88 research outputs found
Crossover effects in the Wolf-Villain model of epitaxial growth in 1+1 and 2+1 dimensions
A simple model of epitaxial growth proposed by Wolf and Villain is
investigated using extensive computer simulations. We find an unexpectedly
complex crossover behavior of the original model in both 1+1 and 2+1
dimensions. A crossover from the effective growth exponent to is observed in 1+1
dimensions, whereas additional crossovers, which we believe are to the scaling
behavior of an Edwards--Wilkinson type, are observed in both 1+1 and 2+1
dimensions. Anomalous scaling due to power--law growth of the average step
height is found in 1+1 D, and also at short time and length scales in 2+1~D.
The roughness exponents obtained from the
height--height correlation functions in 1+1~D () and 2+1~D
() cannot be simultaneously explained by any of the continuum
equations proposed so far to describe epitaxial growth.Comment: 11 pages, REVTeX 3.0, IC-DDV-93-00
Kinetic modelling of epitaxial film growth with up- and downward step barriers
The formation of three-dimensional structures during the epitaxial growth of
films is associated to the reflection of diffusing particles in descending
terraces due to the presence of the so-called Ehrlich-Schwoebel (ES) barrier.
We generalize this concept in a solid-on-solid growth model, in which a barrier
dependent on the particle coordination (number of lateral bonds) exists
whenever the particle performs an interlayer diffusion. The rules do not
distinguish explicitly if the particle is executing a descending or an
ascending interlayer diffusion. We show that the usual model, with a step
barrier in descending steps, produces spurious, columnar, and highly unstable
morphologies if the growth temperature is varied in a usual range of mound
formation experiments. Our model generates well-behaved mounded morphologies
for the same ES barriers that produce anomalous morphologies in the standard
model. Moreover, mounds are also obtained when the step barrier has an equal
value for all particles independently if they are free or bonded. Kinetic
roughening is observed at long times, when the surface roughness w and the
characteristic length scale as and where
and , independently of the growth
temperature.Comment: 15 pages, 7 figure
Damping of Growth Oscillations in Molecular Beam Epitaxy: A Renormalization Group Approach
The conserved Sine-Gordon Equation with nonconserved shot noise is used to
model homoepitaxial crystal growth. With increasing coverage the renormalized
pinning potential changes from strong to weak. This is interpreted as a
transition from layer-by-layer to rough growth. The associated length and time
scales are identified, and found to agree with recent scaling arguments. A
heuristically postulated nonlinear term is created
under renormalization.Comment: 17 Pages Late
Kardar-Parisi-Zhang Universality, Anomalous Scaling and Crossover Effects in the Growth of Cdte Thin Films
We report on the growth dynamic of CdTe thin films for deposition
temperatures () in the range of 150\,^{\circ}\mathrm{C} to
300\,^{\circ}\mathrm{C}. A relation between mound evolution and
large-wavelength fluctuations at CdTe surface has been established. One finds
that short-length scales are dictated by an interplay between the effects of
the formation of defects at boundaries of neighbouring grains and a relaxation
process which stems from the diffusion and deposition of particles (CdTe
molecules) torward these regions. A Kinetic Monte Carlo model corroborates
these reasonings. As is increased, the competition gives rise to different
scenarios in the roughening scaling such as: uncorrelated growth, a crossover
from random to correlated growth and transient anomalous scaling. In
particular, for T = 250\,^{\circ}\mathrm{C}, one shows that surface
fluctuations are described by the celebrated Kardar-Parisi-Zhang (KPZ)
equation, in the meantime that, the universality of height, local roughness and
maximal height distributions for the KPZ class is, finally, experimentally
demonstrated. The dynamic of fluctuations at the CdTe surface for other
temperatures still is described by the KPZ equation, but with different values
for the superficial tension () and excess of velocity (). Namely,
for T = 150\,^{\circ}\mathrm{C} one finds a Poissonian growth that indicates
. For T = 200\,^{\circ}\mathrm{C}, however, a
Random-to-KPZ crossover is found, with in the second regime.
Finally, for films grown at T = 300\,^{\circ}\mathrm{C}, one demonstrates
that a KPZ growth with takes place. We discuss the different
mechanisms leading to KPZ scaling which depend on , and conjecture the
behavior of the phenomenological parameter as function of the
deposition temperature.Comment: 117 pages, 46 figures, Dissertation Thesi
Local roughness exponent in the nonlinear molecular-beam-epitaxy universality class in one-dimension
We report local roughness exponents, , for three
interface growth models in one dimension which are believed to belong the
non-linear molecular-beam-epitaxy (nMBE) universality class represented by the
Villain-Lais-Das Sarma (VLDS) stochastic equation. We applied an optimum
detrended fluctuation analysis (ODFA) [Luis et al., Phys. Rev. E 95, 042801
(2017)] and compared the outcomes with standard detrending methods. We observe
in all investigated models that ODFA outperforms the standard methods providing
exponents in the narrow interval consistent
with renormalization group predictions for the VLDS equation. In particular,
these exponent values are calculated for the Clarke-Vvdensky and Das
Sarma-Tamborenea models characterized by very strong corrections to the
scaling, for which large deviations of these values had been reported. Our
results strongly support the absence of anomalous scaling in the nMBE
universality class and the existence of corrections in the form
of the one-loop renormalization group analysis
of the VLDS equation
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