5 research outputs found

    Controlled Orientation of Plasma-Treated Diblock Copolymer Films from the Responsive Functionalized Substrate through Solvent Annealing

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    This study demonstrates a new technique for controlled orientation of nanostructured block copolymer (BCP) thin films through solvent annealing using polystyrene-block-polydimethyl­siloxane (PS-b-PDMS) as a representative BCP system. A two-step substrate functionalization of an intrinsic oxide layer (SiO2) wafer is performed by using hydroxyl-terminated PS (PS-OH) followed by hydroxyl-terminated PDMS (PDMS-OH). By varying the grafting percentage of the PS and PDMS brushes on the substrate, it is possible to give different degrees of stretching and recoiling of grafted PS and PDMS, respectively, using PS-selective solvent for solvent annealing, resulting in roughness variation; that is termed a responsive functionalized substrate. With the appropriate roughness of the functionalized substrate under solvent annealing, the development of perpendicularly oriented cylinders of PDMS in the nanostructured PS-b-PDMS thin films can be driven from the bottom of the film. Moreover, by taking advantage of air plasma treatment, it is possible to generate a top-capped neutral layer on the film surface, giving induced perpendicular cylinders from the top surface of the thin film after solvent annealing. Consequently, it is possible to attain the formation of film-spanning perpendicular cylinders of PDMS in the PS-b-PDMS thin film under solvent annealing through the self-alignment process of the perpendicularly oriented cylinders from the top and the bottom surface of the thin film

    Controlled Orientation of Silicon-Containing Diblock Copolymer Thin Films by Substrate Functionalization Under Vacuum

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    This work demonstrates a simple approach to control the orientation of the self-assembled nanostructured block copolymer thin films of polystyrene-block-polydimethylsiloxane (PS-b-PDMS) by functionalization of the oxide layer (SiO2) on the Si substrate followed by thermal annealing under low-pressure environmental conditions. The substrate can be functionalized through two-step grafting of hydroxy-terminated polystyrene brush (PS–OH brush) followed by hydroxy-terminated polydimethylsiloxane brush (PDMS–OH brush) onto the wafer substrate. By controlling the grafting ratio of PS–OH and PDMS–OH brushes, the affinities of the PS and PDMS blocks with the substrates can be fine-tuned to provide a neutral substrate in order to form perpendicular cylinders from the bottom after thermal annealing. Owing to the vacuum-driven orientation [i.e., thermal annealing under low-pressure environment conditions (∼10–4 Pa)], the orientation of the cylinders can be controlled at the air/polymer interface. Interestingly, by combining the vacuum-driven approach with substrate functionalization, perpendicular cylinders from the air/polymer interface and substrate/polymer interface can be generated, respectively. Consequently, well-aligned perpendicular cylinders with long-range ordering can be fabricated by the self-alignment process

    Vacuum-Driven Orientation of Nanostructured Diblock Copolymer Thin Films

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    This work aims to demonstrate a facile method for the controlled orientation of nanostructures of block copolymer (BCP) thin films. A simple diblock copolymer system, polystyrene-block-polydimethylsiloxane (PS-b-PDMS), is chosen to demonstrate vacuum-driven orientation for solving the notorious low-surface-energy problem of silicon-based BCP nanopatterning. By taking advantage of the pressure dependence of the surface tension of polymeric materials, a neutral air surface for the PS-b-PDMS thin film can be formed under a high vacuum degree (∼10–4 Pa), allowing the formation of the film-spanning perpendicular cylinders and lamellae upon thermal annealing. In contrast to perpendicular lamellae, a long-range lateral order for forming perpendicular cylinders can be efficiently achieved through the self-alignment mechanism for induced ordering from the top and bottom of the free-standing thin film

    Vacuum-Driven Orientation of Nanostructured Diblock Copolymer Thin Films

    No full text
    This work aims to demonstrate a facile method for the controlled orientation of nanostructures of block copolymer (BCP) thin films. A simple diblock copolymer system, polystyrene-block-polydimethylsiloxane (PS-b-PDMS), is chosen to demonstrate vacuum-driven orientation for solving the notorious low-surface-energy problem of silicon-based BCP nanopatterning. By taking advantage of the pressure dependence of the surface tension of polymeric materials, a neutral air surface for the PS-b-PDMS thin film can be formed under a high vacuum degree (∼10–4 Pa), allowing the formation of the film-spanning perpendicular cylinders and lamellae upon thermal annealing. In contrast to perpendicular lamellae, a long-range lateral order for forming perpendicular cylinders can be efficiently achieved through the self-alignment mechanism for induced ordering from the top and bottom of the free-standing thin film

    Direct Visualization of the Self-Alignment Process for Nanostructured Block Copolymer Thin Films by Transmission Electron Microscopy

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    Herein, this work aims to directly visualize the morphological evolution of the controlled self-assembly of star-block polystyrene-block-polydimethylsiloxane (PS-b-PDMS) thin films via in situ transmission electron microscopy (TEM) observations. With an environmental chip, possessing a built-in metal wire-based microheater fabricated by the microelectromechanical system (MEMS) technique, in situ TEM observations can be conducted under low-dose conditions to investigate the development of film-spanning perpendicular cylinders in the block copolymer (BCP) thin films via a self-alignment process. Owing to the free-standing condition, a symmetric condition of the BCP thin films can be formed for thermal annealing under vacuum with neutral air surface, whereas an asymmetric condition can be formed by an air plasma treatment on one side of the thin film that creates an end-capped neutral layer. A systematic comparison of the time-resolved self-alignment process in the symmetric and asymmetric conditions can be carried out, giving comprehensive insights for the self-alignment process via the nucleation and growth mechanism
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