material has a large segmentâsegment
interaction parameter which is an order of magnitude higher than polyÂ(styrene-<i>b</i>-methyl methacrylate) (PS-<i>b</i>-PMMA) and
twice as large as polyÂ(styrene-<i>b</i>-dimethylsiloxane)
(PS-<i>b</i>-PDMS), two commonly studied polymers for these
applications. Furthermore, the PTMSS-<i>b</i>-PLA blocks
have glass transitions well above room temperature with a large reactive
ion etch rate contrast between them (âź28) which is at least
4 times greater than PS-<i>b</i>-PMMA due to incorporation
of a trimethylsilyl group into the styrene monomer
Structure, Stability, and Reorganization of 0.5 <i>L</i><sub>0</sub> Topography in Block Copolymer Thin Films
The
structure, stability, and reorganization of lamella-forming
block copolymer thin film surface topography (âislandsâ
and âholesâ) were studied under boundary conditions
driving the formation of 0.5 <i>L</i><sub>0</sub> thick
structures at short thermal annealing times. Self-consistent field
theory predicts that the presence of one perfectly neutral surface
renders 0.5 <i>L</i><sub>0</sub> topography thermodynamically
stable relative to 1 <i>L</i><sub>0</sub> thick features,
in agreement with previous experimental observations. The calculated
through-film structures match cross-sectional scanning electron micrographs,
collectively demonstrating the pinning of edge dislocations at the
neutral surface. Remarkably, near-neutral surface compositions exhibit
0.5 <i>L</i><sub>0</sub> topography metastability upon extended
thermal treatment, slowly transitioning to 1 <i>L</i><sub>0</sub> islands or holes as evidenced by optical and atomic force
microscopy. Surface restructuring is rationalized by invoking commensurability
effects imposed by slightly preferential surfaces. The results described
herein clarify the impact of interfacial interactions on block copolymer
self-assembly and solidify an understanding of 0.5 <i>L</i><sub>0</sub> topography, which is frequently used to determine neutral
surface compositions of considerable importance to contemporary technological
applications
Improved Elastic Recovery from ABC Triblock Terpolymers
The promise of ABC
triblock terpolymers for improving
the mechanical
properties of thermoplastic elastomers is demonstrated by comparison
with symmetric ABA/CBC analogs having similar molecular weights and
volume fraction of B and A/C domains. The ABC architecture enhances
elasticity (up to 98% recovery over 10 cycles) in part through essentially
full chain bridging between discrete hard domains leading to the minimization
of mechanically unproductive loops. In addition, the unique phase
space of ABC triblocks also enables the fraction of hard-block domains
to be higher (fhard â 0.4) while
maintaining elasticity, which is traditionally only possible with
non-linear architectures or highly asymmetric ABA triblock copolymers.
These advantages of ABC triblock terpolymers provide a tunable platform
to create materials with practical applications while improving our
fundamental understanding of chain conformation and structureâproperty
relationships in block copolymers
Electrocatalysis of CO<sub>2</sub> Reduction in Brush Polymer Ion Gels
The electrochemical characterization
of brush polymer ion gels
containing embedded small-molecule redox-active species is reported.
Gels comprising PSâPEOâPS triblock brush polymer, 1-butyl-3-methylimidazolium
bisÂ(trifluoromethylsulfonyl)Âimide (BMIm-TFSI), and some combination
of ferrocene (Fc), cobaltocenium (CoCp<sub>2</sub><sup>+</sup>), and
ReÂ(bpy)Â(CO)<sub>3</sub>Cl (<b>1</b>) exhibit diffusion-controlled
redox processes with diffusion coefficients approximately one-fifth
of those observed in neat BMIm-TFSI. Notably, <b>1</b> dissolves
homogeneously in the interpenetrating matrix domain of the ion gel
and displays electrocatalytic CO<sub>2</sub> reduction to CO in the
gel. The catalytic wave exhibits a positive shift versus Fc<sup>+/0</sup> compared with analogous nonaqueous solvents with a reduction potential
450 mV positive of onset and 90% Faradaic efficiency for CO production.
These materials provide a promising and alternative approach to immobilized
electrocatalysis, creating numerous opportunities for application
in solid-state devices
Directed Self-Assembly of Silicon-Containing Block Copolymer Thin Films
The directed self-assembly (DSA)
of lamella-forming polyÂ(styrene-<i>block</i>-trimethylsilylstyrene)
(PSâPTMSS, <i>L</i><sub>0</sub> = 22 nm) was achieved
using a combination of tailored top interfaces and lithographically
defined patterned substrates. Chemo- and grapho-epitaxy, using hydrogen
silsesquioxane (HSQ) based prepatterns, achieved density multiplications
up to 6Ă and trench space subdivisions up to 7Ă, respectively.
These results establish the compatibility of DSA techniques with a
high etch contrast, Si-containing BCP that requires a top coat neutral
layer to enable orientation
Photopatternable Interfaces for Block Copolymer Lithography
Directly photopatternable interfaces
are introduced that facilitate
two-dimensional spatial control of block copolymer (BCP) orientation
in thin films. Copolymers containing an acid labile monomer were synthesized,
formulated with a photoacid generator (PAG), and coated to create
grafted surface treatments (GSTs). These as-cast GST films are either
inherently neutral or preferential (but not both) to lamella-forming
polyÂ(styrene-<i>block</i>-trimethylsilylstyrene) (PS-<i>b</i>-PTMSS). Subsequent contact printing and baking produced
GSTs with submicron chemically patterned gratings. The catalytic reaction
of the photoacid generated in the UV-exposed regions of the GSTs changed
the interfacial interactions between the BCP and the GST in one of
two ways: from neutral to preferential (âN2Pâ) <i>or</i> preferential to neutral (âP2Nâ). When PS-<i>b</i>-PTMSS was thermally annealed between a chemically patterned
GST and a top coat, alternating regions of perpendicular and parallel
BCP lamellae were formed
Oligosaccharide/Silicon-Containing Block Copolymers with 5 nm Features for Lithographic Applications
Block copolymers demonstrate potential for use in next-generation lithography due to their ability to self-assemble into well-ordered periodic arrays on the 3â100 nm length scale. The successful lithographic application of block copolymers relies on three critical conditions being met: high FloryâHuggins interaction parameters (Ď), which enable formation of <10 nm features, etch selectivity between blocks for facile pattern transfer, and thin film self-assembly control. The present paper describes the synthesis and self-assembly of block copolymers composed of naturally derived oligosaccharides coupled to a silicon-containing polystyrene derivative synthesized by activators regenerated by electron transfer atom transfer radical polymerization. The block copolymers have a large Ď and a low degree of polymerization (<i>N</i>) enabling formation of 5 nm feature diameters, incorporate silicon in one block for oxygen reactive ion etch contrast, and exhibit bulk and thin film self-assembly of hexagonally packed cylinders facilitated by a combination of spin coating and solvent annealing techniques. As observed by small angle X-ray scattering and atomic force microscopy, these materials exhibit some of the smallest block copolymer features in the bulk and in thin films reported to date
A Hybrid Chemo-/Grapho-Epitaxial Alignment Strategy for Defect Reduction in Sub-10 nm Directed Self-Assembly of Silicon-Containing Block Copolymers
The
directed self-assembly (DSA) of a 20 nm full-pitch silicon-containing
block copolymer (BCP), polyÂ(4-methoxystyrene-<i>b</i>-4-trimethylsilylstyrene),
was performed using a process that produces shallow topography for
hybrid chemo-/grapho-epitaxy. This hybrid process produced DSA with
fewer defects than the analogous conventional chemo-epitaxial process,
and the resulting DSA was also more tolerant of variations in process
parameters. Cross-sectional scanning transmission electron microscopy
(STEM) with electron energy loss spectroscopy (EELS) confirmed that
BCP features spanned the entire film thickness on hybrid process wafers.
Both processes were implemented on 300 mm wafers initially prepatterned
by 193 nm immersion lithography, which is necessary for economic viability
in high-volume manufacturing. Computational analysis of DSA extracted
from top-down SEM images demonstrates the influence of process parameters
on DSA, facilitating the optimization of guide stripe width, guide
stripe pitch, and prepattern surface energy. This work demonstrates
the ability of a hybrid process to improve the DSA quality over a
conventional chemo-epitaxial process and the potential for high-volume
manufacturing with high-Ď, silicon-containing BCPs
Interfacial Design for Block Copolymer Thin Films
Top coat design, coating, and optimization
methodologies are introduced
that facilitate the synthesis, application, and identification of
neutral top coats for block copolymer (BP) thin films. Polymeric top
coat composition, controlled via synthesis, determines interfacial
wetting characteristics. Trimethylammonium salts of top coats improve
solubility and coating uniformity. A âconfinedâ island
and hole test conveniently establishes (non)Âpreferential wetting at
the top coat/BP interface, which depends upon top coat composition.
The utility of these three concepts was demonstrated with two high-Ď,
lamella-forming BPs, polyÂ(styrene-<i>block</i>-4-trimethylsilylstyrene)
(PS-<i>b</i>-PTMSS) having two periodicities <i>L</i><sub>0</sub> = 18 and 22 nm and polyÂ(styrene-<i>block</i>-methyltrimethylsilylmethacrylate) (PS-<i>b</i>-PTMSM)
with <i>L</i><sub>0</sub> = 15 nm. The combination of neutral
top and bottom interfaces resulted in a perpendicular orientation
of lamellae independent of BP film thickness (1â3 <i>L</i><sub>0</sub>) when thermally annealed for 60 s or less